Search results for: Vadim B. Kosterev
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 4

Search results for: Vadim B. Kosterev

4 Formation of Nanosize Phases under Thermomechanical Strengthening of Low Carbon Steel

Authors: Victor E. Gromov, Yurii F. Ivanov, Vadim B. Kosterev, Sergey V. Konovalov, Veronica I. Myasnikova, Guoyi Tang

Abstract:

A study of the H-beam's nanosize structure phase states after thermomechanical strengthening was carried out by TEM. The following processes were analyzed. 1. The dispersing of the cementite plates by cutting them by moving dislocations. 2. The dissolution of cementite plates and repeated precipitation of the cementite particles on the dislocations, the boundaries, subgrains and grains. 3. The decay of solid solution of carbon in the α-iron after "self-tempering" of martensite. 4. The final transformation of the retained austenite in beinite with α-iron particles and cementite formation. 5. The implementation of the diffusion mechanism of γ ⇒ α transformation.

Keywords: nanosize, phase, steel, strengthening

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3 Application of Argumentation for Improving the Classification Accuracy in Inductive Concept Formation

Authors: Vadim Vagin, Marina Fomina, Oleg Morosin

Abstract:

This paper contains the description of argumentation approach for the problem of inductive concept formation. It is proposed to use argumentation, based on defeasible reasoning with justification degrees, to improve the quality of classification models, obtained by generalization algorithms. The experiment’s results on both clear and noisy data are also presented.

Keywords: Argumentation, justification degrees, inductive concept formation, noise, generalization.

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2 Estimation of Time -Varying Linear Regression with Unknown Time -Volatility via Continuous Generalization of the Akaike Information Criterion

Authors: Elena Ezhova, Vadim Mottl, Olga Krasotkina

Abstract:

The problem of estimating time-varying regression is inevitably concerned with the necessity to choose the appropriate level of model volatility - ranging from the full stationarity of instant regression models to their absolute independence of each other. In the stationary case the number of regression coefficients to be estimated equals that of regressors, whereas the absence of any smoothness assumptions augments the dimension of the unknown vector by the factor of the time-series length. The Akaike Information Criterion is a commonly adopted means of adjusting a model to the given data set within a succession of nested parametric model classes, but its crucial restriction is that the classes are rigidly defined by the growing integer-valued dimension of the unknown vector. To make the Kullback information maximization principle underlying the classical AIC applicable to the problem of time-varying regression estimation, we extend it onto a wider class of data models in which the dimension of the parameter is fixed, but the freedom of its values is softly constrained by a family of continuously nested a priori probability distributions.

Keywords: Time varying regression, time-volatility of regression coefficients, Akaike Information Criterion (AIC), Kullback information maximization principle.

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1 Image Ranking to Assist Object Labeling for Training Detection Models

Authors: Tonislav Ivanov, Oleksii Nedashkivskyi, Denis Babeshko, Vadim Pinskiy, Matthew Putman

Abstract:

Training a machine learning model for object detection that generalizes well is known to benefit from a training dataset with diverse examples. However, training datasets usually contain many repeats of common examples of a class and lack rarely seen examples. This is due to the process commonly used during human annotation where a person would proceed sequentially through a list of images labeling a sufficiently high total number of examples. Instead, the method presented involves an active process where, after the initial labeling of several images is completed, the next subset of images for labeling is selected by an algorithm. This process of algorithmic image selection and manual labeling continues in an iterative fashion. The algorithm used for the image selection is a deep learning algorithm, based on the U-shaped architecture, which quantifies the presence of unseen data in each image in order to find images that contain the most novel examples. Moreover, the location of the unseen data in each image is highlighted, aiding the labeler in spotting these examples. Experiments performed using semiconductor wafer data show that labeling a subset of the data, curated by this algorithm, resulted in a model with a better performance than a model produced from sequentially labeling the same amount of data. Also, similar performance is achieved compared to a model trained on exhaustive labeling of the whole dataset. Overall, the proposed approach results in a dataset that has a diverse set of examples per class as well as more balanced classes, which proves beneficial when training a deep learning model.

Keywords: Computer vision, deep learning, object detection, semiconductor.

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