A Power Reduction Technique for Built-In-Self Testing Using Modified Linear Feedback Shift Register

Authors: Mayank Shakya, Soundra Pandian. K. K

Abstract:

A linear feedback shift register (LFSR) is proposed which targets to reduce the power consumption from within. It reduces the power consumption during testing of a Circuit Under Test (CUT) at two stages. At first stage, Control Logic (CL) makes the clocks of the switching units of the register inactive for a time period when output from them is going to be same as previous one and thus reducing unnecessary switching of the flip-flops. And at second stage, the LFSR reorders the test vectors by interchanging the bit with its next and closest neighbor bit. It keeps fault coverage capacity of the vectors unchanged but reduces the Total Hamming Distance (THD) so that there is reduction in power while shifting operation.

Keywords: Linear Feedback Shift Register, Total Hamming Distance, Fault Coverage, Control Logic

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1062648

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