WASET
	%0 Journal Article
	%A M. Mashayekhi and  H. H. Ardakani and  A. Omidian
	%D 2010
	%J International Journal of Electrical and Computer Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 37, 2010
	%T A New Efficient Scalable BIST Full Adder using Polymorphic Gates
	%U https://publications.waset.org/pdf/13904
	%V 37
	%X Among various testing methodologies, Built-in Self-
Test (BIST) is recognized as a low cost, effective paradigm. Also,
full adders are one of the basic building blocks of most arithmetic
circuits in all processing units. In this paper, an optimized testable 2-
bit full adder as a test building block is proposed. Then, a BIST
procedure is introduced to scale up the building block and to generate
a self testable n-bit full adders. The target design can achieve 100%
fault coverage using insignificant amount of hardware redundancy.
Moreover, Overall test time is reduced by utilizing polymorphic
gates and also by testing full adder building blocks in parallel.
	%P 210 - 213