WASET
    Vincent King Soon Wong and  Hong Seng Ng and  Florinna Sim,  Influence of Measurement System on Negative Bias Temperature Instability Characterization: Fast BTI vs Conventional BTI vs Fast Wafer Level Reliability.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    January 2016, vol. 120(12). 1484 - 1487
    [viewed 19 April 2024]. Available from: https://publications.waset.org/pdf/10006294.