%0 Journal Article
	%A Y.B.Gandole
	%D 2011
	%J International Journal of Electronics and Communication Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 59, 2011
	%T Concurrent Testing of ADC for Embedded System
	%U https://publications.waset.org/pdf/10673
	%V 59
	%X Compaction testing methods allow at-speed detecting
of errors while possessing low cost of implementation. Owing to this
distinctive feature, compaction methods have been widely used for
built-in testing, as well as external testing. In the latter case, the
bandwidth requirements to the automated test equipment employed
are relaxed which reduces the overall cost of testing. Concurrent
compaction testing methods use operational signals to detect
misbehavior of the device under test and do not require input test
stimuli. These methods have been employed for digital systems only.
In the present work, we extend the use of compaction methods for
concurrent testing of analog-to-digital converters. We estimate
tolerance bounds for the result of compaction and evaluate the
aliasing rate.
	%P 1555 - 1558