@article{(Open Science Index):https://publications.waset.org/pdf/13904, title = {A New Efficient Scalable BIST Full Adder using Polymorphic Gates}, author = {M. Mashayekhi and H. H. Ardakani and A. Omidian}, country = {}, institution = {}, abstract = {Among various testing methodologies, Built-in Self- Test (BIST) is recognized as a low cost, effective paradigm. Also, full adders are one of the basic building blocks of most arithmetic circuits in all processing units. In this paper, an optimized testable 2- bit full adder as a test building block is proposed. Then, a BIST procedure is introduced to scale up the building block and to generate a self testable n-bit full adders. The target design can achieve 100% fault coverage using insignificant amount of hardware redundancy. Moreover, Overall test time is reduced by utilizing polymorphic gates and also by testing full adder building blocks in parallel.}, journal = {International Journal of Electrical and Computer Engineering}, volume = {4}, number = {1}, year = {2010}, pages = {210 - 213}, ee = {https://publications.waset.org/pdf/13904}, url = {https://publications.waset.org/vol/37}, bibsource = {https://publications.waset.org/}, issn = {eISSN: 1307-6892}, publisher = {World Academy of Science, Engineering and Technology}, index = {Open Science Index 37, 2010}, }