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    G. Ait Abdelmalek and  R. Ziani,  Design for Reliability and Manufacturing Yield (Study and Modeling of Defects in Integrated Circuits for their Reliability Analysis).   journal   = {International Journal of Industrial and Manufacturing Engineering}, [online]. World Academy of Science, Engineering and Technology.
    November 2012, vol. 71(11). 2496 - 2499
    [viewed 25 April 2024]. Available from: https://publications.waset.org/pdf/9396.