Commenced in January 2007
Paper Count: 30831
Average Current Estimation Technique for Reliability Analysis of Multiple Semiconductor Interconnects
Abstract:Average current analysis checking the impact of current flow is very important to guarantee the reliability of semiconductor systems. As semiconductor process technologies improve, the coupling capacitance often become bigger than self capacitances. In this paper, we propose an analytic technique for analyzing average current on interconnects in multi-conductor structures. The proposed technique has shown to yield the acceptable errors compared to HSPICE results while providing computational efficiency.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1328560Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1050
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