Search results for: Rahim Sarvari
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 63

Search results for: Rahim Sarvari

3 The Effect of Drought Stress on Grain Yield, Yield Components and Protein Content of Durum Wheat Cultivars in Ilam Province, Iran

Authors: Parvaneh Vafa, Rahim Naseri, Meysam Moradi

Abstract:

In order to study the effect of drought stress on grain yield, yield components and associated traits of durum wheat cultivars, an experiment was done as split plot arrangement using randomized complete block design with three replications in Ilam province, Iran in 2009-2010 cropping season. Different levels of irrigation (Full irrigation, drought stress at stem elongation, Flowering and grain formation stages) were considered as a main plot and three durum wheat cultivars (Yavaros, Seimareh and Karkheh) were assigned as a sub plot. The results showed that drought stress was significant on grain yield, spike.m-2, grain. Spike-1, 1000-grain weight, biological yield, harvest index and protein content. Drought stress at all stages caused a loss in grain yield and its components. Full irrigation had the highest grain yield and yield components. Drought stress at stem elongation, flowering and grain formation stages caused a reduction in spike.m-2, grain.spike-1 and 1000-grain weight, respectively. Protein content was significantly affected by drought stress. The highest protein content was obtained from drought stress at grain formation stage. Cultivars had an influence on grain yield and yield components. Yavaros and Seimareh cultivars had the highest and lowest grain yield, respectively. Interaction effect between drought stress and cultivar had a significant effect on grain and yield components. Full irrigation and Yavaros cultivar had the highest grain yield and drought stress at grain formation stage and Seimareh cultivar had the lowest grain yield, respectively.

Keywords: Durum wheat, Drought stress, Grain yield.

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2 Development of Manufacturing Simulation Model for Semiconductor Fabrication

Authors: Syahril Ridzuan Ab Rahim, Ibrahim Ahmad, Mohd Azizi Chik, Ahmad Zafir Md. Rejab, and U. Hashim

Abstract:

This research presents the development of simulation modeling for WIP management in semiconductor fabrication. Manufacturing simulation modeling is needed for productivity optimization analysis due to the complex process flows involved more than 35 percent re-entrance processing steps more than 15 times at same equipment. Furthermore, semiconductor fabrication required to produce high product mixed with total processing steps varies from 300 to 800 steps and cycle time between 30 to 70 days. Besides the complexity, expansive wafer cost that potentially impact the company profits margin once miss due date is another motivation to explore options to experiment any analysis using simulation modeling. In this paper, the simulation model is developed using existing commercial software platform AutoSched AP, with customized integration with Manufacturing Execution Systems (MES) and Advanced Productivity Family (APF) for data collections used to configure the model parameters and data source. Model parameters such as processing steps cycle time, equipment performance, handling time, efficiency of operator are collected through this customization. Once the parameters are validated, few customizations are made to ensure the prior model is executed. The accuracy for the simulation model is validated with the actual output per day for all equipments. The comparison analysis from result of the simulation model compared to actual for achieved 95 percent accuracy for 30 days. This model later was used to perform various what if analysis to understand impacts on cycle time and overall output. By using this simulation model, complex manufacturing environment like semiconductor fabrication (fab) now have alternative source of validation for any new requirements impact analysis.

Keywords: Advanced Productivity Family (APF), Complementary Metal Oxide Semiconductor (CMOS), Manufacturing Execution Systems (MES), Work In Progress (WIP).

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1 Preparation and Characterization of CuFe2O4/TiO2 Photocatalyst for the Conversion of CO2 into Methanol under Visible Light

Authors: Md. Maksudur Rahman Khan, M. Rahim Uddin, Hamidah Abdullah, Kaykobad Md. Rezaul Karim, Abu Yousuf, Chin Kui Cheng, Huei Ruey Ong

Abstract:

A systematic study was conducted to explore the photocatalytic reduction of carbon dioxide (CO2) into methanol on TiO2 loaded copper ferrite (CuFe2O4) photocatalyst under visible light irradiation. The phases and crystallite size of the photocatalysts were characterized by X-ray diffraction (XRD) and it indicates CuFe2O4 as tetragonal phase incorporation with anatase TiO2 in CuFe2O4/TiO2 hetero-structure. The XRD results confirmed the formation of spinel type tetragonal CuFe2O4 phases along with predominantly anatase phase of TiO2 in the CuFe2O4/TiO2 hetero-structure. UV-Vis absorption spectrum suggested the formation of the hetero-junction with relatively lower band gap than that of TiO2. Photoluminescence (PL) technique was used to study the electron–hole (e/h+) recombination process. PL spectra analysis confirmed the slow-down of the recombination of electron–hole (e/h+) pairs in the CuFe2O4/TiO2 hetero-structure. The photocatalytic performance of CuFe2O4/TiO2 was evaluated based on the methanol yield with varying amount of TiO2 over CuFe2O4 (0.5:1, 1:1, and 2:1) and changing light intensity. The mechanism of the photocatalysis was proposed based on the fact that the predominant species of CO2 in aqueous phase were dissolved CO2 and HCO3- at pH ~5.9. It was evident that the CuFe2O4 could harvest the electrons under visible light irradiation, which could further be injected to the conduction band of TiO2 to increase the life time of the electron and facilitating the reactions of CO2 to methanol. The developed catalyst showed good recycle ability up to four cycles where the loss of activity was ~25%. Methanol was observed as the main product over CuFe2O4, but loading with TiO2 remarkably increased the methanol yield. Methanol yield over CuFe2O4/TiO2 was found to be about three times higher (651 μmol/gcat L) than that of CuFe2O4 photocatalyst. This occurs because the energy of the band excited electrons lies above the redox potentials of the reaction products CO2/CH3OH.

Keywords: Photocatalysis, CuFe2O4/TiO2, band-gap energy, methanol.

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