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Design for Reliability and Manufacturing Yield (Study and Modeling of Defects in Integrated Circuits for their Reliability Analysis)
Abstract:In this document, we have proposed a robust conceptual strategy, in order to improve the robustness against the manufacturing defects and thus the reliability of logic CMOS circuits. However, in order to enable the use of future CMOS technology nodes this strategy combines various types of design: DFR (Design for Reliability), techniques of tolerance: hardware redundancy TMR (Triple Modular Redundancy) for hard error tolerance, the DFT (Design for Testability. The Results on largest ISCAS and ITC benchmark circuits show that our approach improves considerably the reliability, by reducing the key factors, the area costs and fault tolerance probability.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1072690Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1685
 International Technology Roadmap for Semiconductors (ITRS), Edition 2007
 M. Cimino, "Design of circuits radio frequencies under constraints of extended reliability", thesis of doctorate, University of Bordeaux I, 2007
 A.Machouat, "Development and application of a method of analysis of functional failures and contribution to the improvement of the use of the static and dynamic optical techniques", thesis of doctorate, University of Bordeaux I, 2008.
 A. Bounceur, "Platform CAD for the test of mixed circuits", thesis of doctorate, Institut National Polytechnique of Grenoble
 J. Han and P. Jonker,"Toward hardware redundant, fault tolerant logic for Nanoeletronics", IEEE Design & Test off computer, Vol.22, No.4, 2005
 M. Hafezparast,"tolerant Fault hardware designs and to their reliability analysis", thesis of doctorate, Brunel university of west London, 1990.
 C.H. Stapper "Yield model for fault clusters within integrated circuits", IBM Newspaper off Research and Development, vol. 28, N┬░5, the USA 1984.
 D.P. Siewiorek, R.S.Swarz" Applicable Systems Computer, Design and Evaluation " ED. DIGITAL Close 1992
 Web site,www.vtvt.ece.vt.edu/vlsidesign/cadtools.php
 C. Edmond Bichot, "Development of a metheuristic news for the airspace division", thesis of doctorate, Institut National Polytechnique of Toulouse, 2007.