@article{(Open Science Index):https://publications.waset.org/pdf/13904,
	  title     = {A New Efficient Scalable BIST Full Adder using Polymorphic Gates},
	  author    = {M. Mashayekhi and  H. H. Ardakani and  A. Omidian},
	  country	= {},
	  institution	= {},
	  abstract     = {Among various testing methodologies, Built-in Self-
Test (BIST) is recognized as a low cost, effective paradigm. Also,
full adders are one of the basic building blocks of most arithmetic
circuits in all processing units. In this paper, an optimized testable 2-
bit full adder as a test building block is proposed. Then, a BIST
procedure is introduced to scale up the building block and to generate
a self testable n-bit full adders. The target design can achieve 100%
fault coverage using insignificant amount of hardware redundancy.
Moreover, Overall test time is reduced by utilizing polymorphic
gates and also by testing full adder building blocks in parallel.},
	    journal   = {International Journal of Electrical and Computer Engineering},
	  volume    = {4},
	  number    = {1},
	  year      = {2010},
	  pages     = {210 - 213},
	  ee        = {https://publications.waset.org/pdf/13904},
	  url   	= {https://publications.waset.org/vol/37},
	  bibsource = {https://publications.waset.org/},
	  issn  	= {eISSN: 1307-6892},
	  publisher = {World Academy of Science, Engineering and Technology},
	  index 	= {Open Science Index 37, 2010},
	}