WASET
    Ki-Young Kim and  Jae-Ho Lim and  Deok-Min Kim and  Seok-Yoon Kim,  Average Current Estimation Technique for Reliability Analysis of Multiple Semiconductor Interconnects.   journal   = {International Journal of Computer and Information Engineering}, [online]. World Academy of Science, Engineering and Technology.
    November 2010, vol. 47(11). 1683 - 1687
    [viewed 28 March 2024]. Available from: https://publications.waset.org/pdf/509.