A Novel Optimized JTAG Interface Circuit Design

Authors: Chenguang Guo, Lei Chen, Yanlong Zhang

Abstract:

This paper describes a novel optimized JTAG interface circuit between a JTAG controller and target IC. Being able to access JTAG using only one or two pins, this circuit does not change the original boundary scanning test frequency of target IC. Compared with the traditional JTAG interface which based on IEEE std. 1149.1, this reduced pin technology is more applicability in pin limited devices, and it is easier to control the scale of target IC for the designer.

Keywords: Boundary scan, JTAG interface, Test frequency, Reduced pin

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1073020

References:

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