Search results for: test circuit.
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 3238

Search results for: test circuit.

3028 An Experimental Investigation of Heating in Induction Motors

Authors: R. Khaldi, N. Benamrouche, M. Bouheraoua

Abstract:

The ability to predict an accurate temperature distribution requires the knowledge of the losses, the thermal characteristics of the materials, and the cooling conditions, all of which are very difficult to quantify. In this paper, the impact of the effects of iron and copper losses are investigated separately and their effects on the heating in various points of the stator of an induction motor, is highlighted by using two simple tests. In addition, the effect of a defect, such as an open circuit in a phase of the stator, on the heating is also obtained by a no-load test. The squirrel cage induction motor is rated at 2.2 kW; 380 V; 5.2 A; Δ connected; 50 Hz; 1420 rpm and the class of insulation F, has been thermally tested under several load conditions. Several thermocouples were placed in strategic points of the stator.

Keywords: induction motor, temperature, heating, losses

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3027 Regression Test Selection Technique for Multi-Programming Language

Authors: Walid S. Abd El-hamid, Sherif S. El-Etriby, Mohiy M. Hadhoud

Abstract:

Regression testing is a maintenance activity applied to modified software to provide confidence that the changed parts are correct and that the unchanged parts have not been adversely affected by the modifications. Regression test selection techniques reduce the cost of regression testing, by selecting a subset of an existing test suite to use in retesting modified programs. This paper presents the first general regression-test-selection technique, which based on code and allows selecting test cases for any programs written in any programming language. Then it handles incomplete program. We also describe RTSDiff, a regression-test-selection system that implements the proposed technique. The results of the empirical studied that performed in four programming languages java, C#, Cµ and Visual basic show that the efficiency and effective in reducing the size of test suit.

Keywords: Regression testing, testing, test selection, softwareevolution, software maintenance.

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3026 Three-phases Model of the Induction Machine Taking Account the Stator Faults

Authors: Djalal Eddine Khodja, Aissa Kheldoun

Abstract:

In this work we present the modelling of the induction machine, taking into consideration the stator defects of the induction machine. It is based on the theory of electromagnetic coupling of electrical circuits. In fact, for the modelling of stationary defects such as short circuit between turns in the same phase, we introduce only in the matrix the coefficients of resistance and inductance of stator and in the mutual inductance stator-rotor. These coefficients take account the number of turns in short-circuit deducted from the total number of turns in the same phase; in this way we obtain the number of useful turns. In addition, all these faults involved, will be used for the creation of the database that will be used to develop an automated system failures of the induction machine.

Keywords: Asynchronous machine, Indicatory Values Statorfaults, Multi-turns Model, Three-phases Model.

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3025 Web Application for Evaluating Tests in Distance Learning Systems

Authors: Bogdan Walek, Vladimir Bradac, Radim Farana

Abstract:

Distance learning systems offer useful methods of learning and usually contain a final course test or another form of test. The paper proposes a web application for evaluating tests using an expert system in distance learning systems. The proposed web application is appropriate for didactic tests or tests with results for subsequent studying follow-up courses. The web application works with test questions and uses an expert system and LFLC tool for test evaluation. After test evaluation, the results are visualized and shown to the student.

Keywords: Distance learning, test, uncertainty, fuzzy, expert system, student.

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3024 A Performance Evaluation of Oscillation Based Test in Continuous Time Filters

Authors: Eduardo Romero, Marcelo Costamagna, Gabriela Peretti, Carlos Marqués

Abstract:

This work evaluates the ability of OBT for detecting parametric faults in continuous-time filters. To this end, we adopt two filters with quite different topologies as cases of study and a previously reported statistical fault model. In addition, we explore the behavior of the test schemes when a particular test condition is changed. The new data reported here, obtained from a fault simulation process, reveal a lower performance of OBT not observed in previous work using single-deviation faults, even under the change in the test condition.

Keywords: Testing, analog fault simulation, analog filter test, oscillation based test.

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3023 A Pipelined FSBM Hardware Architecture for HTDV-H.26x

Authors: H. Loukil, A. Ben Atitallah, F. Ghozzi, M. A. Ben Ayed, N. Masmoudi

Abstract:

In MPEG and H.26x standards, to eliminate the temporal redundancy we use motion estimation. Given that the motion estimation stage is very complex in terms of computational effort, a hardware implementation on a re-configurable circuit is crucial for the requirements of different real time multimedia applications. In this paper, we present hardware architecture for motion estimation based on "Full Search Block Matching" (FSBM) algorithm. This architecture presents minimum latency, maximum throughput, full utilization of hardware resources such as embedded memory blocks, and combining both pipelining and parallel processing techniques. Our design is described in VHDL language, verified by simulation and implemented in a Stratix II EP2S130F1020C4 FPGA circuit. The experiment result show that the optimum operating clock frequency of the proposed design is 89MHz which achieves 160M pixels/sec.

Keywords: SAD, FSBM, Hardware Implementation, FPGA.

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3022 Unit Testing with Déjà-Vu Objects

Authors: Sharareh Afsharian, Andrea Bei, Marco Bianchi

Abstract:

In this paper we introduce a new unit test technique called déjà-vu object. Déjà-vu objects replace real objects used by classes under test, allowing the execution of isolated unit tests. A déjà-vu object is able to observe and record the behaviour of a real object during real sessions, and to replace it during unit tests, returning previously recorded results. Consequently déjà-vu object technique can be useful when a bottom-up development and testing strategy is adopted. In this case déjà-vu objects can increase test portability and test source code readability. At the same time they can reduce the time spent by programmers to develop test code and the risk of incompatibility during the switching between déjà-vu and production code.

Keywords: Bottom-up testing approach, integration test, testportability, unit test.

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3021 Comprehensive Nonlinearity Simulation of Different Types and Modes of HEMTs with Respect to Biasing Conditions

Authors: M. M. Karkhanehchi, A. Ammani

Abstract:

A simple analytical model has been developed to optimize biasing conditions for obtaining maximum linearity among lattice-matched, pseudomorphic and metamorphic HEMT types as well as enhancement and depletion HEMT modes. A nonlinear current-voltage model has been simulated based on extracted data to study and select the most appropriate type and mode of HEMT in terms of a given gate-source biasing voltage within the device so as to employ the circuit for the highest possible output current or voltage linear swing. Simulation results can be used as a basis for the selection of optimum gate-source biasing voltage for a given type and mode of HEMT with regard to a circuit design. The consequences can also be a criterion for choosing the optimum type or mode of HEMT for a predetermined biasing condition.

Keywords: Biasing, characteristic, linearity, simulation.

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3020 Active Power Filtering Implementation Using Photovoltaic System with Reduced Energy Storage Capacitor

Authors: Horng-Yuan Wu, Chin-Yuan Hsu, Tsair-Fwu Lee

Abstract:

A novel three-phase active power filter (APF) circuit with photovoltaic (PV) system to improve the quality of service and to reduce the capacity of energy storage capacitor is presented. The energy balance concept and sampling technique were used to simplify the calculation algorithm for the required utility source current and to control the voltage of the energy storage capacitor. The feasibility was verified by using the Pspice simulations and experiments. When the APF mode was used during non-operational period, not only the utilization rate, power factor and power quality could be improved, but also the capacity of energy storage capacitor could sparing. As the results, the advantages of the APF circuit are simplicity of control circuits, low cost, and good transient response.

Keywords: active power filter, sampling, energy-storagecapacitor, harmonic current, energy balance.

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3019 Application of a SubIval Numerical Solver for Fractional Circuits

Authors: Marcin Sowa

Abstract:

The paper discusses the subinterval-based numerical method for fractional derivative computations. It is now referred to by its acronym – SubIval. The basis of the method is briefly recalled. The ability of the method to be applied in time stepping solvers is discussed. The possibility of implementing a time step size adaptive solver is also mentioned. The solver is tested on a transient circuit example. In order to display the accuracy of the solver – the results have been compared with those obtained by means of a semi-analytical method called gcdAlpha. The time step size adaptive solver applying SubIval has been proven to be very accurate as the results are very close to the referential solution. The solver is currently able to solve FDE (fractional differential equations) with various derivative orders for each equation and any type of source time functions.

Keywords: Numerical method, SubIval, fractional calculus, numerical solver, circuit analysis.

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3018 Model-Based Software Regression Test Suite Reduction

Authors: Shiwei Deng, Yang Bao

Abstract:

In this paper, we present a model-based regression test suite reducing approach that uses EFSM model dependence analysis and probability-driven greedy algorithm to reduce software regression test suites. The approach automatically identifies the difference between the original model and the modified model as a set of elementary model modifications. The EFSM dependence analysis is performed for each elementary modification to reduce the regression test suite, and then the probability-driven greedy algorithm is adopted to select the minimum set of test cases from the reduced regression test suite that cover all interaction patterns. Our initial experience shows that the approach may significantly reduce the size of regression test suites.

Keywords: Dependence analysis, EFSM model, greedy algorithm, regression test.

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3017 Analysis and Design of Simultaneous Dual Band Harvesting System with Enhanced Efficiency

Authors: Zina Saheb, Ezz El-Masry, Jean-François Bousquet

Abstract:

This paper presents an enhanced efficiency simultaneous dual band energy harvesting system for wireless body area network. A bulk biasing is used to enhance the efficiency of the adapted rectifier design to reduce Vth of MOSFET. The presented circuit harvests the radio frequency (RF) energy from two frequency bands: 1 GHz and 2.4 GHz. It is designed with TSMC 65-nm CMOS technology and high quality factor dual matching network to boost the input voltage. Full circuit analysis and modeling is demonstrated. The simulation results demonstrate a harvester with an efficiency of 23% at 1 GHz and 46% at 2.4 GHz at an input power as low as -30 dBm.

Keywords: Energy harvester, simultaneous, dual band, CMOS, differential rectifier, voltage boosting, TSMC 65nm.

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3016 High Efficiency Class-F Power Amplifier Design

Authors: Abdalla Mohamed Eblabla

Abstract:

Due to the high increase in and demand for a wide assortment of applications that require low-cost, high-efficiency, and compact systems, RF power amplifiers are considered the most critical design blocks and power consuming components in wireless communication, TV transmission, radar, and RF heating. Therefore, much research has been carried out in order to improve the performance of power amplifiers. Classes-A, B, C, D, E and F are the main techniques for realizing power amplifiers.

An implementation of high efficiency class-F power amplifier with Gallium Nitride (GaN) High Electron Mobility Transistor (HEMT) was realized in this paper. The simulation and optimization of the class-F power amplifier circuit model was undertaken using Agilent’s Advanced Design system (ADS). The circuit was designed using lumped elements.

Keywords: Power Amplifier (PA), Gallium Nitride (GaN), Agilent’s Advanced Design system (ADS) and lumped elements.

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3015 Teachers and Learners Perceptions on the Impact of Different Test Procedures on Reading: A Case Study

Authors: Bahloul Amel

Abstract:

The main aim of this research was to investigate the perspectives of English language teachers and learners on the effect of test techniques on reading comprehension, test performance and assessment. The research has also aimed at finding the differences between teacher and learner perspectives, specifying the test techniques which have the highest effect, investigating the other factors affecting reading comprehension, and comparing the results with the similar studies. In order to achieve these objectives, perspectives and findings of different researchers were reviewed, two different questionnaires were prepared to collect data for the perspectives of teachers and learners, the questionnaires were applied to 26 learners and 8 teachers from the University of Batna (Algeria), and quantitative and qualitative data analysis of the results were done. The results and analysis of the results show that different test techniques affect reading comprehension, test performance and assessment at different percentages rates.

Keywords: Reading Comprehension, Reading Assessment, Test Performance, Test Techniques.

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3014 A Study of Environmental Test Sequences for Electrical Units

Authors: Jung Ho Yang, Yong Soo Kim

Abstract:

Electrical units are operated by electrical and electronic components. An environmental test sequence is useful for testing electrical units to reduce reliability issues. This study introduces test sequence guidelines based on relevant principles and considerations for electronic testing according to International Standard IEC-60068-1 and the United States Military Standard MIL-STD-810G. Test sequences were then proposed based on the descriptions for each test. Finally, General Motors (GM) specification GMW3172 was interpreted and compared to IEC-60068-1 and MIL-STD-810G.

Keywords: Reliability, Environmental test sequence, Electrical units, IEC 60068-1, MIL-STD-810G.

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3013 The Effect of Global Solar Variations on the Performance of n-AlGaAs/p-GaAs Solar Cells

Authors: A. Guechi, M. Chegaar

Abstract:

This study investigates how AlGaAs/GaAs thin film solar cells perform under varying global solar spectrum due to the changes of environmental parameters such as the air mass and the atmospheric turbidity. The solar irradiance striking the solar cell is simulated using the spectral irradiance model SMARTS2 (Simple Model of the Atmospheric Radiative Transfer of Sunshine) for clear skies on the site of Setif (Algeria). The results show a reduction in the short circuit current due to increasing atmospheric turbidity, it is 63.09% under global radiation. However increasing air mass leads to a reduction in the short circuit current of 81.73%. The efficiency decreases with increasing atmospheric turbidity and air mass.

Keywords: AlGaAs/GaAs, Solar Cells, Environmental parameters, Spectral Variation, SMARTS.

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3012 Yield Prediction Using Support Vectors Based Under-Sampling in Semiconductor Process

Authors: Sae-Rom Pak, Seung Hwan Park, Jeong Ho Cho, Daewoong An, Cheong-Sool Park, Jun Seok Kim, Jun-Geol Baek

Abstract:

It is important to predict yield in semiconductor test process in order to increase yield. In this study, yield prediction means finding out defective die, wafer or lot effectively. Semiconductor test process consists of some test steps and each test includes various test items. In other world, test data has a big and complicated characteristic. It also is disproportionably distributed as the number of data belonging to FAIL class is extremely low. For yield prediction, general data mining techniques have a limitation without any data preprocessing due to eigen properties of test data. Therefore, this study proposes an under-sampling method using support vector machine (SVM) to eliminate an imbalanced characteristic. For evaluating a performance, randomly under-sampling method is compared with the proposed method using actual semiconductor test data. As a result, sampling method using SVM is effective in generating robust model for yield prediction.

Keywords: Yield Prediction, Semiconductor Test Process, Support Vector Machine, Under Sampling

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3011 Design of a Novel Inclination Sensor Utilizing Grayscale Image

Authors: Tuhin Subhra Sarkar, Subir Das

Abstract:

Several research works have been done in recent times utilizing grayscale image for the measurement of many physical phenomena. In this present paper, we have designed an embedded based inclination sensor utilizing the grayscale image with a resolution of 0.3º. The sensor module consists of a circular shaped metal disc, laminated with grayscale image and an optical transreceiver. The sensor principle is based on temporal changes in light intensity by the movement of grayscale image with the inclination of the target surface and the variation of light intensity has been detected in terms of voltage by the signal processing circuit (SPC).The output of SPC is fed to a microcontroller program to display the inclination angel digitally. The experimental results are shown a satisfactory performance of the sensor in a small inclination measuring range of -40º to + 40º with a sensitivity of 62 mV/°.

Keywords: Grayscale image, Inclination Sensor, Microcontroller Program, Signal Processing Circuit.

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3010 Application of Machine Learning Methods to Online Test Error Detection in Semiconductor Test

Authors: Matthias Kirmse, Uwe Petersohn, Elief Paffrath

Abstract:

As in today's semiconductor industries test costs can make up to 50 percent of the total production costs, an efficient test error detection becomes more and more important. In this paper, we present a new machine learning approach to test error detection that should provide a faster recognition of test system faults as well as an improved test error recall. The key idea is to learn a classifier ensemble, detecting typical test error patterns in wafer test results immediately after finishing these tests. Since test error detection has not yet been discussed in the machine learning community, we define central problem-relevant terms and provide an analysis of important domain properties. Finally, we present comparative studies reflecting the failure detection performance of three individual classifiers and three ensemble methods based upon them. As base classifiers we chose a decision tree learner, a support vector machine and a Bayesian network, while the compared ensemble methods were simple and weighted majority vote as well as stacking. For the evaluation, we used cross validation and a specially designed practical simulation. By implementing our approach in a semiconductor test department for the observation of two products, we proofed its practical applicability.

Keywords: Ensemble methods, fault detection, machine learning, semiconductor test.

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3009 Enhancement of Performance Utilizing Low Complexity Switched Beam Antenna

Authors: P. Chaipanya, R. Keawchai, W. Sombatsanongkhun, S. Jantaramporn

Abstract:

To manage the demand of wireless communication that has been dramatically increased, switched beam antenna in smart antenna system is focused. Implementation of switched beam antennas at mobile terminals such as notebook or mobile handset is a preferable choice to increase the performance of the wireless communication systems. This paper proposes the low complexity switched beam antenna using single element of antenna which is suitable to implement at mobile terminal. Main beam direction is switched by changing the positions of short circuit on the radiating patch. There are four cases of switching that provide four different directions of main beam. Moreover, the performance in terms of Signal to Interference Ratio when utilizing the proposed antenna is compared with the one using omni-directional antenna to confirm the performance improvable.

Keywords: Switched beam, shorted circuit, single element, signal to interference ratio.

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3008 An Efficient Digital Baseband ASIC for Wireless Biomedical Signals Monitoring

Authors: Kah-Hyong Chang, Xin Liu, Jia Hao Cheong, Saisundar Sankaranarayanan, Dexing Pang, Hongzhao Zheng

Abstract:

A digital baseband Application-Specific Integrated Circuit (ASIC) (yclic Redundancy Checkis developed for a microchip transponder to transmit signals and temperature levels from biomedical monitoring devices. The transmission protocol is adapted from the ISO/IEC 11784/85 standard. The module has a decimation filter that employs only a single adder-subtractor in its datapath. The filtered output is coded with cyclic redundancy check and transmitted through backscattering Load Shift Keying (LSK) modulation to a reader. Fabricated using the 0.18-μm CMOS technology, the module occupies 0.116 mm2 in chip area (digital baseband: 0.060 mm2, decimation filter: 0.056 mm2), and consumes a total of less than 0.9 μW of power (digital baseband: 0.75 μW, decimation filter: 0.14 μW).

Keywords: Biomedical sensor, decimation filter, Radio Frequency Integrated Circuit (RFIC) baseband, temperature sensor.

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3007 Time-Domain Analysis of Pulse Parameters Effects on Crosstalk (In High Speed Circuits)

Authors: L. Tani, N. El Ouzzani

Abstract:

Crosstalk among interconnects and printed-circuit board (PCB) traces is a major limiting factor of signal quality in highspeed digital and communication equipments especially when fast data buses are involved. Such a bus is considered as a planar multiconductor transmission line. This paper will demonstrate how the finite difference time domain (FDTD) method provides an exact solution of the transmission-line equations to analyze the near end and the far end crosstalk. In addition, this study makes it possible to analyze the rise time effect on the near and far end voltages of the victim conductor. The paper also discusses a statistical analysis, based upon a set of several simulations. Such analysis leads to a better understanding of the phenomenon and yields useful information.

Keywords: Multiconductor transmission line, Crosstalk, Finite difference time domain (FDTD), printed-circuit board (PCB), Rise time, Statistical analysis.

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3006 Depression and Its Effects on a Cognitive Performance Test

Authors: C. Noi-Okwei

Abstract:

In this study, participants with adjustment disorder with depressed mood (aged 18-54 years) with mild depression (N=18), severe depression (N=12) were compared with healthy controls (N=20) on the Multidimensional Aptitude Battery (MAB) a cognitive performance test. Using One Way Analysis of Variance and Matched Sample t-test. The results of the analysis shows that severely depressed participants performed poorly on the cognitive performance test relative to controls, however there were no significant differences on the cognitive performance test scores between the severely depressed and the mildly depressed. In addition, performance on the non-verbal performance subtest was poorer than that of the verbal subtest, suggesting that depression affects the executive functions of the person.

Keywords: adjustment disorder, cognitive performance test, Depression,

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3005 A Note on Penalized Power-Divergence Test Statistics

Authors: Aylin Alin

Abstract:

In this paper, penalized power-divergence test statistics have been defined and their exact size properties to test a nested sequence of log-linear models have been compared with ordinary power-divergence test statistics for various penalization, λ and main effect values. Since the ordinary and penalized power-divergence test statistics have the same asymptotic distribution, comparisons have been only made for small and moderate samples. Three-way contingency tables distributed according to a multinomial distribution have been considered. Simulation results reveal that penalized power-divergence test statistics perform much better than their ordinary counterparts.

Keywords: Contingency table, Log-linear models, Penalization, Power-divergence measure, Penalized power-divergence measure.

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3004 Elegant: An Intuitive Software Tool for Interactive Learning of Power System Analysis

Authors: Eduardo N. Velloso, Fernando M. N. Dantas, Luciano S. Barros

Abstract:

A common complaint from power system analysis students lies in the overly complex tools they need to learn and use just to simulate very basic systems or just to check the answers to power system calculations. The most basic power system studies are power-flow solutions and short-circuit calculations. This paper presents a simple tool with an intuitive interface to perform both these studies and assess its performance in comparison with existent commercial solutions. With this in mind, Elegant is a pure Python software tool for learning power system analysis developed for undergraduate and graduate students. It solves the power-flow problem by iterative numerical methods and calculates bolted short-circuit fault currents by modeling the network in the domain of symmetrical components. Elegant can be used with a user-friendly Graphical User Interface (GUI) and automatically generates human-readable reports of the simulation results. The tool is exemplified using a typical Brazilian regional system with 18 buses. This study performs a comparative experiment with 1 undergraduate and 4 graduate students who attempted the same problem using both Elegant and a commercial tool. It was found that Elegant significantly reduces the time and labor involved in basic power system simulations while still providing some insights into real power system designs.

Keywords: Free- and open-source software, power-flow, power system analysis, Python, short-circuit.

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3003 An Analysis of Genetic Algorithm Based Test Data Compression Using Modified PRL Coding

Authors: K. S. Neelukumari, K. B. Jayanthi

Abstract:

In this paper genetic based test data compression is targeted for improving the compression ratio and for reducing the computation time. The genetic algorithm is based on extended pattern run-length coding. The test set contains a large number of X value that can be effectively exploited to improve the test data compression. In this coding method, a reference pattern is set and its compatibility is checked. For this process, a genetic algorithm is proposed to reduce the computation time of encoding algorithm. This coding technique encodes the 2n compatible pattern or the inversely compatible pattern into a single test data segment or multiple test data segment. The experimental result shows that the compression ratio and computation time is reduced.

Keywords: Backtracking, test data compression (TDC), x-filling, x-propagating and genetic algorithm.

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3002 Digital filters for Hot-Mix Asphalt Complex Modulus Test Data Using Genetic Algorithm Strategies

Authors: Madhav V. Chitturi, Anshu Manik, Kasthurirangan Gopalakrishnan

Abstract:

The dynamic or complex modulus test is considered to be a mechanistically based laboratory test to reliably characterize the strength and load-resistance of Hot-Mix Asphalt (HMA) mixes used in the construction of roads. The most common observation is that the data collected from these tests are often noisy and somewhat non-sinusoidal. This hampers accurate analysis of the data to obtain engineering insight. The goal of the work presented in this paper is to develop and compare automated evolutionary computational techniques to filter test noise in the collection of data for the HMA complex modulus test. The results showed that the Covariance Matrix Adaptation-Evolutionary Strategy (CMA-ES) approach is computationally efficient for filtering data obtained from the HMA complex modulus test.

Keywords: HMA, dynamic modulus, GA, evolutionarycomputation.

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3001 Application of Genetic Algorithms for Evolution of Quantum Equivalents of Boolean Circuits

Authors: Swanti Satsangi, Ashish Gulati, Prem Kumar Kalra, C. Patvardhan

Abstract:

Due to the non- intuitive nature of Quantum algorithms, it becomes difficult for a classically trained person to efficiently construct new ones. So rather than designing new algorithms manually, lately, Genetic algorithms (GA) are being implemented for this purpose. GA is a technique to automatically solve a problem using principles of Darwinian evolution. This has been implemented to explore the possibility of evolving an n-qubit circuit when the circuit matrix has been provided using a set of single, two and three qubit gates. Using a variable length population and universal stochastic selection procedure, a number of possible solution circuits, with different number of gates can be obtained for the same input matrix during different runs of GA. The given algorithm has also been successfully implemented to obtain two and three qubit Boolean circuits using Quantum gates. The results demonstrate the effectiveness of the GA procedure even when the search spaces are large.

Keywords: Ancillas, Boolean functions, Genetic algorithm, Oracles, Quantum circuits, Scratch bit

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3000 Learning Monte Carlo Data for Circuit Path Length

Authors: Namal A. Senanayake, A. Beg, Withana C. Prasad

Abstract:

This paper analyzes the patterns of the Monte Carlo data for a large number of variables and minterms, in order to characterize the circuit path length behavior. We propose models that are determined by training process of shortest path length derived from a wide range of binary decision diagram (BDD) simulations. The creation of the model was done use of feed forward neural network (NN) modeling methodology. Experimental results for ISCAS benchmark circuits show an RMS error of 0.102 for the shortest path length complexity estimation predicted by the NN model (NNM). Use of such a model can help reduce the time complexity of very large scale integrated (VLSI) circuitries and related computer-aided design (CAD) tools that use BDDs.

Keywords: Monte Carlo data, Binary decision diagrams, Neural network modeling, Shortest path length estimation.

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2999 Investigation of Transmission Line Overvoltages and their Deduction Approach

Authors: A. Hayati Soloot, A. Gholami, E. Agheb, A. Ghorbandaeipour, P. Mokhtari

Abstract:

The two significant overvoltages in power system, switching overvoltage and lightning overvoltage, are investigated in this paper. Firstly, the effect of various power system parameters on Line Energization overvoltages is evaluated by simulation in ATP. The dominant parameters include line parameters; short-circuit impedance and circuit breaker parameters. Solutions to reduce switching overvoltages are reviewed and controlled closing using switchsync controllers is proposed as proper method. This paper also investigates lightning overvoltages in the overhead-cable transition. Simulations are performed in PSCAD/EMTDC. Surge arresters are applied in both ends of cable to fulfill the insulation coordination. The maximum amplitude of overvoltages inside the cable is surveyed which should be of great concerns in insulation coordination studies.

Keywords: Switching Overvoltage, Lightning Overvoltage, Insulation Coordination, ATP, PSCAD/EMTDC.

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