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Paper Count: 31103
A New Efficient Scalable BIST Full Adder using Polymorphic Gates
Abstract:Among various testing methodologies, Built-in Self- Test (BIST) is recognized as a low cost, effective paradigm. Also, full adders are one of the basic building blocks of most arithmetic circuits in all processing units. In this paper, an optimized testable 2- bit full adder as a test building block is proposed. Then, a BIST procedure is introduced to scale up the building block and to generate a self testable n-bit full adders. The target design can achieve 100% fault coverage using insignificant amount of hardware redundancy. Moreover, Overall test time is reduced by utilizing polymorphic gates and also by testing full adder building blocks in parallel.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1081993Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1502
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