%0 Journal Article %A Ki-Young Kim and Jae-Ho Lim and Deok-Min Kim and Seok-Yoon Kim %D 2010 %J International Journal of Computer and Information Engineering %B World Academy of Science, Engineering and Technology %I Open Science Index 47, 2010 %T Average Current Estimation Technique for Reliability Analysis of Multiple Semiconductor Interconnects %U https://publications.waset.org/pdf/509 %V 47 %X Average current analysis checking the impact of current flow is very important to guarantee the reliability of semiconductor systems. As semiconductor process technologies improve, the coupling capacitance often become bigger than self capacitances. In this paper, we propose an analytic technique for analyzing average current on interconnects in multi-conductor structures. The proposed technique has shown to yield the acceptable errors compared to HSPICE results while providing computational efficiency. %P 1683 - 1687