Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 31093
Some Aspects Regarding I. R. Absorbing Materials Based On Thin Alumina Films for Solar-Thermal Energy Conversion, Using X-Ray Diffraction Technique

Authors: Sorina Adriana Mitrea, Silvia Maria Hodorogea, Anca Duta, Luminita Isac, Elena Purghel, Mihaela Voinea


Solar energy is the most “available", ecological and clean energy. This energy can be used in active or passive mode. The active mode implies the transformation of solar energy into a useful energy. The solar energy can be transformed into thermal energy, using solar collectors. In these collectors, the active and the most important element is the absorber, material which performs the absorption of solar radiation and, in at the same time, limits its reflection. The paper presents some aspects regarding the IR absorbing material – a type of cermets, used as absorber in the solar collectors, by X Ray Diffraction Technique (XRD) characterization.

Keywords: Solar energy, X-Ray Diffraction, Alumina films

Digital Object Identifier (DOI):

Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1253


[1] Bostrom T, Westin G, Wackelgard E, "Optimization of a solution chemically derived solar absorbing spectrally selective surface" , Solar Energy Materials& Solar Cells , 91, 2007, 38-43.
[2] Guzman-Mendoza J., Garcia-Hipolito M., Aguilar-Frutis M., Falcony- Guajardo C., "Structural characteristics of Al2O3 thin films prepared by spray pyrolysis", J. Phys.: Condens. Matter 13, 2001, L955-959
[3] Takamura-Yamada Y., Koch F., Maier H, Bolt H., "Characteriazation of ╬▒-phase aluminium oxide films deposited by filtered vacuum arc", Surface and Coatings Technology, 142-144, 2001, 260-264.
[4] Chrysson C.E., Pitt C.W, "Al2O3 thin films by plasma enhanced chemical vapor deposition using trimethyl-amine (TMMA) as the Al precursor", Appl. Phys., A 65, 1997, 469-475.
[5] P.S. Patil, L.D. Kadam, Preparation and characterization of spray pyrolyzed nickeloxide (NiO) thin films, Applied Surface Science 199 (2002) 211-221.