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Influence of Thermal Annealing on The Structural Properties of Vanadyl Phthalocyanine Thin Films: A Comparative Study

Authors: Fakhra Aziz, K. Sulaiman, M. R. Muhammad, M. Hassan Sayyad, Kh. Karimov

Abstract:

This paper presents a comparative study on Vanadyl Phthalocyanine (VOPc) thin films deposited by thermal evaporation and spin coating techniques. The samples were prepared on cleaned glass substrates and annealed at various temperatures ranging form 95oC to 155oC. To obtain the morphological and structural properties of VOPc thin films, X-ray diffraction (XRD) technique and atomic force microscopy (AFM) have been implied. The AFM topographic images show a very slight difference in the thermally grown films, before and after annealing, however best results are achieved for the spin-cast film annealed at 125oC. The XRD spectra show no existence of the sharp peaks, suggesting the material to be amorphous. The humps in the XRD patterns indicate the presence of some crystallites.

Keywords: Annealing, optical properties, thin films, Vanadylphthalocyanine.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1055843

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References:


[1] D. Gu, Qiying Chen, Juping Shu, Xiaodong Tang, Fuxi Gan, Shuyin Shenb, Kai Liu and Huijun Xu, "Optical recording performance of thin films of phthalocyanine compounds," Thin Solid Films vol. 257 pp. 88-93, 1995.
[2] B. W. Bloom A, US Patent, vol. 4, p. 355, 1980.
[3] S. Shihub and R. Gould, "Structure and phase-change phenomena in evaporated thin films of cobalt phthalocyanine," physica status solidi (a), vol. 139, pp. 129-138, 1993.
[4] A. El-Bosaty, et al., "Surface Plasmon-Cobalt Phthalocyanine Sensor for NO2 gas," Egypt. J. Solids, 2006.
[5] M. Shah, Kh. S. Karimov and M H Sayyad, "Organic semiconductor nickel phthalocyanine-based photocapacitive and photoresistive detector," Semicond. Sci. Technol. , vol. 25, pp. 75014-75018, 2010.
[6] L. Li, Qingxin Tang, Hongxiang Li, Wenping Hu, Xiaodi Yang, Zhigang Shuai, Yunqi Liu, and Daoben Zhu, "Organic thin-film transistors of phthalocyanines*," Pure Appl. Chem., vol. 80, pp. 2231-2240, 2008.
[7] Y. D. Kim, Jae Pil Kim, Oh Sang Kwon ands In Hee Cho, "The synthesis and application of thermally stable dyes for ink-jet printed LCD scolor filters," Dyes and Pigments, vol. 81 pp. 45-52, 2009.
[8] F. Carpi, D. De Rossi, "Colours from electroactive polymers: Electrochromic, electroluminescent and laser devices based on organic materials," Optics Laser Technology vol. 38 2006.
[9] B. D. Bezerine, Coordination Compounds of Porphyrins and Phthalocyanines. New York: Wiley, 1981.
[10] W. Li, Yong Pu, Wenqing Fang, Jiangnan Dai, Changda Zheng, Chunlan Mo, Chuanbin Xiong, Fengyi Jiang, "Effect of high-temperature annealing on the structural and optical properties of ZnO films," Thin solid films, vol. 491, pp. 323-327, 2005.
[11] M. M. El-Nahass, Z. El-Gohary, H.S. Soliman, "Structural and optical studies of thermally evaporated CoPc thin lms," Optics Laser Technology vol. 35 pp. 523 - 531, 2003.
[12] M. M. a. S. Y. El-Nahass, "Effect of annealing temperature on the optical properties of thermally evaporated tin phthalocyanine thin films," Applied Surface Science vol. 255 pp. 1631-1636, 2008.
[13] R. Ye, Mamoru Baba, Koji Ohta and Kazunori Suzuki, "Effects of thermal annealing on structure, morphology and electrical properties of F16CuPc/a6T heterojunction thin films," Solid-State Electronics vol. 54 pp. 710-714, 2010.
[14] Y. L. Pan, Y. J. Wu, L. B. Chen, Y. Y. Zhao, Y. Y. Shen, F. M. Li, S. Y. Shen and D. Y. Huang, "Structure and spectroscopic characterization polycrystalline vanadyl phthalocyanine (VOPc) films fabricated by vacuum deposition," Appl. Phys. A, vol. 66, pp. 569-573, 1998.
[15] G. Li, Visha Shrotriya, Yan Yao and Yang Yang, "Investigation of annealing effects and film thickness dependence of polymer solar cells based on poly(3-hexylthiophene)," J. Appl. Phys., vol. 98, pp. 043704-1, 2005.
[16] A. M. E. Raj, S. G. Victoria,V. B. Jothy, C. Ravidhas, J. Wollschlager, M. Suendorf, M. Neumann, M. Jayachandran, C. Sanjeeviraja, "XRD and XPS caharacterization of mixed valence Mn3O4 hausmannite thin films prepared by chemical spray pyrolysis technique," Applied Surface Science, vol. 256, pp. 2920-2926, 2010.
[17] M. Na and S. W. Rhee, "Electronic characterization of Al/PMMA
[poly (methyl methacrylate)]/p-Si and Al/CEP (cyanoethyl pullulan)/p- Si structures," Organic Electronics, vol. 7, pp. 205-212, 2006.