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Reducing Test Vectors Count Using Fault Based Optimization Schemes in VLSI Testing
Abstract:Power dissipation increases exponentially during test mode as compared to normal operation of the circuit. In extreme cases, test power is more than twice the power consumed during normal operation mode. Test vector generation scheme is key component in deciding the power hungriness of a circuit during testing. Test vector count and consequent leakage current are functions of test vector generation scheme. Fault based test vector count optimization has been presented in this work. It helps in reducing test vector count and the leakage current. In the presented scheme, test vectors have been reduced by extracting essential child vectors. The scheme has been tested experimentally using stuck at fault models and results ensure the reduction in test vector count.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1339530Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 791
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