2D Gabor Functions and FCMI Algorithm for Flaws Detection in Ultrasonic Images
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 33093
2D Gabor Functions and FCMI Algorithm for Flaws Detection in Ultrasonic Images

Authors: Kechida Ahmed, Drai Redouane, Khelil Mohamed

Abstract:

In this paper we present a new approach to detecting a flaw in T.O.F.D (Time Of Flight Diffraction) type ultrasonic image based on texture features. Texture is one of the most important features used in recognizing patterns in an image. The paper describes texture features based on 2D Gabor functions, i.e., Gaussian shaped band-pass filters, with dyadic treatment of the radial spatial frequency range and multiple orientations, which represent an appropriate choice for tasks requiring simultaneous measurement in both space and frequency domains. The most relevant features are used as input data on a Fuzzy c-mean clustering classifier. The classes that exist are only two: 'defects' or 'no defects'. The proposed approach is tested on the T.O.F.D image achieved at the laboratory and on the industrial field.

Keywords: 2D Gabor Functions, flaw detection, fuzzy c-mean clustering, non destructive testing, texture analysis, T.O.F.D Image (Time of Flight Diffraction).

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1062172

Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1750

References:


[1] S W. Lawson and G.A. Parker "Automatic detection of defects in industrial ultrasound images using a neural network", Proc. of Int. Symposium on Lasers, Optics, and Vision for Productivity in Manufacturing I (Vision Systems: Applications), June 1996, Proc. of SPIE vol. 2786, pp. 37-47, 1996.
[2] Kumar, A, Pang, G K H, 2002: Defect Detection in Textured Materials Using Gabor Filters. IEEE Transactions on Industry Applications, 38(2):425-440.
[3] M.Friedman, A.Kandel, "introduction to the pattern recognition, statistical, structural, neural and fuzzy logic approaches" Ed imperial college Press 1999.
[4] SILK, M.G., "The use of diffraction based time-of-flight measurements to locate and size defects", Brit. J. of NDT, vol. 26, 1984, pp 208-213.
[5] SILK, M.G., "The rapid analysis of TOFD data incorporating the provisions of standards", in Proc. of 6thEuropean Conf on NDT, 1994, pp 25-29.