Commenced in January 2007
Paper Count: 30069
Test Data Compression Using a Hybrid of Bitmask Dictionary and 2n Pattern Runlength Coding Methods
Abstract:In VLSI, testing plays an important role. Major problem in testing are test data volume and test power. The important solution to reduce test data volume and test time is test data compression. The Proposed technique combines the bit maskdictionary and 2n pattern run length-coding method and provides a substantial improvement in the compression efficiency without introducing any additional decompression penalty. This method has been implemented using Mat lab and HDL Language to reduce test data volume and memory requirements. This method is applied on various benchmark test sets and compared the results with other existing methods. The proposed technique can achieve a compression ratio up to 86%.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1108963Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF
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