Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 30309
Development of Material Analyzing Software Using X-Ray Diffraction

Authors: Le Chi Cuong

Abstract:

X-ray diffraction is an effective mean for analyzing material properties. This paper developed a new computational software for determining the properties of crystalline materials such as elastic constants, residual stresses, surface hardness, phase components, and etc. The results computed from the X-ray diffraction method were compared to those from the traditional methods and they are in the 95% confidential limits, showing that the newly developed software has high reproducibility, opening a possibility of its commercialization.

Keywords: Nondestructive Evaluation, Hardness, Residual Stress, X-Ray Diffraction, Phase determination

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1091658

Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1632

References:


[1] V. Hauk, Structural and Residual Stress Analysis by Nondestructive Method, Elsevier, 1997,pp 136-168
[2] Lu, J. et al., (1996), Handbook of Measurement of Residual Stress, Society for Experimental Mechanics, The Fairmont Press Inc., 225-231.
[3] Noyan I. C. and Cohen J. B.; Residual Stress Measurement by Diffraction and Interpretation, New York: Springer-Verlag; 1987.
[4] B. D. Culity, Element of X – Ray Diffraction, Prentice Hall Upper Ssddle River, 2001, pp. 256-270.
[5] Le Chi Cuong, Development of Automated X – Ray Stress Measurement with Its Application, Doctoral Thesis, Nagaoka UT, Japan, 2004.
[6] Lê Chí Cương and Lê Hoàng Anh, Structural Analysis for Nano Ceria Using Fourier Analysis for X-Ray Diffraction Line, The 2012 International Conference on Green Technology and Sustainable Development , 2012, pp.255-259.
[7] Lê Chí Cương and Văn Quốc Hữu, Xác định tỷ lệ pha của thép không gỉ song pha Ferrit và Austenite có đề bền cao bằng nhiễu xạ x-quang, Luận văn thạc sĩ ĐH Sư Phạm Kỹ Thuật TP.HCM, 2011.
[8] Le Chi Cuong, Determination of Hardness Of Quenched And Tempered Steel Using X-Ray Diffraction, Journal of Vietnam Mechanics, No. 4, 2013, pp.54-58.
[9] Andrew Hind, The determination of thin film thickness using reflectance spectroscopy, Agilent Technology, Mar. 2011.
[10] Le Chi Cuong, Development of a New Automated X-Ray Stress Analyzer, The Japanese Society for Non-Destructive Inspection, No. 21-25, 1999, pp. 389-394.
[11] Trần Đình Huế, Nguyễn Mạnh Hùng, Orientation Programming, 2013, (to be published).
[12] Erik Brown, Windows Forms Programming with C#, Manning Publications Co., 2002.
[13] Ian Griffiths, Matthew Adams, Jesse Liberty, Programming C# 4.0, O’Reilly, 2010.
[14] L.C. Cương and M. Kurita, Absorption Factor and Influence of LPA Factor on Stress and Diffraction Line Width in X-Ray Stress Measurement With and Without Restriction of X-Ray Diffraction Area, The Japanese Society for Experimental Mechanics, 2004, pp.37-43.
[15] Lê Chí Cương and Nguyễn Thị Kim Uyên, Residual Stress Determination of Friction Stir Welding of 1060 Aluminum Alloy Using X-Ray Diffraction, Journal of Technical Education, UTE-HCMC, No. 25, 2013.