Search results for: Semiconductor Test Process
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 7918

Search results for: Semiconductor Test Process

7858 The Motivating and Demotivating Factors at the Learning of English Center in Thailand

Authors: Bella Llego

Abstract:

This study aims to investigate the motivating and de-motivating factors that affect the learning ability of students attending the English Learning Center in Thailand. The subjects of this research were 20 students from the Hana Semiconductor Co., Limited. The data were collected by using questionnaire and analyzed using the SPSS program for the percentage, mean and standard deviation. The research results show that the main motivating factor in learning English at Hana Semiconductor Co., Ltd. is that it would help the employees to communicate with foreign customers and managers. Other reasons include the need to read and write e-mails, and reports in English, as well as to increase overall general knowledge. The main de-motivating factor is that there is a lot of vocabulary to remember when learning English. Another de-motivating factor is that when homework is given, the students have no time to complete the tasks required of them at the end of the working day.

Keywords: Motivating, demotivating, English learning center, student communicate.

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7857 Optimization and Determination of Process Parameters in Thin Film SOI Photo-BJMOSFET

Authors: Hai-Qing Xie, Yun Zeng, Yong-Hong Yan, Guo-Liang Zhang, Tai-Hong Wang

Abstract:

We propose photo-BJMOSFET (Bipolar Junction Metal-Oxide-Semiconductor Field Effect Transistor) fabricated on SOI film. ITO film is adopted in the device as gate electrode to reduce light absorption. I-V characteristics of photo-BJMOSFET obtained in dark (dark current) and under 570nm illumination (photo current) are studied furthermore to achieve high photo-to-dark-current contrast ratio. Two variables in the calculation were the channel length and the thickness of the film which were set equal to six different values, i.e., L=2, 4, 6, 8, 10, and 12μm and three different values, i.e., dsi =100, 200 and 300nm, respectively. The results indicate that the greatest photo-to-dark-current contrast ratio is achieved with L=10μm and dsi=200 nm at VGK=0.6V.

Keywords: Photo-to-dark-current contrast ratio, Photo-current, Dark-current, Process parameter

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7856 Working Mode and Key Technology of Thermal Vacuum Test Software for Spacecraft Test

Authors: Zhang Lei, Zhan Haiyang, Gu Miao

Abstract:

A universal software platform is developed for improving the defects in the practical one. This software platform has distinct advantages in modularization, information management, and the interfaces. Several technologies such as computer technology, virtualization technology, network technology, etc. are combined together in this software platform, and four working modes are introduced in this article including single mode, distributed mode, cloud mode, and the centralized mode. The application area of the software platform is extended through the switch between these working modes. The software platform can arrange the thermal vacuum test process automatically. This function can improve the reliability of thermal vacuum test.

Keywords: Software platform, thermal vacuum test, control and measurement, work mode.

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7855 Structural Simulation of a 4H-Sic Based Optically Controlled Thyristor Using a GaAs Based Optically Triggered Power Transistor and Its Application to DC-DC Boost Converter

Authors: Srikanta Bose, S.K. Mazumder

Abstract:

In the present simulation work, an attempt is made to study the switching dynamics of an optically controlled 4HSiC thyristor power semiconductor device with the use of GaAs optically triggered power transistor. The half-cell thyristor has the forward breakdown of 200 V and reverse breakdown of more than 1000 V. The optically controlled thyristor has a rise time of 0.14 μs and fall time of 0.065 μs. The turn-on and turn-off delays are 0.1 μs and 0.06 μs, respectively. In addition, this optically controlled thyristor is used as a control switch for the DC-DC Boost converter. The pn-diode used for the converter has the forward drop of 2.8 V and reverse breakdown of around 400 V.

Keywords: 4H-SiC, Boost converter, Optical triggering, Power semiconductor device, thyristor.

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7854 Analysis of the Result for the Accelerated Life Cycle Test of the Motor for Washing Machine by Using Acceleration Factor

Authors: Youn-Sung Kim, Jin-Ho Jo, Mi-Sung Kim, Jae-Kun Lee

Abstract:

Accelerated life cycle test is applied to various products or components in order to reduce the time of life cycle test in industry. It must be considered for many test conditions according to the product characteristics for the test and the selection of acceleration parameter is especially very important. We have carried out the general life cycle test and the accelerated life cycle test by applying the acceleration factor (AF) considering the characteristics of brushless DC (BLDC) motor for washing machine. The final purpose of this study is to verify the validity by analyzing the results of the general life cycle test and the accelerated life cycle test. It will make it possible to reduce the life test time through the reasonable accelerated life cycle test.

Keywords: Accelerated life cycle test, reliability test, motor for washing machine, brushless dc motor test.

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7853 Optimization of HALO Structure Effects in 45nm p-type MOSFETs Device Using Taguchi Method

Authors: F. Salehuddin, I. Ahmad, F. A. Hamid, A. Zaharim, H. A. Elgomati, B. Y. Majlis, P. R. Apte

Abstract:

In this study, the Taguchi method was used to optimize the effect of HALO structure or halo implant variations on threshold voltage (VTH) and leakage current (ILeak) in 45nm p-type Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) device. Besides halo implant dose, the other process parameters which used were Source/Drain (S/D) implant dose, oxide growth temperature and silicide anneal temperature. This work was done using TCAD simulator, consisting of a process simulator, ATHENA and device simulator, ATLAS. These two simulators were combined with Taguchi method to aid in design and optimize the process parameters. In this research, the most effective process parameters with respect to VTH and ILeak are halo implant dose (40%) and S/D implant dose (52%) respectively. Whereas the second ranking factor affecting VTH and ILeak are oxide growth temperature (32%) and halo implant dose (34%) respectively. The results show that after optimizations approaches is -0.157V at ILeak=0.195mA/μm.

Keywords: Optimization, p-type MOSFETs device, HALO Structure, Taguchi Method.

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7852 An Investigation into the Effect of Water Quality on Flotation Performance

Authors: Edison Muzenda

Abstract:

A study was carried out to determine the effect of water quality on flotation performance. The experimental test work comprised of batch flotation tests using Denver lab cell for a period of 10 minutes. Nine different test runs were carried out in triplicates to ensure reproducibility using different water types from different thickener overflows, return and sewage effluent water (process water) and portable water. The water sources differed in pH, total dissolved solids, total suspended solids and conductivity. Process water was found to reduce the concentrate recovery and mass pull, while portable water increased the concentrate recovery and mass pull. Portable water reduced the concentrate grade while process water increased the concentrate grade. It is proposed that a combination of process water and portable water supply be used in flotation circuits to balance the different effects that the different water types have on the flotation efficiency.

Keywords: Flotation, mass pull, process water, thickeneroverflows, water quality.

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7851 Effect of Visual Speech in Sign Speech Synthesis

Authors: Zdenek Krnoul

Abstract:

This article investigates a contribution of synthesized visual speech. Synthesis of visual speech expressed by a computer consists in an animation in particular movements of lips. Visual speech is also necessary part of the non-manual component of a sign language. Appropriate methodology is proposed to determine the quality and the accuracy of synthesized visual speech. Proposed methodology is inspected on Czech speech. Hence, this article presents a procedure of recording of speech data in order to set a synthesis system as well as to evaluate synthesized speech. Furthermore, one option of the evaluation process is elaborated in the form of a perceptual test. This test procedure is verified on the measured data with two settings of the synthesis system. The results of the perceptual test are presented as a statistically significant increase of intelligibility evoked by real and synthesized visual speech. Now, the aim is to show one part of evaluation process which leads to more comprehensive evaluation of the sign speech synthesis system.

Keywords: Perception test, Sign speech synthesis, Talking head, Visual speech.

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7850 Equipment Design for Lunar Lander Landing-Impact Test

Authors: Xiaohuan Li, Wangmin Yi, Xinghui Wu

Abstract:

In order to verify the performance of lunar lander structure, landing-impact test is urgently needed. And the test equipment is necessary for the test. The functions and the key points of the equipment are presented to satisfy the requirements of the test, and the design scheme is proposed. The composition, the major function and the critical parts’ design of the equipment are introduced. By the load test of releasing device and single-beam hoist, and the compatibility test of landing-impact testing system, the rationality and reliability of the equipment is proved.

Keywords: Landing-impact test, lunar lander, releasing device, test equipment.

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7849 The Multi-objective Optimization for the SLS Process Parameters Based on Analytic Hierarchy Process

Authors: Yang Laixia, Deng Jun, Li Dichen, Bai Yang

Abstract:

The forming process parameters of Selective Laser Sintering(SLS) directly affect the forming efficiency and forming quality. Therefore, to determine reasonable process parameters is particularly important. In this paper, the weight of each target of the forming quality and efficiency is firstly calculated with the Analytic Hierarchy Process. And then the size of each target is measured by orthogonal experiment. Finally, the sum of the product of each target with the weight is compared to the process parameters in each group and obtained the optimal molding process parameters.

Keywords: Analytic Hierarchy Process, Multi-objective optimization, Orthogonal test, Selective Laser Sintering

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7848 Saturated Gain of Doped Multilayer Quantum Dot Semiconductor Optical Amplifiers

Authors: Omar Qasaimeh

Abstract:

The effect of the number of quantum dot (QD) layers on the saturated gain of doped QD semiconductor optical amplifiers (SOAs) has been studied using multi-population coupled rate equations. The developed model takes into account the effect of carrier coupling between adjacent layers. It has been found that increasing the number of QD layers (K) increases the unsaturated optical gain for K<8 and approximately has no effect on the unsaturated gain for K ≥ 8. Our analysis shows that the optimum ptype concentration that maximizes the unsaturated optical gain of the ground state is NA Ôëê 0.75 ×1018cm-3 . On the other hand, it has been found that the saturated optical gain for both the ground state and the excited state are strong function of both the doping concentration and K where we find that it is required to dope the dots with n-type concentration for very large K at high photon energy.

Keywords: doping, multilayer, quantum dot optical amplifier, saturated gain.

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7847 Loss Analysis of Half Bridge DC-DC Converters in High-Current and Low-Voltage Applications

Authors: A. Faruk Bakan, İsmail Aksoy, Nihan Altintaş

Abstract:

In this paper, half bridge DC-DC converters with transformer isolation presented in the literature are analyzed for highcurrent and low-voltage applications under the same operation conditions, and compared in terms of losses and efficiency. The conventional and improved half-bridge DC-DC converters are simulated, and current and voltage waveforms are obtained for input voltage Vdc=500V, output current IO=450A, output voltage VO=38V and switching frequency fS=20kHz. IGBTs are used as power semiconductor switches. The power losses of the semiconductor devices are calculated from current and voltage waveforms. From simulation results, it is seen that the capacitor switched half bridge converter has the best efficiency value, and can be preferred at high power and high frequency applications.

Keywords: Isolated half bridge DC-DC converter, high-current low-voltage applications, soft switching, high efficiency.

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7846 Development of Quasi-Two-Dimensional Nb2O5 for Functional Electrodes of Advanced Electrochemical Systems

Authors: S. Zhuiykov, E. Kats

Abstract:

In recent times there has been a growing interest in the development of quasi-two-dimensional niobium pentoxide (Nb2O5) as a semiconductor for the potential electronic applications such as capacitors, filtration, dye-sensitised solar cells and gas sensing platforms. Therefore once the purpose is established, Nb2O5 can be prepared in a number of nano- and sub-micron-structural morphologies that include rods, wires, belts and tubes. In this study films of Nb2O5 were prepared on gold plated silicon substrate using spin-coating technique and subsequently by mechanical exfoliation. The reason this method was employed was to achieve layers of less than 15nm in thickness. The sintering temperature of the specimen was 800oC. The morphology and structural characteristics of the films were analyzed by Atomic Force Microscopy (AFM), Raman Spectroscopy, X-ray Photoelectron Spectroscopy (XPS).

Keywords: Mechanical exfoliation, niobium pentoxide, quazitwo- dimensional, semiconductor, sol-gel, spin-coating, two dimensional semiconductors.

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7845 Bayesian Belief Networks for Test Driven Development

Authors: Vijayalakshmy Periaswamy S., Kevin McDaid

Abstract:

Testing accounts for the major percentage of technical contribution in the software development process. Typically, it consumes more than 50 percent of the total cost of developing a piece of software. The selection of software tests is a very important activity within this process to ensure the software reliability requirements are met. Generally tests are run to achieve maximum coverage of the software code and very little attention is given to the achieved reliability of the software. Using an existing methodology, this paper describes how to use Bayesian Belief Networks (BBNs) to select unit tests based on their contribution to the reliability of the module under consideration. In particular the work examines how the approach can enhance test-first development by assessing the quality of test suites resulting from this development methodology and providing insight into additional tests that can significantly reduce the achieved reliability. In this way the method can produce an optimal selection of inputs and the order in which the tests are executed to maximize the software reliability. To illustrate this approach, a belief network is constructed for a modern software system incorporating the expert opinion, expressed through probabilities of the relative quality of the elements of the software, and the potential effectiveness of the software tests. The steps involved in constructing the Bayesian Network are explained as is a method to allow for the test suite resulting from test-driven development.

Keywords: Software testing, Test Driven Development, Bayesian Belief Networks.

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7844 An Exploration on Competency-Based Curricula in Integrated Circuit Design

Authors: Chih Chin Yang, Chung Shan Sun

Abstract:

In this paper the relationships between professional competences and school curriculain IC design industry are explored. The semi-structured questionnaire survey and focus group interview is the research method. Study participants are graduates of microelectronics engineering professional departments who are currently employed in the IC industry. The IC industries are defined as the electronic component manufacturing industry and optical-electronic component manufacturing industry in the semiconductor industry and optical-electronic material devices, respectively. Study participants selected from IC design industry include IC engineering and electronic & semiconductor engineering. The human training with IC design professional competence in microelectronics engineering professional departments is explored in this research. IC professional competences of human resources in the IC design industry include general intelligence and professional intelligence.

Keywords: IC design, curricula, competence, task, duty.

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7843 Testing Loaded Programs Using Fault Injection Technique

Authors: S. Manaseer, F. A. Masooud, A. A. Sharieh

Abstract:

Fault tolerance is critical in many of today's large computer systems. This paper focuses on improving fault tolerance through testing. Moreover, it concentrates on the memory faults: how to access the editable part of a process memory space and how this part is affected. A special Software Fault Injection Technique (SFIT) is proposed for this purpose. This is done by sequentially scanning the memory of the target process, and trying to edit maximum number of bytes inside that memory. The technique was implemented and tested on a group of programs in software packages such as jet-audio, Notepad, Microsoft Word, Microsoft Excel, and Microsoft Outlook. The results from the test sample process indicate that the size of the scanned area depends on several factors. These factors are: process size, process type, and virtual memory size of the machine under test. The results show that increasing the process size will increase the scanned memory space. They also show that input-output processes have more scanned area size than other processes. Increasing the virtual memory size will also affect the size of the scanned area but to a certain limit.

Keywords: Complex software systems, Error detection, Fault tolerance, Injection and testing methodology, Memory faults, Process and virtual memory.

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7842 How Valid Are Our Language Test Interpretations? A Demonstrative Example

Authors: Masoud Saeedi, Shirin Rahimi Kazerooni, Vahid Parvaresh

Abstract:

Validity is an overriding consideration in language testing. If a test score is intended for a particular purpose, this must be supported through empirical evidence. This article addresses the validity of a multiple-choice achievement test (MCT). The test is administered at the end of each semester to decide about students' mastery of a course in general English. To provide empirical evidence pertaining to the validity of this test, two criterion measures were used. In so doing, a Cloze test and a C-test which are reported to gauge general English proficiency were utilized. The results of analyses show that there is a statistically significant correlation among participants' scores on the MCT, Cloze, and Ctest. Drawing on the findings of the study, it can be cautiously deduced that these tests measure the same underlying trait. However, allowing for the limitations of using criterion measures to validate tests, we cannot make any absolute claim as to the validity of this MCT test.

Keywords: C-test, cloze test, multiple-choice test, validity argument.

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7841 VaR Forecasting in Times of Increased Volatility

Authors: Ivo Jánský, Milan Rippel

Abstract:

The paper evaluates several hundred one-day-ahead VaR forecasting models in the time period between the years 2004 and 2009 on data from six world stock indices - DJI, GSPC, IXIC, FTSE, GDAXI and N225. The models model mean using the ARMA processes with up to two lags and variance with one of GARCH, EGARCH or TARCH processes with up to two lags. The models are estimated on the data from the in-sample period and their forecasting accuracy is evaluated on the out-of-sample data, which are more volatile. The main aim of the paper is to test whether a model estimated on data with lower volatility can be used in periods with higher volatility. The evaluation is based on the conditional coverage test and is performed on each stock index separately. The primary result of the paper is that the volatility is best modelled using a GARCH process and that an ARMA process pattern cannot be found in analyzed time series.

Keywords: VaR, risk analysis, conditional volatility, garch, egarch, tarch, moving average process, autoregressive process

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7840 Prioritization of Mutation Test Generation with Centrality Measure

Authors: Supachai Supmak, Yachai Limpiyakorn

Abstract:

Mutation testing can be applied for the quality assessment of test cases. Prioritization of mutation test generation has been a critical element of the industry practice that would contribute to the evaluation of test cases. The industry generally delivers the product under the condition of time to the market and thus, inevitably sacrifices software testing tasks, even though many test cases are required for software verification. This paper presents an approach of applying a social network centrality measure, PageRank, to prioritize mutation test generation. The source code with the highest values of PageRank, will be focused first when developing their test cases as these modules are vulnerable for defects or anomalies which may cause the consequent defects in many other associated modules. Moreover, the approach would help identify the reducible test cases in the test suite, still maintaining the same criteria as the original number of test cases.

Keywords: Software testing, mutation test, network centrality measure, test case prioritization.

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7839 Modelling the Behavior of Commercial and Test Textiles against Laundering Process by Statistical Assessment of Their Performance

Authors: M. H. Arslan, U. K. Sahin, H. Acikgoz-Tufan, I. Gocek, I. Erdem

Abstract:

Various exterior factors have perpetual effects on textile materials during wear, use and laundering in everyday life. In accordance with their frequency of use, textile materials are required to be laundered at certain intervals. The medium in which the laundering process takes place have inevitable detrimental physical and chemical effects on textile materials caused by the unique parameters of the process inherently existing. Connatural structures of various textile materials result in many different physical, chemical and mechanical characteristics. Because of their specific structures, these materials have different behaviors against several exterior factors. By modeling the behavior of commercial and test textiles as group-wise against laundering process, it is possible to disclose the relation in between these two groups of materials, which will lead to better understanding of their behaviors in terms of similarities and differences against the washing parameters of the laundering. Thus, the goal of the current research is to examine the behavior of two groups of textile materials as commercial textiles and as test textiles towards the main washing machine parameters during laundering process such as temperature, load quantity, mechanical action and level of water amount by concentrating on shrinkage, pilling, sewing defects, collar abrasion, the other defects other than sewing, whitening and overall properties of textiles. In this study, cotton fabrics were preferred as commercial textiles due to the fact that garments made of cotton are the most demanded products in the market by the textile consumers in daily life. Full factorial experimental set-up was used to design the experimental procedure. All profiles always including all of the commercial and the test textiles were laundered for 20 cycles by commercial home laundering machine to investigate the effects of the chosen parameters. For the laundering process, a modified version of ‘‘IEC 60456 Test Method’’ was utilized. The amount of detergent was altered as 0.5% gram per liter depending on varying load quantity levels. Datacolor 650®, EMPA Photographic Standards for Pilling Test and visual examination were utilized to test and characterize the textiles. Furthermore, in the current study the relation in between commercial and test textiles in terms of their performance was deeply investigated by the help of statistical analysis performed by MINITAB® package program modeling their behavior against the parameters of the laundering process. In the experimental work, the behaviors of both groups of textiles towards washing machine parameters were visually and quantitatively assessed in dry state.

Keywords: Behavior against washing machine parameters, performance evaluation of textiles, statistical analysis, commercial and test textiles.

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7838 A Pattern Language for Software Debugging

Authors: Mehdi Amoui, Mohammad Zarafshan, Caro Lucas

Abstract:

In spite of all advancement in software testing, debugging remains a labor-intensive, manual, time consuming, and error prone process. A candidate solution to enhance debugging process is to fuse it with testing process. To achieve this integration, a possible solution may be categorizing common software tests and errors followed by the effort on fixing the errors through general solutions for each test/error pair. Our approach to address this issue is based on Christopher Alexander-s pattern and pattern language concepts. The patterns in this language are grouped into three major sections and connect the three concepts of test, error, and debug. These patterns and their hierarchical relationship shape a pattern language that introduces a solution to solve software errors in a known testing context. Finally, we will introduce our developed framework ADE as a sample implementation to support a pattern of proposed language, which aims to automate the whole process of evolving software design via evolutionary methods.

Keywords: Coding Errors, Software debugging, Testing, Patterns, Pattern Language

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7837 Statistically Significant Differences of Carbon Dioxide and Carbon Monoxide Emission in Photocopying Process

Authors: Kiurski S. Jelena, Kecić S. Vesna, Oros B. Ivana

Abstract:

Experimental results confirmed the temporal variation of carbon dioxide and carbon monoxide concentration during the working shift of the photocopying process in a small photocopying shop in Novi Sad, Serbia. The statistically significant differences of target gases were examined with two-way analysis of variance without replication followed by Scheffe's post hoc test. The existence of statistically significant differences was obtained for carbon monoxide emission which is pointed out with F-values (12.37 and 31.88) greater than Fcrit (6.94) in contrary to carbon dioxide emission (F-values of 1.23 and 3.12 were less than Fcrit).  Scheffe's post hoc test indicated that sampling point A (near the photocopier machine) and second time interval contribute the most on carbon monoxide emission.

Keywords: Analysis of variance, carbon dioxide, carbon monoxide, photocopying indoor, Scheffe's test

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7836 A Development of Online Lessons to Strengthen the Learning Process of Master's Degree Students Majoring in Curriculum and Instruction at Suan Sunandha Rajabhat University

Authors: Chaiwat Waree

Abstract:

The purposes of the research were to develop online lessons to strengthen the learning process of Master's degree students majoring in Curriculum and Instruction at Suan Sunandha Rajabhat University; to achieve the efficiency criteria of 80/80; and to study the satisfaction of students who use online lessons to strengthen the learning process of Master’s degree students majoring in Curriculum and Instruction at Suan Sunandha Rajabhat University. The sample consisted of 40 university students studying in semester 1, academic year 2012. The sample was determined by Purposive Sampling. Selected students were from the class which the researcher was the homeroom tutor. The tutor was responsible for the teaching of learning process. Tools used in the study were online lessons, 60-point performance test, and evaluation test of satisfaction of students on online lessons. Data analysis yielded the following results; 83.66/88.29 efficiency of online lessons measured against the criteria; the comparison of performance before and after taking online lessons using t-test yielded 29.67. The statistical significance was at 0.05; the average satisfaction level of forty students on online lessons was 4.46 with standard deviation of 0.68.

Keywords: Online Lessons, Curriculum and Instruction.

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7835 Software Test Data Generation using Ant Colony Optimization

Authors: Huaizhong Li, C.Peng Lam

Abstract:

State-based testing is frequently used in software testing. Test data generation is one of the key issues in software testing. A properly generated test suite may not only locate the errors in a software system, but also help in reducing the high cost associated with software testing. It is often desired that test data in the form of test sequences within a test suite can be automatically generated to achieve required test coverage. This paper proposes an Ant Colony Optimization approach to test data generation for the state-based software testing.

Keywords: Software testing, ant colony optimization, UML.

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7834 Data Acquisition System for Automotive Testing According to the European Directive 2004/104/EC

Authors: Herminio Martínez-García, Juan Gámiz, Yolanda Bolea, Antoni Grau

Abstract:

This article presents an interactive system for data acquisition in vehicle testing according to the test process defined in automotive directive 2004/104/EC. The project has been designed and developed by authors for the Spanish company Applus-LGAI. The developed project will result in a new process, which will involve the creation of braking cycle test defined in the aforementioned automotive directive. It will also allow the analysis of new vehicle features that was not feasible, allowing an increasing interaction with the vehicle. Potential users of this system in the short term will be vehicle manufacturers and in a medium term the system can be extended to testing other automotive components and EMC tests.

Keywords: Automotive process, data acquisition system, electromagnetic compatibility (EMC) testing, European Directive 2004/104/EC.

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7833 Research on Pressed Pile Test and Finite Element Analysis of Large-diameter Steel Pipe Pile of Zhanjiang Port

Authors: Ran Zhao, Zhi-liang Dong, You-yuan Wang, Lin-wang Su

Abstract:

In order to study pressed pile test and ultimate bearing capacity character of large-diameter steel pipe pile, based on two high-piled wharfs of Zhanjiang Port, pressed pile test and numerical simulation of three large-diameter steel pipe piles are analyzed in this paper. Anchored pile method is used to pressed pile test, and the curves of Q-s and ultimate bearing capacity are attained. Then the three piles are numerically simulated by ABAQUS, and results of numerical simulation and those of field test are comparatively analyzed. The results show that settlement value of numerical simulation is larger than that of field test in the process of loading, the difference value is widening with the increasing of load, and the ultimate difference value of settlement is 20% to 30%.

Keywords: Large-diameter steel pipe pile, field test, finite element analysis, comparative analysis.

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7832 Tests for Gaussianity of a Stationary Time Series

Authors: Adnan Al-Smadi

Abstract:

One of the primary uses of higher order statistics in signal processing has been for detecting and estimation of non- Gaussian signals in Gaussian noise of unknown covariance. This is motivated by the ability of higher order statistics to suppress additive Gaussian noise. In this paper, several methods to test for non- Gaussianity of a given process are presented. These methods include histogram plot, kurtosis test, and hypothesis testing using cumulants and bispectrum of the available sequence. The hypothesis testing is performed by constructing a statistic to test whether the bispectrum of the given signal is non-zero. A zero bispectrum is not a proof of Gaussianity. Hence, other tests such as the kurtosis test should be employed. Examples are given to demonstrate the performance of the presented methods.

Keywords: Non-Gaussian, bispectrum, kurtosis, hypothesistesting, histogram.

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7831 Note on the Necessity of the Patch Test

Authors: Rado Flajs, Miran Saje

Abstract:

We present a simple nonconforming approximation of the linear two–point boundary value problem which violates patch test requirements. Nevertheless the solutions, obtained from these type of approximations, converge to the exact solution.

Keywords: Generalized patch test, Irons' patch test, nonconforming finite element, convergence.

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7830 Survey to Assess the Feasibility of Executing the Web-Based Collaboration Process Using WBCS

Authors: Mohamed A. Sullabi

Abstract:

The importance of the formal specification in the software life cycle is barely concealing to anyone. Formal specifications use mathematical notation to describe the properties of information system precisely, without unduly constraining the way in how these properties are achieved. Having a correct and quality software specification is not easy task. This study concerns with how a group of rectifiers can communicate with each other and work to prepare and produce a correct formal software specification. WBCS has been implemented based mainly in the proposed supported cooperative work model and a survey conducted on the existing Webbased collaborative writing tools. This paper aims to assess the feasibility of executing the web-based collaboration process using WBCS. The purpose of conducting this test is to test the system as a whole for functionality and fitness for use based on the evaluation test plan.

Keywords: Formal methods, Formal specifications, collaborative writing, Usability testing.

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7829 Influence of Measurement System on Negative Bias Temperature Instability Characterization: Fast BTI vs Conventional BTI vs Fast Wafer Level Reliability

Authors: Vincent King Soon Wong, Hong Seng Ng, Florinna Sim

Abstract:

Negative Bias Temperature Instability (NBTI) is one of the critical degradation mechanisms in semiconductor device reliability that causes shift in the threshold voltage (Vth). However, thorough understanding of this reliability failure mechanism is still unachievable due to a recovery characteristic known as NBTI recovery. This paper will demonstrate the severity of NBTI recovery as well as one of the effective methods used to mitigate, which is the minimization of measurement system delays. Comparison was done in between two measurement systems that have significant differences in measurement delays to show how NBTI recovery causes result deviations and how fast measurement systems can mitigate NBTI recovery. Another method to minimize NBTI recovery without the influence of measurement system known as Fast Wafer Level Reliability (FWLR) NBTI was also done to be used as reference.

Keywords: Fast vs slow BTI, Fast wafer level reliability, Negative bias temperature instability, NBTI measurement system, metal-oxide-semiconductor field-effect transistor, MOSFET, NBTI recovery, reliability.

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