%0 Journal Article
	%A C. Kalamani and  K. Paramasivam
	%D 2015
	%J International Journal of Computer and Information Engineering
	%B World Academy of Science, Engineering and Technology
	%I Open Science Index 99, 2015
	%T Test Data Compression Using a Hybrid of Bitmask Dictionary and 2n Pattern Runlength Coding Methods
	%U https://publications.waset.org/pdf/10002446
	%V 99
	%X In VLSI, testing plays an important role. Major
problem in testing are test data volume and test power. The important
solution to reduce test data volume and test time is test data
compression. The Proposed technique combines the bit maskdictionary
and 2n pattern run length-coding method and provides a
substantial improvement in the compression efficiency without
introducing any additional decompression penalty. This method has
been implemented using Mat lab and HDL Language to reduce test
data volume and memory requirements. This method is applied on
various benchmark test sets and compared the results with other
existing methods. The proposed technique can achieve a compression
ratio up to 86%.
	%P 831 - 836