A Study on Design for Parallel Test Based on Embedded System

Authors: Zheng Sun, Weiwei Cui, Xiaodong Ma, Hongxin Jin, Dongpao Hong, Jinsong Yang, Jingyi Sun

Abstract:

With the improvement of the performance and complexity of modern equipment, automatic test system (ATS) becomes widely used for condition monitoring and fault diagnosis. However, the conventional ATS mainly works in a serial mode, and lacks the ability of testing several equipments at the same time. That leads to low test efficiency and ATS redundancy. Especially for a large majority of equipment under test, the conventional ATS cannot meet the requirement of efficient testing. To reduce the support resource and increase test efficiency, we propose a method of design for the parallel test based on the embedded system in this paper. Firstly, we put forward the general framework of the parallel test system, and the system contains a central management system (CMS) and several distributed test subsystems (DTS). Then we give a detailed design of the system. For the hardware of the system, we use embedded architecture to design DTS. For the software of the system, we use test program set to improve the test adaption. By deploying the parallel test system, the time to test five devices is now equal to the time to test one device in the past. Compared with the conventional test system, the proposed test system reduces the size and improves testing efficiency. This is of great significance for equipment to be put into operation swiftly. Finally, we take an industrial control system as an example to verify the effectiveness of the proposed method. The result shows that the method is reasonable, and the efficiency is improved up to 500%.

Keywords: parallel test, embedded system, automatic test system, automatic test system (ATS), central management system, central management system (CMS), distributed test subsystems, distributed test subsystems (DTS)