Ki-Young Kim and Jae-Ho Lim and Deok-Min Kim and Seok-Yoon Kim, Average Current Estimation Technique for Reliability Analysis of Multiple Semiconductor Interconnects. journal = {International Journal of Computer and Information Engineering}, [online]. World Academy of Science, Engineering and Technology. November 2010, vol. 47(11). 1683 - 1687 [viewed 28 March 2024]. Available from: https://publications.waset.org/pdf/509.