Fakhra Aziz and K. Sulaiman and M. R. Muhammad and M. Hassan Sayyad and Kh. Karimov
Influence of Thermal Annealing on The Structural Properties of Vanadyl Phthalocyanine Thin Films A Comparative Study
707 - 709
2011
5
8
International Journal of Materials and Metallurgical Engineering
https://publications.waset.org/pdf/1782
https://publications.waset.org/vol/56
World Academy of Science, Engineering and Technology
This paper presents a comparative study on
Vanadyl Phthalocyanine (VOPc) thin films deposited by thermal
evaporation and spin coating techniques. The samples
were prepared on cleaned glass substrates and annealed at
various temperatures ranging form 95oC to 155oC. To obtain
the morphological and structural properties of VOPc thin
films, Xray diffraction (XRD) technique and atomic force
microscopy (AFM) have been implied. The AFM topographic
images show a very slight difference in the thermally grown
films, before and after annealing, however best results are
achieved for the spincast film annealed at 125oC. The XRD
spectra show no existence of the sharp peaks, suggesting the
material to be amorphous. The humps in the XRD patterns
indicate the presence of some crystallites.
Open Science Index 56, 2011