Image Sensor Matrix High Speed Simulation
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 32807
Image Sensor Matrix High Speed Simulation

Authors: Z. Feng, V. Viswanathan, D. Navarro, I. O'Connor

Abstract:

This paper presents a new high speed simulation methodology to solve the long simulation time problem of CMOS image sensor matrix. Generally, for integrating the pixel matrix in SOC and simulating the system performance, designers try to model the pixel in various modeling languages such as VHDL-AMS, SystemC or Matlab. We introduce a new alternative method based on spice model in cadence design platform to achieve accuracy and reduce simulation time. The simulation results indicate that the pixel output voltage maximum error is at 0.7812% and time consumption reduces from 2.2 days to 13 minutes achieving about 240X speed-up for the 256x256 pixel matrix.

Keywords: CMOS image sensor, high speed simulation, image sensor matrix simulation.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1332570

Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1954

References:


[1] E. R. Fossum, "CMOS Image Sensor: Electronic Camera-on-A-chip", IEEE Transactions On Electronic Devices, vol. 44, N.10, 1997.
[2] M.Bigas, "Review of CMOS image sensors" Microelectronics journal 37(2006) 433-451.
[3] T. Reiner, "CMOS Image Sensor 3T Nwell Photodiode Pixel Spice Model" 23rd IEEE Convention of Electrical and Electronics Engineers in Israel. pp 161-164, 6-7 Sept. 2004.
[4] A. El Gamal, "High dynamic range image sensors," Tutorial at International Solid-State Circuits Conference, February 2002.
[5] F. Dadouche, A. Pima, P. Garda, A. Alexandre. Modeling of Pixel Sensors for Image Systems with VHDL-AMS. Proc IEEE DTIS, Tunisia, September 5-7, 2006. pp. 289-293.
[6] D. Navarro, D. Ramat, F. Mieyeville, I. O'Connor, F. Gaffiot, L. Carrel, "VHDL & VHDL-AMS modeling and simulation of a CMOS imager IP", Forum on specification & Design Languages, Lausanne, Switzerland, September 2005.
[7] N. V. Loukianova, "Leakage current modeling of test structures for characterization of dark current in CMOS image sensors," IEEE Trans. Electron Dev., vol. 50, no. 1, pp. 77 - 83, 2003
[8] M. White, D. Lampe, F. Blaha, and I. Mack, "Characterization of surface channel CCD image arrays at low light levels" IEEE J. Solid-State Circuits, vol. SC-9, pp. 1-13, Sept. 1974.
[9] D. Navarro, Z. Feng, V. Viswanathan, L. Carrel, I. O'Connor, "Image toolbox for CMOS image sensors simulations in Cadence ADE", DeMset2011 conference, Orlando, Florida, USA, Dec 2011.
[10] Cadence User Guide