%0 Journal Article
	%A Rafik Medjoudj and  Rabah Medjoudj and  D. Aissani
	%D 2011
	%J International Journal of Electrical and Computer Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 59, 2011
	%T Reliability Modeling and Data Analysis of Vacuum Circuit Breaker Subject to Random Shocks
	%U https://publications.waset.org/pdf/9596
	%V 59
	%X The electrical substation components are often subject to degradation due to over-voltage or over-current, caused by a short circuit or a lightning. A particular interest is given to the circuit breaker, regarding the importance of its function and its dangerous failure. This component degrades gradually due to the use, and it is also subject to the shock process resulted from the stress of isolating the fault when a short circuit occurs in the system. In this paper, based on failure mechanisms developments, the wear out of the circuit breaker contacts is modeled. The aim of this work is to evaluate its reliability and consequently its residual lifetime. The shock process is based on two random variables such as: the arrival of shocks and their magnitudes. The arrival of shocks was modeled using homogeneous Poisson process (HPP). By simulation, the dates of short-circuit arrivals were generated accompanied with their magnitudes. The same principle of simulation is applied to the amount of cumulative wear out contacts. The objective reached is to find the formulation of the wear function depending on the number of solicitations of the circuit breaker.

	%P 1441 - 1445