TY - JFULL AU - Fakhra Aziz and K. Sulaiman and M. R. Muhammad and M. Hassan Sayyad and Kh. Karimov PY - 2011/9/ TI - Influence of Thermal Annealing on The Structural Properties of Vanadyl Phthalocyanine Thin Films: A Comparative Study T2 - International Journal of Materials and Metallurgical Engineering SP - 706 EP - 709 VL - 5 SN - 1307-6892 UR - https://publications.waset.org/pdf/1782 PU - World Academy of Science, Engineering and Technology NX - Open Science Index 56, 2011 N2 - This paper presents a comparative study on Vanadyl Phthalocyanine (VOPc) thin films deposited by thermal evaporation and spin coating techniques. The samples were prepared on cleaned glass substrates and annealed at various temperatures ranging form 95oC to 155oC. To obtain the morphological and structural properties of VOPc thin films, X-ray diffraction (XRD) technique and atomic force microscopy (AFM) have been implied. The AFM topographic images show a very slight difference in the thermally grown films, before and after annealing, however best results are achieved for the spin-cast film annealed at 125oC. The XRD spectra show no existence of the sharp peaks, suggesting the material to be amorphous. The humps in the XRD patterns indicate the presence of some crystallites. ER -