Sae-Rom Pak and  Seung Hwan Park and  Jeong Ho Cho and  Daewoong An and Cheong-Sool Park and  Jun Seok Kim and  Jun-Geol Baek,  Yield Prediction Using Support Vectors Based Under-Sampling in Semiconductor Process.   journal   = {International Journal of Industrial and Manufacturing Engineering}, [online]. World Academy of Science, Engineering and Technology.
    December 2012, vol. 72(12). 2755 - 2759
    [viewed 26 April 2024]. Available from: https://publications.waset.org/pdf/5620.