Search results for: optical surface metrology

Authors: Özgür Tan

Abstract:

In different fields of industry, there is a huge demand to acquire surface information in the dimension of micrometer up to centimeter in order to characterize functional behavior of products. Thanks to the latest developments, there are now different methods in surface metrology, but it is not possible to find a unique measurement technique which fulfils all the requirements. Depending on the interaction with the surface, regardless of optical or tactile, every method has its own advantages and disadvantages which are given by nature. However new concepts like ‘multi-sensor’, tools in surface metrology can be improved to solve most of the requirements simultaneously. In this paper, after having presented different optical techniques like confocal microscopy, focus variation and white light interferometry, a new approach is presented which combines white-light interferometry with chromatic confocal probing in a single product. Advantages of different techniques can be used for challenging applications.

Keywords: flatness, chromatic confocal, optical surface metrology, roughness, white-light interferometry

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Authors: A. Manallah, C. Meier

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Confocal spectral interferometry (CSI) is an innovative optical method for determining microtopography of surfaces and thickness of transparent layers, based on the combination of two optical principles: confocal imaging, and spectral interferometry. Confocal optical system images at each instant a single point of the sample. The whole surface is reconstructed by plan scanning. The interference signal generated by mixing two white-light beams is analyzed using a spectrometer. In this work, five ‘rugotests’ of known standard roughnesses are investigated. The topography is then measured and illustrated, and the equivalent roughness is determined and compared with the standard values.

Keywords: confocal spectral interferometry, nondestructive testing, optical metrology, surface topography, roughness

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Authors: Khavieya Anandhan, Soundarapandian Santhanakrishnan, Vijayaraghavan Laxmanan

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In general, measurement of surfaces is carried out by using traditional methods such as contact type stylus instruments. This prevalent approach is challenged by using non-contact instruments such as optical profiler, co-ordinate measuring machine, laser triangulation sensors, machine vision system, etc. Recently, confocal sensor is trying to be used in the surface metrology field. This sensor, such as a confocal sensor, is explored in this study to determine the surface roughness value for various turned surfaces. Turning is a crucial machining process to manufacture products such as grooves, tapered domes, threads, tapers, etc. The roughness value of turned surfaces are in the range of range 0.4-12.5 µm, were taken for analysis. Three instruments were used, namely, perthometer, optical profiler, and confocal sensor. Among these, in fact, a confocal sensor is least explored, despite its good resolution about 5 nm. Thus, such a high-precision sensor was used in this study to explore the possibility of measuring turned surfaces. Further, using this data, measurement uncertainty was also studied.

Keywords: confocal sensor, optical profiler, surface roughness, turned surfaces

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Authors: Uchenna Sydney Mbamara, Bolu Olofinjana, Ezekiel Oladele B. Ajayi

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Elaborate surface metrology of undoped ZnO thin films, deposited by organometallic chemical vapour deposition (OMCVD) technique at different precursor flow rates, was carried out. Dicarbomethyl-zinc precursor was used. The films were deposited on AISI304L steel and soda-lime glass substrates. Ultraviolet-visible-near-infrared (UV-Vis-NIR) spectroscopy showed that all the thin films were over 80% transparent, with an average bandgap of 3.39 eV, X-ray diffraction (XRD) results showed that the thin films were crystalline with a hexagonal structure, while Rutherford backscattering spectroscopy (RBS) results identified the elements present in each thin film as zinc and oxygen in the ratio of 1:1. Microscope and contactless profilometer results gave images with characteristic colours. The profilometer also gave the surface roughness data in both 2D and 3D. The asperity distribution of the thin film surfaces was Gaussian, while the average fractal dimension Da was in the range of 2.5 ≤ Da. The metrology proved the surfaces good for ‘touch electronics’ and coating mechanical parts for low friction.

Keywords: undoped ZnO, precursor flow rate, OMCVD, thin films, surface texture, tribology

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Authors: Alberto Mínguez-Martínez, Jesús de Vicente y Oliva

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Modern manufacturing processes have led to the miniaturization of systems and, as a result, parts at the micro-and nanoscale are produced. This trend seems to become increasingly important in the near future. Besides, as a requirement of Industry 4.0, the digitalization of the models of production and processes makes it very important to ensure that the dimensions of newly manufactured parts meet the specifications of the models. Therefore, it is possible to reduce the scrap and the cost of non-conformities, ensuring the stability of the production at the same time. To ensure the quality of manufactured parts, it becomes necessary to carry out traceable measurements at scales lower than one millimeter. Providing adequate traceability to the SI unit of length (the meter) to 2D and 3D measurements at this scale is a problem that does not have a unique solution in industrial environments. Researchers in the field of dimensional metrology all around the world are working on this issue. A solution for industrial environments, even if it is not complete, will enable working with some traceability. At this point, we believe that the study of the surfaces could provide us with a first approximation to a solution. Among the different options proposed in the literature, the areal topography methods may be the most relevant because they could be compared to those measurements performed using Coordinate Measuring Machines (CMM’s). These measuring methods give (x, y, z) coordinates for each point, expressing it in two different ways, either expressing the z coordinate as a function of x, denoting it as z(x), for each Y-axis coordinate, or as a function of the x and y coordinates, denoting it as z (x, y). Between others, optical measuring instruments, mainly microscopes, are extensively used to carry out measurements at scales lower than one millimeter because it is a non-destructive measuring method. In this paper, the authors propose a calibration procedure for the scales of optical measuring instruments, particularizing for a confocal microscope, using material standards easy to find and calibrate in metrology and quality laboratories in industrial environments. Confocal microscopes are measuring instruments capable of filtering the out-of-focus reflected light so that when it reaches the detector, it is possible to take pictures of the part of the surface that is focused. Varying and taking pictures at different Z levels of the focus, a specialized software interpolates between the different planes, and it could reconstruct the surface geometry into a 3D model. As it is easy to deduce, it is necessary to give traceability to each axis. As a complementary result, the roughness Ra parameter will be traced to the reference. Although the solution is designed for a confocal microscope, it may be used for the calibration of other optical measuring instruments by applying minor changes.

Keywords: industrial environment, confocal microscope, optical measuring instrument, traceability

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Authors: Dahi Ghareab Abdelsalam Ibrahim

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Scanning interferometry is commonly used for measuring the three-dimensional profiling of surfaces. Here, we used a scanning stage calibrated with standard gauge blocks to measure a standard step height of 200μm. The stage measures precisely the envelope of interference at the platen and at the surface of the step height. From the difference between the two envelopes, we measured the step height of the sample. Experimental measurements show that the measured value matches well with the nominal value of the step height. A light beam of 532nm from a Tungsten Lamp is collimated and incident on the interferometer. By scanning, two envelopes were produced. The envelope at the platen surface and the envelope at the object surface were determined precisely by a written program code, and then the difference between them was measured from the calibrated scanning stage. The difference was estimated to be in the range of 198 ± 2 μm.

Keywords: optical metrology, digital holography, interferometry, phase unwrapping

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Authors: Aliouane Toufik, Hamdi Amine, Bouzid Djamel

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Aspheric optical components are an alternative to the use of conventional lenses in the implementation of imaging systems for the visible range. Spherical lenses are capable of producing aberrations. Therefore, they are not able to focus all the light into a single point. Instead, aspherical lenses correct aberrations and provide better resolution even with compact lenses incorporating a small number of lenses. Metrology of these components is very difficult especially when the resolution requirements increase and insufficient or complexity of conventional tools requires the development of specific approaches to characterization. This work is part of the problem existed because the objectives are the study and comparison of different methods used to measure surface rays hybrid aspherical lenses.

Keywords: manufacture of lenses, aspherical surface, precision molding, radius of curvature, roughness

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Authors: Abhinav Srivastava, Hima Harode, Chandan Kumar Saha

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The principal ingredient of an optical fiber is quartz glass. The quality of the optical fiber decreases if impure foreign substances are attached to its preform surface. If residual strain inside a preform is significant, it cracks with a small impact during drawing or transporting. Furthermore, damages and unevenness on the surface of an optical fiber base material break the fiber during drawing. The present work signifies that chlorine pre-treatment enhances mechanical properties of the optical fiber glass. FTIR (Fourier-Transform Infrared Spectroscopy) results show that chlorine gas chemically modifies the structure of silica clad; chlorine is known to soften glass. Metallic impurities on the preform surface likely formed volatile metal chlorides due to chlorine pretreatment at elevated temperature. The chlorine also acts as a drying agent, and therefore the preform surface is anticipated to be water deficient and supposedly avoids particle adhesion on the glass surface. The Weibull analysis of long length tensile strength demarcates a substantial shift in its knee. The higher dynamic fatigue n-value also indicated surface crack healing.

Keywords: mechanical strength, optical fiber glass, FTIR, Weibull analysis

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Authors: Salam Nazhan Ahmed

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Influence of variable polarization angle (θp) of optical feedback on the Relative Intensity Noise (RIN) of a Vertical-Cavity Surface-Emitting Laser (VCSEL) has been experimentally investigated. The RIN is a minimum at θp = 0° for the dominant polarization mode (XP), and at θp = 90° for the suppressed polarization mode (YP) of VCSEL. Furthermore, the RIN of the XP mode increases rapidly with increasing θp, while for the YP mode, it increases slightly to θp = 45° and decreases for angles greater than 45°.

Keywords: lasers, vertical-cavity surface-emitting lasers, optical switching, optical polarization feedback, relative intensity noise

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Authors: Osama Terra, Mariesa Nel, Hatem Hussein

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Calibration of Optical Time Domain Reflectometer (OTDR) has a crucial role for the accurate determination of fault locations and the accurate calculation of loss budget of long-haul optical fibre links during installation and repair. A comparison has been made between the Egyptian National Institute for Standards (NIS-Egypt) and the National Metrology institute of South Africa (NMISA-South Africa) for the calibration of an OTDR. The distance and the attenuation scales of a transfer OTDR have been calibrated by both institutes using their standards according to the standard IEC 61746-1 (2009). The results of this comparison have been compiled in this report.

Keywords: OTDR calibration, recirculating loop, concatenated method, standard fiber

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Authors: E. Cesarini, M. Lorenzini, R. Cardarelli, S. Chao, E. Coccia, V. Fafone, Y. Minenkow, I. Nardecchia, I. M. Pinto, A. Rocchi, V. Sequino, C. Taranto

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Structural relaxation processes in optical coatings represent a fundamental limit to the sensitivity of gravitational waves detectors, MEMS, optical metrology and entangled state experiments. To face this problem, many research lines are now active, in particular the characterization of new materials and novel solutions to be employed as coatings in future gravitational wave detectors. Nano-layered coating deposition is among the most promising techniques. We report on the measurement of acoustic loss of nm-layered composites (Ti₂O/SiO₂), performed with the GeNS nodal suspension, compared with sputtered λ/4 thin films nowadays employed.

Keywords: mechanical measurement, nanomaterials, optical coating, thermal noise

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Authors: Belkacem Laimouche

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With the field of artificial intelligence (AI) experiencing exponential growth, fueled by technological advancements that pave the way for increasingly innovative and promising applications, there is an escalating need to develop rigorous methods for assessing their performance in pursuit of transparency and equity. This article proposes a metrology-inspired statistical framework for evaluating bias and explainability in AI systems. Drawing from the principles of metrology, we propose a pioneering approach, using a concrete example, to evaluate the accuracy and precision of AI models, as well as to quantify the sources of measurement uncertainty that can lead to bias in their predictions. Furthermore, we explore a statistical approach for evaluating the explainability of AI systems based on their ability to provide interpretable and transparent explanations of their predictions.

Keywords: artificial intelligence, metrology, measurement uncertainty, prediction error, bias, machine learning algorithms, probabilistic models, interlaboratory comparison, data analysis, data reliability, measurement of bias impact on predictions, improvement of model accuracy and reliability

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Authors: A. Bouloufa, F. Khaled, K. Djessas

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This paper presents a new structure of solar cell based on p-type microcrystalline silicon as an absorber and n-type aluminum doped zinc oxide (ZnO:Al) transparent conductive oxide as an optical window. The ZnO:Al layer deposited by rf-magnetron sputtering at room temperature yields a low resistivity about 7,64.10-2Ω.cm and more than 85% mean optical transmittance in the VIS–NIR range, with an optical band gap of 3.3 eV. These excellent optical properties of this layer in combination with an optimal contact at the front surface result in a superior light trapping yielding to efficiencies about 20%. In order to improve efficiency, we have used a p+-µc-Si thin layer highly doped as a back surface field which minimizes significantly the impact of rear surface recombination velocity on voltage and current leading to a high efficiency of 24%. Optoelectronic parameters were determined using the current density-voltage (J-V) curve by means of a numerical simulation with Analysis of Microelectronic and Photonic Structures (AMPS-1D) device simulator.

Keywords: optical window, thin film, solar cell, efficiency

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Authors: Monica M. Marcos

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In the framework of Archaeological Research, Heritage Conservation and Restoration, the object of study is metrology applied in composition of religious architecture in ancient Egypt, and usefulness in Archaology. The objective is the determination of the geometric and metrological relations in architectural models and the module used in the initial project of the buildings. The study and data collection of religious buildings, tombs and temples of the ancient Egypt, is completed with plans. The measurements systematization and buildings modulation makes possible to establish common compositional parameters, with a module determined by the measurement unit used. The measurement system corresponding to the main period of egyptian history, was the Egyptian royal cubit. The analysis of units measurements, used in architectural design, provides exact numbers on buildable spaces dimensions. It allows establishing proportional relationships between them, and finding a geometric composition module, on which the original project was based. This responds to a philosophical and functional concept of projected spaces. In the heritage rehabilitation and restoration field, knowledge of metrology helps in excavation, reconstruction and restoration of construction elements. The correct use of metrology contributes to the identification of possible work areas, helping to locate where the damaged or missing areas are. Also in restoration projects, metrology is useful for reordering and locating decontextualized parts of buildings. The conversion of measurements taken in the current International System to the ancient egyptian measurements, allows understand its conceptual purpose and its functionality, which makes easier to carry out archaeological intervention. In the work carried out in archaeological excavations, metrology is an essential tool for locating sites and establishing work zones.

Keywords: egyptology, metrology, archaeology, measurements, Egyptian cubit

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Authors: Guram Adamashvili

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Surface plasmon polariton is a surface optical wave which undergoes a strong enhancement and spatial confinement of its wave amplitude near an interface of two-dimensional layered structures. Phosphorene (single-layer black phosphorus) and other two-dimensional anisotropic phosphorene-like materials are recognized as promising materials for potential future applications of surface plasmon polariton. A theory of an optical breather of self-induced transparency for surface plasmon polariton propagating in monolayer or few-layer phosphorene is developed. A theory of an optical soliton of self-induced transparency for surface plasmon polariton propagating in monolayer or few-layer phosphorene have been investigated earlier Starting from the optical nonlinear wave equation for surface TM-modes interacting with a two-dimensional layer of atomic systems or semiconductor quantum dots and a phosphorene monolayer (or other two-dimensional anisotropic material), we have obtained the evolution equations for the electric field of the breather. In this case, one finds that the evolution of these pulses become described by the damped Bloch-Maxwell equations. For surface plasmon polariton fields, breathers are found to occur. Explicit relations of the dependence of breathers on the local media, phosphorene anisotropic conductivity, transition layer properties and transverse structures of the SPP, are obtained and will be given. It is shown that the phosphorene conductivity reduces exponentially the amplitude of the surface breather of SIT in the process of propagation. The direction of propagation corresponding to the maximum and minimum damping of the amplitude are assigned along the armchair and zigzag directions of black phosphorus nano-film, respectively. The most rapid damping of the intensity occurs when the polarization of breather is along the armchair direction.

Keywords: breathers, nonlinear waves, solitons, surface plasmon polaritons

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Authors: S. Nazhan, Hassan K. Al-Musawi, Khalid A. Humood

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This paper reports on an experimental investigation into the influence of current modulation on the properties of a vertical-cavity surface-emitting laser (VCSEL) with a direct square wave modulation. The optical output power response, as a function of the pumping current, modulation frequency, and amplitude, is measured for an 850 nm VCSEL. We demonstrate that modulation frequency and amplitude play important roles in reducing the VCSEL’s power consumption for optical generation. Indeed, even when the biasing current is below the static threshold, the VCSEL emits optical power under the square wave modulation. The power consumed by the device to generate light is significantly reduced to > 50%, which is below the threshold current, in response to both the modulation frequency and amplitude. An operating VCSEL device at low power is very desirable for less thermal effects, which are essential for a high-speed modulation bandwidth.

Keywords: vertical-cavity surface-emitting lasers, VCSELs, optical power generation, power consumption, square wave modulation

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Authors: R. Daïra, V. Chalvidan

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We present the speckle interferometry method to determine the deformation of a piece. This method of holographic imaging using a CCD camera for simultaneous digital recording of two states object and reference. The reconstruction is obtained numerically. This latest method has the advantage of being simpler than the methods currently available, and it does not suffer the holographic configuration faults online. Furthermore, it is entirely digital and avoids heavy analysis after recording the hologram. This work was carried out in the laboratory HOLO 3 (optical metrology laboratory in Saint Louis, France) and it consists in controlling qualitatively and quantitatively the deformation of object by using a camera CCD connected to a computer equipped with software of Fringe Analysis.

Keywords: speckle, nondestructive testing, interferometry, image processing

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Authors: Daofan Guo, Dong Yang

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For decades, well logging with coiled tubing has relied solely on surface data such as pump pressure, wellhead pressure, depth counter, and weight indicator readings. While this data serves the oil industry well, modern smart logging utilizes real-time downhole information, which automatically increases operational efficiency and optimizes intervention qualities. For example, downhole pressure, temperature, and depth measurement data can be transmitted through the electro-optical hybrid cable in the coiled tubing to surface operators on a real-time base. This paper mainly introduces the unique structural features and various applications of the electro-optical hybrid cables which were deployed into downhole with the help of coiled tubing technology. Fiber optic elements in the cable enable optical communications and distributed measurements, such as distributed temperature and acoustic sensing. The electrical elements provide continuous surface power for downhole tools, eliminating the limitations of traditional batteries, such as temperature, operating time, and safety concerns. The electrical elements also enable cable telemetry operation of cable tools. Both power supply and signal transmission were integrated into an electro-optical hybrid cable, and the downhole information can be captured by downhole electrical sensors and distributed optical sensing technologies, then travels up through an optical fiber to the surface, which greatly improves the accuracy of measurement data transmission.

Keywords: electro-optical hybrid cable, underground photoelectric composite cable, seismic cable, coiled tubing, real-time monitoring

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Authors: A. Elsayed, M. H. Dewaidar, M. Ghali

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We report on deposition of smooth, pinhole-free, low-surface roughness ( < 4nm) and high optical quality cadmium sulfide (CdS) thin films on glass substrates using our new method based on chemical surface deposition principle. In this method, cadmium acetate and thiourea are used as reactants under special growth conditions for deposition of CdS films. X-ray diffraction (XRD) measurements were used to examine the crystal structure properties of the deposited CdS films. In addition, UV-vis transmittance and low-temperature (4K) photoluminescence (PL) measurements were performed for quantifying optical properties of the deposited films. Interestingly, we found that XRD pattern of the deposited films has dramatically changed when the growth temperature was raised during the reaction. Namely, the XRD measurements reveal a structural change of CdS film from Cubic to Hexagonal phase upon increase in the growth temperature from 75 °C to 200 °C. Furthermore, the deposited films show high optical quality as confirmed from observation of both sharp edge in the transmittance spectra and strong PL intensity at room temperature. Also, we found a strong effect of the growth conditions on the optical band gap of the deposited films; where remarkable red-shift in the absorption edge with temperature is clearly seen in both transmission and PL spectra. Such tuning of both optical band gap and crystal structure of the deposited CdS films; can be utilized for tuning the electronic bands alignments between CdS and other light harvesting materials, like CuInGaSe or CdTe, for potential improvement in the efficiency of all-solution processed solar cells devices based on these heterostructures.

Keywords: thin film, CdS, new method, optical properties

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Authors: Moussa Hamdan, Abdulati Abdullah

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This paper presents an investigation of the fabrication of the optical devices in terms of their characteristics based on the use of the electromagnetic waves. Planar waveguides are used to examine the field modes (bound modes) and the parameters required for this structure. The modifications are conducted on surface plasmons based waveguides. Simple symmetric dielectric slab structure is used and analyzed in terms of transverse electric mode (TE-Mode) and transverse magnetic mode (TM-Mode. The paper presents mathematical and numerical solutions for solving simple symmetric plasmons and provides simulations of surface plasmons for field confinement. Asymmetric TM-mode calculations for dielectric surface plasmons are also provided.

Keywords: surface plasmons, optical waveguides, semiconductor lasers, refractive index, slab dialectical

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Authors: S. Benzitouni, M. Zaabat, A. Mahdjoub, A. Benaboud, T.Saidani ‎

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To improve the physical properties of ZnO nanostructures textured (103) by sol-gel ‎dip coating method, Al and In are used as dopant with different weight ratios (5%, 10%). ‎The comparative study between Al doped ZnO thin films (AZO) and In doped ZnO (IZO) ‎are made by different analysis technic. XRD showed that the films are Pollycristallins with ‎hexagonal wûrtzite structure and preferred orientation (002) and (103). UV-Vis ‎spectroscopy showed that all films have a high transmission (> 85%); the interference ‎fringes are only observed for IZO. The optical gap is reduced due to the introduction of In ‎‎(minimum value is 3.12 eV), but increased in the presence of Al (maximum value is 3.34 ‎eV). The thickness of the layers was obtained by modeling (using Forouhi Bloomer ‎method). AFM used to observe the surface texture of the films and determined grain size ‎and surface roughness (RMS) which varies in a small range [3.14 to 1.25] nm‎.

Keywords: ZnO, optical gap, roughness (RMS), nanostructures‎

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Authors: Akansha Tyagi, Mehar S. Sidhu, Ankur Mandal, Sanjay Kapoor, Sunil Dahiya, Jan M. Rost, Thomas Pfeifer, Kamal P. Singh

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An all-reflective split and delay unit is designed for dispersion free measurement of broadband ultrashort pulses using a pair of reflective knife edge prism for splitting and recombining of the measuring pulse. It is based on symmetrical wavefront splitting of the measuring pulse having two separate arms to independently shape both split parts. We have validated our delay line with NIR –femtosecond pulse measurement centered at 800 nm using second harmonic-Interferometric frequency resolved optical gating (SH-IFROG). The delay line is compact, easy to align and provides attosecond stability and precision and thus make it more versatile for wide range of applications in ultrafast measurements. We envision that the present delay line will find applications in IR-IR controlling for high harmonic generation (HHG) and attosecond IR-XUV pump-probe measurements with solids and gases providing attosecond resolution and wide delay range.

Keywords: HHG, nonlinear optics, pump-probe spectroscopy, ultrafast metrology

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Authors: Aïssa Manallah, Mohamed Bouafia

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Ellipsometry is an optical method based on the study of the behavior of polarized light. The light reflected on a surface induces a change in the polarization state which depends on the characteristics of the material (complex refractive index and thickness of the different layers constituting the device). The purpose of this work is to determine the optical properties of semiconductor thin films by ellipsometry. This paper describes the experimental aspects concerning the semiconductor samples, the SE400 ellipsometer principle, and the results obtained by direct measurements of ellipsometric parameters and modelling using appropriate software.

Keywords: ellipsometry, optical constants, semiconductors, thin films

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Authors: Henrique Fernandes, Sofia Catalucci, Richard Leach, Kapil Sugand

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Background: Holograms are 3D images formed by the interference of light beams from a laser or other coherent light source. Pepper’s ghost is a form of hologram conceptualised in the 18th century. This Holographic visualisation with metrology measuring techniques by displaying measurements taken in real-time in holographic form can assist in research and education. New structural designs such as the Plexiglass Stand and the Hologram Box can optimise the holographic experience. Method: The equipment used included: (i) Zeiss’s ATOS Core 300 optical coordinate measuring instrument that scanned real-world objects; (ii) Cloud Compare, open-source software used for point cloud processing; and (iii) Hologram Box, designed and manufactured during this research to provide the blackout environment needed to display 3D point clouds in real-time measurements in holographic format, in addition to a portability aspect to holograms. The equipment was tailored to realise the goal of displaying measurements in an innovative technique and to improve on conventional methods. Three test scans were completed before doing a holographic conversion. Results: The outcome was a precise recreation of the original object in the holographic form presented with dense point clouds and surface density features in a colour map. Conclusion: This work establishes a way to visualise data in a point cloud system. To our understanding, this is a work that has never been attempted. This achievement provides an advancement in holographic visualisation. The Hologram Box could be used as a feedback tool for measurement quality control and verification in future smart factories.

Keywords: holography, 3D scans, hologram box, metrology, point cloud

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Authors: Waqar Ali Khan

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A leaky-wave antenna design is proposed which is based on the realization of a certain kind of surface impedance profile that allows the existence of a perturbed surface wave (fast wave) that radiates. The antenna is realized by using optically transparent material Plexiglas. Plexiglas behaves as a dielectric at radio frequencies and is transparent at optical frequencies. In order to have a ground plane for the microwave frequencies, metal strips are used parallel to the E field of the operating mode. The microwave wavelength chosen is large enough such that it does not resolve the metal strip ground plane and sees it to be a uniform ground plane. While, at optical frequencies, the metal strips do have some shadowing effect. However still, about 62% of optical power can be transmitted through the antenna.

Keywords: Plexiglass, surface-wave, optically transparent, metal strip

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Authors: Mehrnoosh Ghadimi, Golnoush Ghadimi

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Precise monitoring of glacier velocity is critical in determining glacier-related hazards. Zardkooh Mountain was studied in terms of glacial activity rate in Zagros Mountainous region in Iran. In this study, we assessed the ability of optical and radar imagery to derive glacier-surface velocities in mountainous terrain. We processed Landsat 8 for optical data and Sentinel-1a for radar data. We used methods that are commonly used to measure glacier surface movements, such as cross correlation of optical and radar satellite images, SAR tracking techniques, and multiple aperture InSAR (MAI). We also assessed time series glacier surface displacement using our modified method, Enhanced Small Baseline Subset (ESBAS). The ESBAS has been implemented in StaMPS software, with several aspects of the processing chain modified, including filtering prior to phase unwrapping, topographic correction within three-dimensional phase unwrapping, reducing atmospheric noise, and removing the ramp caused by ionosphere turbulence and/or orbit errors. Our findings indicate an average surface velocity rate of 32 mm/yr in the Zardkooh mountainous areas.

Keywords: active rock glaciers, landsat 8, sentinel-1a, zagros mountainous region

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Authors: Lotfi Hedi Khezami, Mohamed Ben Rabha, N. Sboui, Mounir Gaidi, B. Bessais

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Metal-nano particle-assisted Chemical Etching is an extraordinary developed wet etching method of producing uniform semiconductor nano structure (nano wires) from patterned metallic film on crystalline silicon surface. The metal films facilitate the etching in HF and H2O2 solution and produce silicon nanowires (SiNWs). Creation of different SiNWs morphologies by changing the etching time and its effects on optical and opto electronic properties was investigated. Combination effect of formed SiNWs and stain etching treatment in acid (HF/HNO3/H2O) solution on the surface morphology of Si wafers as well as on the optical and opto electronic properties are presented in this paper.

Keywords: stain etching, porous silicon, silicon nanowires, reflectivity, lifetime, solar cells

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Authors: Pedro M. A. Vitoriano, Tito. G. Amaral

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Automated Optical Inspection (AOI) Systems are commonly used on Printed Circuit Boards (PCB) manufacturing. The use of this technology has been proven as highly efficient for process improvements and quality achievements. The correct extraction of the component for posterior analysis is a critical step of the AOI process. Nowadays, the Pattern Matching Algorithm is commonly used, although this algorithm requires extensive calculations and is time consuming. This paper will present an improved algorithm for the component localization process, with the capability of implementation in a parallel execution system.

Keywords: AOI, automated optical inspection, SMD, surface mounting devices, pattern matching, parallel execution

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Authors: Ngo Thi Thu, Kazuo Tanaka, Masahiro Tanaka, Dao Ngoc Chien

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Nanometric superfocusing of optical intensity near the tip of partially metal- coated dielectric conical probe of the convergent surface plasmon polariton wave is investigated by the volume integral equation method. It is possible to perform nanofocusing using this probe by using both linearly and radially polarized Gaussian beams as the incident waves. Strongly localized and enhanced optical near-fields can be created on the tip of this probe for the cases of both incident Gaussian beams. However the intensity distribution near the probe tip was found to be very sensitive to the shape of the probe tip.

Keywords: waveguide, surface plasmons, electromagnetic theory

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Authors: Faten Adel Ismael Chaqmaqchee

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Optical, electrical and optical-electrical characterisations of surface light emitting VCSOAs devices are reported. The hot electron light emitting and lasing in semiconductor hetero-structure vertical cavity semiconductor optical amplifier (HELLISH VCSOA) device is a surface emitter based on longitudinal injection of electron and hole pairs in their respective channels. Ga0.35In0.65N0.02As0.08/GaAs was used as an active material for operation in the 1.3 μm window of the optical communications. The device has undoped Distributed Bragg Reflectors (DBRs) and the current is injected longitudinally, directly into the active layers and does not involve DBRs. Therefore, problems associated with refractive index contrast and current injection through the DBR layers, which are common with the doped DBRs in conventional VCSOAs, are avoided. The highest gain of around 4 dB is obtained for the 1300 nm wavelength operation.

Keywords: HELLISH, VCSOA, GaInNAs, luminescence, gain

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