WASET
    Y.B.Gandole,  Concurrent Testing of ADC for Embedded System.   journal   = {International Journal of Electronics and Communication Engineering}, [online]. World Academy of Science, Engineering and Technology.
    November 2011, vol. 59(11). 1555 - 1558
    [viewed 26 April 2024]. Available from: https://publications.waset.org/pdf/10673.