Concurrent Testing of ADC for Embedded System

Authors: Y.B.Gandole

Abstract:

Compaction testing methods allow at-speed detecting of errors while possessing low cost of implementation. Owing to this distinctive feature, compaction methods have been widely used for built-in testing, as well as external testing. In the latter case, the bandwidth requirements to the automated test equipment employed are relaxed which reduces the overall cost of testing. Concurrent compaction testing methods use operational signals to detect misbehavior of the device under test and do not require input test stimuli. These methods have been employed for digital systems only. In the present work, we extend the use of compaction methods for concurrent testing of analog-to-digital converters. We estimate tolerance bounds for the result of compaction and evaluate the aliasing rate.

Keywords: Analog-to Digital Converter, Embedded system, Concurrent Testing

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1075689

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