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A New Efficient Scalable BIST Full Adder using Polymorphic Gates

Authors: M. Mashayekhi, H. H. Ardakani, A. Omidian


Among various testing methodologies, Built-in Self- Test (BIST) is recognized as a low cost, effective paradigm. Also, full adders are one of the basic building blocks of most arithmetic circuits in all processing units. In this paper, an optimized testable 2- bit full adder as a test building block is proposed. Then, a BIST procedure is introduced to scale up the building block and to generate a self testable n-bit full adders. The target design can achieve 100% fault coverage using insignificant amount of hardware redundancy. Moreover, Overall test time is reduced by utilizing polymorphic gates and also by testing full adder building blocks in parallel.

Keywords: full adder, BIST, Polymorphic Gate

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