A Performance Evaluation of Oscillation Based Test in Continuous Time Filters

Authors: Eduardo Romero, Marcelo Costamagna, Gabriela Peretti, Carlos Marqués

Abstract:

This work evaluates the ability of OBT for detecting parametric faults in continuous-time filters. To this end, we adopt two filters with quite different topologies as cases of study and a previously reported statistical fault model. In addition, we explore the behavior of the test schemes when a particular test condition is changed. The new data reported here, obtained from a fault simulation process, reveal a lower performance of OBT not observed in previous work using single-deviation faults, even under the change in the test condition.

Keywords: Testing, analog fault simulation, analog filter test, oscillation based test.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1337057

References:

[1] K. Arabi, K., and B. Kaminska, "Oscillation-Test Strategy for Analog and Mixed-Signal Integrated Circuits,” in Proc. of the 14th. VLSI Test Symposium, 1996, pp. 476-482.
[2] G. Huertas, D. Vázquez, E. Peralías, A. Rueda, and J. Huertas, " Practical Oscillation-Based Test of Integrated Filters,” IEEE Design &Test of Computers, vol. 19, pp. 64-72, Nov/Dec 2002.
[3] E. Romero, G. Peretti, G. Huertas, and D. Vázquez, "Test of Switched-Capacitor Ladder Filters Using OBT,” Microelectronics J., vol. 36, pp. 1073-1079, Dec. 2005.
[4] J. Catalano, G. Peretti, E. Romero, and C. Marqués, "Exploring the Ability of Oscillation Based Test for Testing Continuous-Time Ladder Filters”, in Proc. 2006 7th. Int. Symposium on Quality Electronic Design, pp. 543-550.
[5] P. Petrashin, G. Peretti, and E. Romero, "OBT Implementation on an OTA-C Band-Pass Filter,” in Proc. 2010 11th. Int. Symposium on Quality Electronic Design, pp. 271-276.
[6] K. Saab, N. Ben-Hamida, and B. Kaminska, "Parametric Fault Simulation and Test Vector Generation,” in Proc. Conf. on Design, Automation and Test in Europe, 2000, pp. 650-656.
[7] A. Khouas, and A. Derieux, "Fault Simulation for Analog Circuits under Parameter Variations,” J. Electron Test, vol. 16, pp. 269-278, June 2000.
[8] F. Liu and S. Ozev, "Statistical Test Development for Analog Circuits under High Process Variations,” IEEE Trans. Comput. Aided Des Integr. Circuits Syst., vol. 36, no.8, pp. 1465-1477, August 2007.
[9] S. Sunter, and N. Nagi, "Test metrics for Analog Parametric Faults”, in Proc. 17th. VLSI Test Symposium, 1999, pp. 226-234.
[10] A. Bounceur, S. Mir, E. Simeu, and L. Rolíndez, "Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing,” J. Electron Test, vol. 23, pp 471-484, Dec. 2007.
[11] A. Raghunathan, J. Chun, J. Abraham, and A. Chatterjee, "Quasi-Oscillation-Based Test for Improved Prediction of Analog Performance Parameters,” in Proc. Int. Test Conf., 2004, pp. 252-261.
[12] A. Chaehoi, Y. Bertrand, L. Latorre, P. Nouet, "Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric Faults,” in Proc. 4th IEEE Latin American Test Workshop, 2003, pp. 234-237.
[13] J. Gibson, Nonlinear Automatic Control. Japan: McGraw-Hill, 1963, pp. 431-436.
[14] G. Peretti, E. Romero, and C. Marqués, "Test of Nuclear Shapers Using Oscillation-Based Test," Latin American Applied Research, vol. 37, pp. 163-170, July 2007.
[15] B. Kaminska, K. Arabi, I. Bell, P. Goteti, J. Huertas, B. Kim, A. Rueda, and M. Soma, "Analog and Mixed-Signal Benchmark Circuits – first Release,” in Proc. of the Int. Test Conference, 1997, pp.183-190.
[16] A. Mitra, Fundamentals of Quality Control and Improvement. Upper Saddle River, NJ: Prentice Hall, 1998.