Vinod Kumar Khera and  R. K. Sharma and  A. K. Gupta,  Reducing Test Vectors Count Using Fault Based Optimization Schemes in VLSI Testing.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    September 2016, vol. 109(1). 176 - 179
    [viewed 05 May 2024]. Available from: https://publications.waset.org/pdf/10005719.