Search results for: test circuit.
3258 Computer-Aided Teaching of Transformers for Undergraduates
Authors: Rajesh Kumar, Roopali Dogra, Puneet Aggarwal
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In the era of technological advancement, use of computer technology has become inevitable. Hence it has become the need of the hour to integrate software methods in engineering curriculum as a part to boost pedagogy techniques. Simulations software is a great help to graduates of disciplines such as electrical engineering. Since electrical engineering deals with high voltages and heavy instruments, extra care must be taken while operating with them. The viable solution would be to have appropriate control. The appropriate control could be well designed if engineers have knowledge of kind of waveforms associated with the system. Though these waveforms can be plotted manually, but it consumes a lot of time. Hence aid of simulation helps to understand steady state of system and resulting in better performance. In this paper computer, aided teaching of transformer is carried out using MATLAB/Simulink. The test carried out on a transformer includes open circuit test and short circuit respectively. The respective parameters of transformer are then calculated using the values obtained from open circuit and short circuit test respectively using Simulink.
Keywords: Computer aided teaching, transformer, open circuit test, short circuit test, Simulink.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 9713257 A Capacitive Sensor Interface Circuit Based on Phase Differential Method
Authors: H. A. Majid, N. Razali, M. S. Sulaiman, A. K. A'ain
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A new interface circuit for capacitive sensor is presented. This paper presents the design and simulation of soil moisture capacitive sensor interface circuit based on phase differential technique. The circuit has been designed and fabricated using MIMOS- 0.35"m CMOS technology. Simulation and test results show linear characteristic from 36 – 52 degree phase difference, representing 0 – 100% in soil moisture level. Test result shows the circuit has sensitivity of 0.79mV/0.10 phase difference, translating into resolution of 10% soil moisture level.Keywords: Capacitive sensor, interface, phase differential.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 34223256 A Novel Optimized JTAG Interface Circuit Design
Authors: Chenguang Guo, Lei Chen, Yanlong Zhang
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This paper describes a novel optimized JTAG interface circuit between a JTAG controller and target IC. Being able to access JTAG using only one or two pins, this circuit does not change the original boundary scanning test frequency of target IC. Compared with the traditional JTAG interface which based on IEEE std. 1149.1, this reduced pin technology is more applicability in pin limited devices, and it is easier to control the scale of target IC for the designer.
Keywords: Boundary scan, JTAG interface, Test frequency, Reduced pin
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 13743255 Simulation of Surge Protection for a Direct Current Circuit
Authors: Pedro Luis Ferrer Penalver, Edmundo da Silva Braga
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In this paper, the performance of a simple surge protection for a direct current circuit was simulated. The protection circuit was developed from modified electric macro models of a gas discharge tube and a transient voltage suppressor diode. Moreover, a combination wave generator circuit was used as source of energy surges. The simulations showed that the circuit presented ensures immunity corresponding with test level IV of the IEC 61000-4-5:2014 international standard. The developed circuit can be modified to meet the requirements of any other equipment to be protected. Similarly, the parameters of the combination wave generator can be changed to provide different surge amplitudes.Keywords: Combination wave generator, IEC 61000-4-5, Pspice simulation, surge protection.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 33233254 A Test Methodology to Measure the Open-Loop Voltage Gain of an Operational Amplifier
Authors: Maninder Kaur Gill, Alpana Agarwal
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It is practically not feasible to measure the open-loop voltage gain of the operational amplifier in the open loop configuration. It is because the open-loop voltage gain of the operational amplifier is very large. In order to avoid the saturation of the output voltage, a very small input should be given to operational amplifier which is not possible to be measured practically by a digital multimeter. A test circuit for measurement of open loop voltage gain of an operational amplifier has been proposed and verified using simulation tools as well as by experimental methods on breadboard. The main advantage of this test circuit is that it is simple, fast, accurate, cost effective, and easy to handle even on a breadboard. The test circuit requires only the device under test (DUT) along with resistors. This circuit has been tested for measurement of open loop voltage gain for different operational amplifiers. The underlying goal is to design testable circuits for various analog devices that are simple to realize in VLSI systems, giving accurate results and without changing the characteristics of the original system. The DUTs used are LM741CN and UA741CP. For LM741CN, the simulated gain and experimentally measured gain (average) are calculated as 89.71 dB and 87.71 dB, respectively. For UA741CP, the simulated gain and experimentally measured gain (average) are calculated as 101.15 dB and 105.15 dB, respectively. These values are found to be close to the datasheet values.Keywords: Device under test, open-loop voltage gain, operational amplifier, test circuit.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 33363253 The Effects of a Circuit Training Program on Muscle Strength, Agility, Anaerobic Performance and Cardiovascular Endurance
Authors: Wirat Sonchan, Pratoom Moungmee, Anek Sootmongkol
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This study aimed to examine the effects of a circuit training program on muscle strength, agility, anaerobic performance and cardiovascular endurance. The study involved 24 freshmen (age 18.87+0.68 yr.) male students of the Faculty of Sport Science, Burapha University. They sample study were randomly divided into two groups: Circuit Training group (CT; n=12) and a Control group (C; n=12). Baseline data on height, weight, muscle strength (hand grip dynamometer and leg strength dynamometer), agility (agility T-Test), and anaerobic performance (Running-based Anaerobic Sprint Test) and cardiovascular endurance (20 m Endurance Shuttle Run Test) were collected. The circuit training program included one circuit of eight stations of 30/60 seconds of work/rest interval with two cycles in Week 1-4, and 60/90 seconds of work/rest interval with three cycles in Week 5-8, performed three times per week. Data were analyzed using paired t-tests and independent sample t-test. Statistically significance level was set at 0.05. The results show that after 8 weeks of a training program, muscle strength, agility, anaerobic capacity and cardiovascular endurance increased significantly in the CT Group (p < 0.05), while significant increase was not observed in the C Group (p < 0.05). The results of this study suggest that the circuit training program improved muscle strength, agility, anaerobic capacity and cardiovascular endurance of the study subjects. This program may be used as a guideline for selecting a set of exercise to improve physical fitness.
Keywords: Cardiovascular endurance, circuit training, physical fitness, anaerobic performance.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 25193252 Reducing Test Vectors Count Using Fault Based Optimization Schemes in VLSI Testing
Authors: Vinod Kumar Khera, R. K. Sharma, A. K. Gupta
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Power dissipation increases exponentially during test mode as compared to normal operation of the circuit. In extreme cases, test power is more than twice the power consumed during normal operation mode. Test vector generation scheme is key component in deciding the power hungriness of a circuit during testing. Test vector count and consequent leakage current are functions of test vector generation scheme. Fault based test vector count optimization has been presented in this work. It helps in reducing test vector count and the leakage current. In the presented scheme, test vectors have been reduced by extracting essential child vectors. The scheme has been tested experimentally using stuck at fault models and results ensure the reduction in test vector count.Keywords: Low power VLSI testing, independent fault, essential faults, test vector reduction.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 14243251 Phasor Analysis of a Synchronous Generator: A Bond Graph Approach
Authors: Israel Núñez-Hernández, Peter C. Breedveld, Paul B. T. Weustink, Gilberto Gonzalez-A
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This paper presents the use of phasor bond graphs to obtain the steady-state behavior of a synchronous generator. The phasor bond graph elements are built using 2D multibonds, which represent the real and imaginary part of the phasor. The dynamic bond graph model of a salient-pole synchronous generator is showed, and verified viz. a sudden short-circuit test. The reduction of the dynamic model into a phasor representation is described. The previous test is executed on the phasor bond graph model, and its steady-state values are compared with the dynamic response. Besides, the widely used power (torque)-angle curves are obtained by means of the phasor bond graph model, to test the usefulness of this model.
Keywords: Bond graphs, complex power, phasors, synchronous generator, short-circuit, open-circuit, power-angle curve.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 25533250 A Dynamically Reconfigurable Arithmetic Circuit for Complex Number and Double Precision Number
Authors: Haruo Shimada, Akinori Kanasugi
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This paper proposes an architecture of dynamically reconfigurable arithmetic circuit. Dynamic reconfiguration is a technique to realize required functions by changing hardware construction during operations. The proposed circuit is based on a complex number multiply-accumulation circuit which is used frequently in the field of digital signal processing. In addition, the proposed circuit performs real number double precision arithmetic operations. The data formats are single and double precision floating point number based on IEEE754. The proposed circuit is designed using VHDL, and verified the correct operation by simulations and experiments.Keywords: arithmetic circuit, complex number, double precision, dynamic reconfiguration
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 15623249 Analysis of SCR-Based ESD Protection Circuit on Holding Voltage Characteristics
Authors: Yong Seo Koo, Jong Ho Nam, Yong Nam Choi, Dae Yeol Yoo, Jung Woo Han
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This paper presents a silicon controller rectifier (SCR) based ESD protection circuit for IC. The proposed ESD protection circuit has low trigger voltage and high holding voltage compared with conventional SCR ESD protection circuit. Electrical characteristics of the proposed ESD protection circuit are simulated and analyzed using TCAD simulator. The proposed ESD protection circuit verified effective low voltage ESD characteristics with low trigger voltage and high holding voltage.
Keywords: ESD (Electro-Static Discharge), SCR (Silicon Controlled Rectifier), holding Voltage.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 37343248 A New True RMS-to-DC Converter in CMOS Technology
Authors: H. Asiaban, E. Farshidi
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This paper presents a new true RMS-to-DC converter circuit based on a square-root-domain squarer/divider. The circuit is designed by employing up-down translinear loop and using of MOSFET transistors that operate in strong inversion saturation region. The converter offer advantages of two-quadrant input current, low circuit complexity, low supply voltage (1.2V) and immunity from the body effect. The circuit has been simulated by HSPICE. The simulation results are seen to conform to the theoretical analysis and shows benefits of the proposed circuit.Keywords: Current-mode, squarer/divider, low-pass filter, converter, translinear loop, RMS-to-DC.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 32933247 Experience-based Learning Program for Electronic Circuit Design
Authors: Koyu Chinen, Haruka Mikamori
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A new multi-step comprehensive experience-based learning program was developed and carried out so that the students understood about what was the principle of the circuit function and how the designed circuit was used in actual advanced applications.Keywords: Electronic circuit education, Experience based learning, Comprehensive education,
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 13593246 Non-Isolated Direct AC-DC Converter Design with BCM-PFC Circuit
Authors: Y. Kobori, L. Xing, H. Gao, N.Onozawa, S. Wu, S. N. Mohyar, Z. Nosker, H. Kobayashi, N. Takai, K. Niitsu
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This paper proposes two types of non-isolated direct AC-DC converters. First, it shows a buck-boost converter with an H-bridge, which requires few components (three switches, two diodes, one inductor and one capacitor) to convert AC input to DC output directly. This circuit can handle a wide range of output voltage. Second, a direct AC-DC buck converter is proposed for lower output voltage applications. This circuit is analyzed with output voltage of 12V. We describe circuit topologies, operation principles and simulation results for both circuits.Keywords: AC-DC converter, Buck-boost converter, Buck converter, PFC, BCM PFC circuit.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 47923245 Realization of a Temperature Based Automatic Controlled Domestic Electric Boiling System
Authors: Shengqi Yu, Jinwei Zhao
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This paper presents a kind of analog circuit based temperature control system, which is mainly composed by threshold control signal circuit, synchronization signal circuit and trigger pulse circuit. Firstly, the temperature feedback signal function is realized by temperature sensor TS503F3950E. Secondly, the main control circuit forms the cycle controlled pulse signal to control the thyristor switching model. Finally two reverse paralleled thyristors regulate the output power by their switching state. In the consequence, this is a modernized and energy-saving domestic electric heating system.Keywords: Time base circuit, automatic control, zero-crossing trigger, temperature control.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 10023244 Design and Characterization of CMOS Readout Circuit for ISFET and ISE Based Sensors
Authors: Yuzman Yusoff, Siti Noor Harun, Noor Shelida Sallehand Tan Kong Yew
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This paper presents the design and characterization of analog readout interface circuits for ion sensitive field effect transistor (ISFET) and ion selective electrode (ISE) based sensor. These interface circuits are implemented using MIMOS’s 0.35um CMOS technology and experimentally characterized under 24-leads QFN package. The characterization evaluates the circuit’s functionality, output sensitivity and output linearity. Commercial sensors for both ISFET and ISE are employed together with glass reference electrode during testing. The test result shows that the designed interface circuits manage to readout signals produced by both sensors with measured sensitivity of ISFET and ISE sensor are 54mV/pH and 62mV/decade, respectively. The characterized output linearity for both circuits achieves above 0.999 rsquare. The readout also has demonstrated reliable operation by passing all qualifications in reliability test plan.
Keywords: Readout interface circuit (ROIC), analog interface circuit, ion sensitive field effect transistor (ISFET), ion selective electrode (ISE), and ion sensor electronics.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 26543243 Design and Characterization of CMOS Readout Circuit for ISFET and ISE Based Sensors
Authors: Yuzman Yusoff, Siti Noor Harun, Noor Shelida Sallehand, Tan Kong Yew
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This paper presents the design and characterization of analog readout interface circuits for ion sensitive field effect transistor (ISFET) and ion selective electrode (ISE) based sensor. These interface circuits are implemented using MIMOS’s 0.35um CMOS technology and experimentally characterized under 24-leads QFN package. The characterization evaluates the circuit’s functionality, output sensitivity and output linearity. Commercial sensors for both ISFET and ISE are employed together with glass reference electrode during testing. The test result shows that the designed interface circuits manage to readout signals produced by both sensors with measured sensitivity of ISFET and ISE sensor are 54mV/pH and 62mV/decade, respectively. The characterized output linearity for both circuits achieves above 0.999 Rsquare. The readout also has demonstrated reliable operation by passing all qualifications in reliability test plan.
Keywords: Readout interface circuit (ROIC), analog interface circuit, ion sensitive field effect transistor (ISFET), ion selective electrode (ISE), ion sensor electronics.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 20653242 A 1.5V,100MS/s,12-bit Current-Mode CMOSS ample-and-Hold Circuit
Authors: O. Hashemipour, S. G. Nabavi
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A high-linearity and high-speed current-mode sampleand- hold circuit is designed and simulated using a 0.25μm CMOS technology. This circuit design is based on low voltage and it utilizes a fully differential circuit. Due to the use of only two switches the switch related noise has been reduced. Signal - dependent -error is completely eliminated by a new zero voltage switching technique. The circuit has a linearity error equal to ±0.05μa, i.e. 12-bit accuracy with a ±160 μa differential output - input signal frequency of 5MHZ, and sampling frequency of 100 MHZ. Third harmonic is equal to –78dB.Keywords: Zero-voltage-technique, MOS-resistor, OTA, Feedback-resistor.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 14063241 Metal-Oxide-Semiconductor-Only Process Corner Monitoring Circuit
Authors: Davit Mirzoyan, Ararat Khachatryan
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A process corner monitoring circuit (PCMC) is presented in this work. The circuit generates a signal, the logical value of which depends on the process corner only. The signal can be used in both digital and analog circuits for testing and compensation of process variations (PV). The presented circuit uses only metal-oxide-semiconductor (MOS) transistors, which allow increasing its detection accuracy, decrease power consumption and area. Due to its simplicity the presented circuit can be easily modified to monitor parametrical variations of only n-type and p-type MOS (NMOS and PMOS, respectively) transistors, resistors, as well as their combinations. Post-layout simulation results prove correct functionality of the proposed circuit, i.e. ability to monitor the process corner (equivalently die-to-die variations) even in the presence of within-die variations.Keywords: Detection, monitoring, process corner, process variation.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 13273240 Charge-Pump with a Regulated Cascode Circuit for Reducing Current Mismatch in PLLs
Authors: Jae Hyung Noh, Hang Geun Jeong
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The charge-pump circuit is an important component in a phase-locked loop (PLL). The charge-pump converts Up and Down signals from the phase/frequency detector (PFD) into current. A conventional CMOS charge-pump circuit consists of two switched current sources that pump charge into or out of the loop filter according to two logical inputs. The mismatch between the charging current and the discharging current causes phase offset and reference spurs in a PLL. We propose a new charge-pump circuit to reduce the current mismatch by using a regulated cascode circuit. The proposed charge-pump circuit is designed and simulated by spectre with TSMC 0.18-μm 1.8-V CMOS technology.
Keywords: Phase-locked loop (PLL), charge-pump, phase/frequency detector (PFD), regulated cascode.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 39453239 Realization of Electronically Controllable Current-mode Square-rooting Circuit Based on MO-CFTA
Authors: P. Silapan, C. Chanapromma, T. Worachak
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This article proposes a current-mode square-rooting circuit using current follower transconductance amplifier (CTFA). The amplitude of the output current can be electronically controlled via input bias current with wide input dynamic range. The proposed circuit consists of only single CFTA. Without any matching conditions and external passive elements, the circuit is then appropriate for an IC architecture. The magnitude of the output signal is temperature-insensitive. The PSpice simulation results are depicted, and the given results agree well with the theoretical anticipation. The power consumption is approximately 1.96mW at ±1.5V supply voltages.Keywords: CFTA, Current-mode, Square-rooting Circuit
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 14073238 A Low-Voltage Current-Mode Wheatstone Bridge using CMOS Transistors
Authors: Ebrahim Farshidi
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This paper presents a new circuit arrangement for a current-mode Wheatstone bridge that is suitable for low-voltage integrated circuits implementation. Compared to the other proposed circuits, this circuit features severe reduction of the elements number, low supply voltage (1V) and low power consumption (<350uW). In addition, the circuit has favorable nonlinearity error (<0.35%), operate with multiple sensors and works by single supply voltage. The circuit employs MOSFET transistors, so it can be used for standard CMOS fabrication. Simulation results by HSPICE show high performance of the circuit and confirm the validity of the proposed design technique.Keywords: Wheatstone bridge, current-mode, low-voltage, MOS.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 30243237 Complementary Energy Path Adiabatic Logic based Full Adder Circuit
Authors: Shipra Upadhyay , R. K. Nagaria, R. A. Mishra
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In this paper, we present the design and experimental evaluation of complementary energy path adiabatic logic (CEPAL) based 1 bit full adder circuit. A simulative investigation on the proposed full adder has been done using VIRTUOSO SPECTRE simulator of cadence in 0.18μm UMC technology and its performance has been compared with the conventional CMOS full adder circuit. The CEPAL based full adder circuit exhibits the energy saving of 70% to the conventional CMOS full adder circuit, at 100 MHz frequency and 1.8V operating voltage.Keywords: Adiabatic, CEPAL, full adder, power clock
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 24453236 Reliability Modeling and Data Analysis of Vacuum Circuit Breaker Subject to Random Shocks
Authors: Rafik Medjoudj, Rabah Medjoudj, D. Aissani
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The electrical substation components are often subject to degradation due to over-voltage or over-current, caused by a short circuit or a lightning. A particular interest is given to the circuit breaker, regarding the importance of its function and its dangerous failure. This component degrades gradually due to the use, and it is also subject to the shock process resulted from the stress of isolating the fault when a short circuit occurs in the system. In this paper, based on failure mechanisms developments, the wear out of the circuit breaker contacts is modeled. The aim of this work is to evaluate its reliability and consequently its residual lifetime. The shock process is based on two random variables such as: the arrival of shocks and their magnitudes. The arrival of shocks was modeled using homogeneous Poisson process (HPP). By simulation, the dates of short-circuit arrivals were generated accompanied with their magnitudes. The same principle of simulation is applied to the amount of cumulative wear out contacts. The objective reached is to find the formulation of the wear function depending on the number of solicitations of the circuit breaker.
Keywords: reliability, short-circuit, models of shocks.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 19393235 Analog Circuit Design using Genetic Algorithm: Modified
Authors: Amod P. Vaze
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Genetic Algorithm has been used to solve wide range of optimization problems. Some researches conduct on applying Genetic Algorithm to analog circuit design automation. These researches show a better performance due to the nature of Genetic Algorithm. In this paper a modified Genetic Algorithm is applied for analog circuit design automation. The modifications are made to the topology of the circuit. These modifications will lead to a more computationally efficient algorithm.
Keywords: Genetic algorithm, analog circuits, design.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 22953234 The Invariant Properties of Two-Port Circuits
Authors: Alexandr A. Penin
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Application of projective geometry to the theory of two-ports and cascade circuits with a load change is considered. The equations linking the input and output of a two-port are interpreted as projective transformations which have the invariant as a cross-ratio of four points. This invariant has place for all regime parameters in all parts of a cascade circuit. This approach allows justifying the definition of a regime and its change, to calculate a circuit without explicitly finding the aparameters, to transmit accurately an analogue signal through the unstable two-port.
Keywords: Circuit regime, geometric circuit theory, projective geometry, two-port.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 15693233 Equivalent Circuit Modelling of Active Reflectarray Antenna
Authors: M. Y. Ismail, M. Inam
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This paper presents equivalent circuit modeling of active planar reflectors which can be used for the detailed analysis and characterization of reflector performance in terms of lumped components. Equivalent circuit representation has been proposed for PIN diodes and liquid crystal based active planar reflectors designed within X-band frequency range. A very close agreement has been demonstrated between equivalent circuit results, 3D EM simulated results as well as measured scattering parameter results. In the case of measured results, a maximum discrepancy of 1.05dB was observed in the reflection loss performance, which can be attributed to the losses occurred during measurement process.
Keywords: Equivalent circuit modelling, planar reflectors, reflectarray antenna, PIN diode, liquid crystal.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 10693232 Design and Simulation Interface Circuit for Piezoresistive Accelerometers with Offset Cancellation Ability
Authors: Mohsen Bagheri, Ahmad Afifi
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This paper presents a new method for read out of the piezoresistive accelerometer sensors. The circuit works based on Instrumentation amplifier and it is useful for reducing offset In Wheatstone Bridge. The obtained gain is 645 with 1μv/°c Equivalent drift and 1.58mw power consumption. A Schmitt trigger and multiplexer circuit control output node. a high speed counter is designed in this work .the proposed circuit is designed and simulated In 0.18μm CMOS technology with 1.8v power supply.
Keywords: Piezoresistive accelerometer, zero offset, Schmitt trigger, bidirectional reversible counter
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 27473231 On-Chip Aging Sensor Circuit Based on Phase Locked Loop Circuit
Authors: Ararat Khachatryan, Davit Mirzoyan
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In sub micrometer technology, the aging phenomenon starts to have a significant impact on the reliability of integrated circuits by bringing performance degradation. For that reason, it is important to have a capability to evaluate the aging effects accurately. This paper presents an accurate aging measurement approach based on phase-locked loop (PLL) and voltage-controlled oscillator (VCO) circuit. The architecture is rejecting the circuit self-aging effect from the characteristics of PLL, which is generating the frequency without any aging phenomena affects. The aging monitor is implemented in low power 32 nm CMOS technology, and occupies a pretty small area. Aging simulation results show that the proposed aging measurement circuit improves accuracy by about 2.8% at high temperature and 19.6% at high voltage.
Keywords: Nanoscale, aging, effect, NBTI, HCI.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 14243230 An Investigation of Short Circuit Analysis in Komag Sarawak Operations (KSO) Factory
Authors: M. H. Hairi, H. Zainuddin, M.H.N. Talib, A. Khamis, J. Y. Lichun
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Short circuit currents plays a vital role in influencing the design and operation of equipment and power system and could not be avoided despite careful planning and design, good maintenance and thorough operation of the system. This paper discusses the short circuit analysis conducted in KSO briefly comprising of its significances, methods and results. A result sample of the analysis based on a single transformer is detailed in this paper. Furthermore, the results of the analysis and its significances were also discussed and commented.
Keywords: Short circuit currents, Transformer fault current
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 24033229 A Silicon Controlled Rectifier-Based ESD Protection Circuit with High Holding Voltage and High Robustness Characteristics
Authors: Kyoung-il Do, Byung-seok Lee, Hee-guk Chae, Jeong-yun Seo Yong-seo Koo
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In this paper, a Silicon Controlled Rectifier (SCR)-based Electrostatic Discharge (ESD) protection circuit with high holding voltage and high robustness characteristics is proposed. Unlike conventional SCR, the proposed circuit has low trigger voltage and high holding voltage and provides effective ESD protection with latch-up immunity. In addition, the TCAD simulation results show that the proposed circuit has better electrical characteristics than the conventional SCR. A stack technology was used for voltage-specific applications. Consequentially, the proposed circuit has a trigger voltage of 17.60 V and a holding voltage of 3.64 V.Keywords: ESD, SCR, latch-up, power clamp, holding voltage.
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 830