Commenced in January 2007
Paper Count: 30831
In-Situ Monitoring the Thermal Forming of Glass and Si Foils for Space X-Ray Telescopes
Abstract:We developed a non-contact method for the in-situ monitoring of the thermal forming of glass and Si foils to optimize the manufacture of mirrors for high-resolution space x-ray telescopes. Their construction requires precise and light-weight segmented optics with angular resolution better than 5 arcsec. We used 75x25 mm Desag D263 glass foils 0.75 mm thick and 0.6 mm thick Si foils. The glass foils were shaped by free slumping on a frame at viscosities in the range of 109.3-1012 dPa·s, the Si foils by forced slumping above 1000°C. Using a Nikon D80 digital camera, we took snapshots of a foil-s shape every 5 min during its isothermal heat treatment. The obtained results we can use for computer simulations. By comparing the measured and simulated data, we can more precisely define material properties of the foils and optimize the forming technology.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1329228Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1307
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 W. W. Zhang, M. Atanassova, P. Augustin, P. N. Blake, G. Byron, T. Carnahan, K. W. Chan, C. Fleetwood, C. He, M. D. Hill, M. Hong, L. Kolos, J. P. Lehan, J. R. Mazzarella, R. McClelland, L. Olsen, R. Petre, D. Robinson, R. Russell, T. T. Saha, M. Sharpe, M. V. Gubarev, W. D. Jones, S. L. O'Dell, W. Davis, D. R. Caldwell, M. Freeman, W. A. Podgorski, and P. B. Reid, "Mirror technology development for the International X-ray Observatory mission," Proc. SPIE, vol. 7437, 0Q:1- 12, 2009.
 M. Ghigo, S. Basso, M. Bavdaz, P. Conconi, O. Citterio, M. Civitani, P. Friedrich, D. Gallieni, B. Guldimann, F. Martelli, R. Negri, G. Pagano, G. Pareschi, G. Parodi, L. Proserpio, B. Salmaso, F. Scaglione, D. Spiga, G. Tagliaferri, L. Terzi, M. Tintori, M. Vongehr, E. Wille, A. Winter and A. Zambra, "Hot slumping glass technology for the grazing incidence optics of future missions with particular reference to IXO," Proc. SPIE, vol. 7732, pp.0C:1-12, 2010.
 Y. Ezoe, T. Shirata, T. Ohashi, M. Ishida, K. Mitsuda, K. Fujiwara, K. Morishita and K. Nakajima, "Development of high-resolution and lightweight x-ray optics with deformed silicon wafers," Proc. SPIE, vol. 7360, pp. 0B:1-8, 2009.
 M. J. Collon, R. G├╝nther, M. Ackermann, R. Partapsing, G. Vacanti, M. W. Beijersbergen, M. Bavdaz, E. Wille, K. Wallace, M. Olde Riekerink, B. Lansdorp, L. de Vrede, L., C. van Baren, P. M├╝ller, M. Krumrey, and M. Freyberg, "Silicon-pore x-ray optics for IXO", Proc. SPIE, vol. 7732, pp. 1F:1-9, 2010.
 R. Hudec, L. Pina, V. Semencova, A. Inneman, M. Skulinova, L. Sveda, M. Mika, V. Brozek, R. Kacerovsky, J. Prokop, J. Sik, "Si and glass - novel technologies for space," Nuclear Physics B, vol. 166, pp. 258-261, 2007.
 R. Hudec, V. Marsikova, M. Mika, J. Sik, M. Lorenc, L. Pina, A. Inneman, M. Skulinova, "Advanced x-ray optics with Si wafers and slumped glass," Proc. SPIE, vol. 7437, pp. 0S:1-12, 2009.
 H. Wolter, "Spiegelsysteme streifenden Einfalls als abbildende Optiken f├╝r Röntgenstrahlen (Grazing incidence mirror systems as imaging optics for x rays)," AnP, vol. 445, pp. 94-114, 1952.
 L. Prosperio, M. Civitani, M. Ghigo, and G. Pareschi, "Thermal shaping of thin glass substrates for segmented grazing incidence active optics," Proc. SPIE, vol. 7803, pp. 0K:1-11, 2010.
 K. Nakajima, K. Fujiwara, and K. Morishita, "Systematic studies of Si and Ge hemispherical concave wafers prepared by plastic deformation," J. Cryst. Growth, vol. 311, pp. 4587-4592, 2009.
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