An Examination and Validation of the Theoretical Resistivity-Temperature Relationship for Conductors
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 33122
An Examination and Validation of the Theoretical Resistivity-Temperature Relationship for Conductors

Authors: Fred Lacy

Abstract:

Electrical resistivity is a fundamental parameter of metals or electrical conductors. Since resistivity is a function of temperature, in order to completely understand the behavior of metals, a temperature dependent theoretical model is needed. A model based on physics principles has recently been developed to obtain an equation that relates electrical resistivity to temperature. This equation is dependent upon a parameter associated with the electron travel time before being scattered, and a parameter that relates the energy of the atoms and their separation distance. Analysis of the energy parameter reveals that the equation is optimized if the proportionality term in the equation is not constant but varies over the temperature range. Additional analysis reveals that the theoretical equation can be used to determine the mean free path of conduction electrons, the number of defects in the atomic lattice, and the ‘equivalent’ charge associated with the metallic bonding of the atoms. All of this analysis provides validation for the theoretical model and provides insight into the behavior of metals where performance is affected by temperatures (e.g., integrated circuits and temperature sensors).

Keywords: Callendar–van Dusen, conductivity, mean free path, resistance temperature detector, temperature sensor.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1335836

Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 2187

References:


[1] F. Lacy, “Developing a theoretical relationship between electrical resistivity, temperature, and film thickness for conductors,” Nanoscale Research Letters, vol. 6:636, 2011.
[2] F. Lacy, “Evaluating the Resistivity-Temperature Relationship for RTDs and Other Conductors,” IEEE Sensors Journal, vol. 11(5), pp. 1208-1213, May 2011.
[3] J. Fraden, Handbook of Modern Sensors: Physics, Designs, and Applications. New York: Springer-Verlag, 2004, pp. 461 - 477.
[4] G. T. A. Kovacs, Micromachined Transducers Sourcebook. Boston: McGraw Hill, 1998, pp. 559-561.
[5] H. L. Trietley, Transducers in Mechanical and Electronic Design. New York: Marcel Dekker, 1986, pp. 27-41.
[6] C. Kittel, Introduction to Solid State Physics. New York: Wiley, 2005, pp. 125-180, 217-252.
[7] C. Kittel, Introduction to Solid State Physics. New York: Wiley, 2005, pp. 47-70.
[8] H. T. Stokes, Solid State Physics. Boston: Allyn and Bacon, 1987, pp. 32-36, 61-63.
[9] M Razeghi, Fundamentals of Solid State Engineering. New York: Springer, 2007, pp. 161-190.
[10] L. Solymar and D. Walsh, Electrical Properties of Materials. Oxford: Oxford University Press, 2004, pp. 63-79.
[11] J. R. Christman, Fundamentals of Solid State Physics. New York: Wiley, 1988, pp. 109-136.
[12] G. Burns, Solid State Physics. Orlando: Academic Press, 1985, pp. 112-144, 189-191.
[13] N.W. Ashcroft and N. D. Mermin, Solid State Physics. Belmont, CA: Brooks/Cole, 1976, pp. 373-447.
[14] C. Kittel, Introduction to Solid State Physics. New York: Wiley, 2005, p. 142.
[15] H. T. Stokes, Solid State Physics. Boston: Allyn and Bacon, 1987, p. 151.
[16] C. Kittel, Introduction to Solid State Physics. New York: Wiley, 2005, p. 132.
[17] H. T. Stokes, Solid State Physics. Boston: Allyn and Bacon, 1987, p. 140.
[18] C. Kittel, Introduction to Solid State Physics. New York: Wiley, 2005, p. 143.
[19] G. Burns, Solid State Physics. Orlando: Academic Press, 1985, p. 194.
[20] N.W. Ashcroft and N. D. Mermin, Solid State Physics. Belmont, CA: Brooks/Cole, 1976, p. 10.
[21] N.W. Ashcroft and N. D. Mermin, Solid State Physics. Belmont, CA: Brooks/Cole, 1976, p. 523.