Matthias Kirmse and  Uwe Petersohn and  Elief Paffrath,  Application of Machine Learning Methods to Online Test Error Detection in Semiconductor Test.   journal   = {International Journal of Industrial and Manufacturing Engineering}, [online]. World Academy of Science, Engineering and Technology.
    September 2010, vol. 45(9). 908 - 914
    [viewed 16 October 2021]. Available from: https://publications.waset.org/pdf/8547.