Test Data Compression Using a Hybrid of Bitmask Dictionary and 2n Pattern Runlength Coding Methods

Authors: C. Kalamani, K. Paramasivam

Abstract:

In VLSI, testing plays an important role. Major problem in testing are test data volume and test power. The important solution to reduce test data volume and test time is test data compression. The Proposed technique combines the bit maskdictionary and 2n pattern run length-coding method and provides a substantial improvement in the compression efficiency without introducing any additional decompression penalty. This method has been implemented using Mat lab and HDL Language to reduce test data volume and memory requirements. This method is applied on various benchmark test sets and compared the results with other existing methods. The proposed technique can achieve a compression ratio up to 86%.

Keywords: Bit Mask dictionary, 2n pattern run length code, system-on-chip, SOC, test data compression.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1108963

References:

[1] Laung-Terng Wang, Cheng-Wen Wu, and Xiaoqing Wen, “VLSI Test Principles and Architectures: Design for Testability”, Morgan Kaufmann; Academic Press; Newnes (781)- 2006-313-4732.
[2] N.A. Touba, "Survey of Test Vector Compression Techniques", IEEE Design & Test Magazine, Vol. 23, Issue 4, Jul. 2006, pp-294-303.
[3] Kalamani. C and Dr. K. Paramasivam, “Survey of Low Power Testing Using Compression Techniques'', International Journal of Electronics & Communication Technology , Vol.4, Issue 4, Oct-Dec 2013,pp. 13-18.
[4] V. Iyengar, K. Chakrabarty, and B. T. Murray, “Huffman encoding of test sets for sequential circuits'', IEEE Transactions on Instrumentation and Measurement, vol. 47, February 1998, pp. 21-25.
[5] A. Jas, and N. A. Touba, et al, “An efficient Test vector compression scheme using selective Huffman coding”,IEEE Trans Comput-Aided Des Integr, Circuits Syst.,vol.22,no.6,jun.2003, pp.797-806.
[6] X. Kavousianos, E. Kalligeros and D. Nikolos, “Optical selective Huffman Coding for test data compression”, IEEE Trans comput, vol.56, no.8, Aug.2007, pp.1146-1152.
[7] Gonciari. P. T., “Variable length input Huffman coding for system-on-achip test”, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., vol. 22, no.6, Jun.2003, pp. 783–796.
[8] Chandra and K. Chakrabarty, “System-on-a-chip data compression and decompression architecture based on Golomb codes,” IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., vol. 20, no. 3, Mar. 2001, pp. 355–368.
[9] A. Chandra and K. Chakrabarty, “Test Data Compression and Test Resource Partitioning for system on chip using Frequency Directed Run length coding”, IEEE Trans. Comput., vol.52,no8, Mar 2003, pp. 352- 363.
[10] Aiman El-Maleh et al, “Test Data Compression for System-on-a-Chip using Extended Frequency-Directed Run-Length (EFDR) Code,” IET Computers & Digital Techniques, vol. 2, No. 3, 2008, pp. 155–163.
[11] M. Nourani and M. Tehranipour, “RL-Huffman encoding for test compression and power reduction in scan application”, ACM Trans.Des. Automat Electron Syst., vol.10, no.1, 2005, pp. 91-115.
[12] Lung-Jen Lee, Wang-Dauh Tseng, and Rung-Bin Lin, “An Internal Pattern Run-Length Methodology for Slice Encoding”, ETRI Journal, Volume 33, Number 3, June 2011.
[13] H. Hashempour, L. Schiano, and F. Lombardi, “Error-resilient test data compression using Tunstall codes”, in Proc. IEEE Int. Symp. DefectFault Tolerance VLSI Syst., 2004, pp. 316–323.
[14] M. Knieser, F. Wolff, C. Papachristou, D. Weyer, and D. McIntyre, “A technique for high ratio LZW compression”, in Proc. Des., Autom., Test Eur., 2003, pp. 10116.
[15] M. Tehranipour, M. Nourani, and K. Chakrabarty, “Nine-coded compression technique for testing embedded cores in SOCs”, IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 13, Jun. 2005, pp. 719–731.
[16] L. Lingappan, S. Ravi, et al, “Test-volume reduction in systems-on-achip using heterogeneous and multilevel compression techniques”, IEEE Trans.Comput.-Aided Des Integr. Circuits Syst., vol. 25, no. 10, Oct. 2006, pp.2193–2206.
[17] X. Kavousianos, E. Kalligeros, and D. Nikolos, “Multilevel Huffman coding: An efficient test-data compression method for IP cores”, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., vol. 26, no. 6, Jun. 2007 pp.1070–1083.
[18] Seok-Won Seong and Prabhat Mishra, “Bitmask-Based Code Compression for Embedded Systems”, IEEE Transactions on computeraided design of integrated circuits and systems, 2008.
[19] Kanad Basu, Prabhat Mishra, “Test Data Compression Using Efficient Bitmask and Dictionary Selection”, IEEE Transactions on Very Large Scale Integration (VLSI) systems, vol. 18, no. 9, September 2010.
[20] Lung-Jen Lee, et al, “2n Pattern Run-Length for Test Data Compression”, IEEE transactions on computer- aided design of integrated circuits and systems, vol. 31, no. 4, April 2012.
[21] Wang-Dauh Tseng & Lung-Jen Lee, “A Multidimensional Pattern Run Length method for test data compression”, in proc. Asian Test Symp, 2009, pp. 111-116.