Vinod Kumar Khera and R. K. Sharma and A. K. Gupta, Reducing Test Vectors Count Using Fault Based Optimization Schemes in VLSI Testing. journal = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology. September 2016, vol. 109(1). 176 - 179 [viewed 20 September 2024]. Available from: https://publications.waset.org/pdf/10005719.