Feature Extraction for Surface Classification – An Approach with Wavelets
Surface metrology with image processing is a challenging task having wide applications in industry. Surface roughness can be evaluated using texture classification approach. Important aspect here is appropriate selection of features that characterize the surface. We propose an effective combination of features for multi-scale and multi-directional analysis of engineering surfaces. The features include standard deviation, kurtosis and the Canny edge detector. We apply the method by analyzing the surfaces with Discrete Wavelet Transform (DWT) and Dual-Tree Complex Wavelet Transform (DT-CWT). We used Canberra distance metric for similarity comparison between the surface classes. Our database includes the surface textures manufactured by three machining processes namely Milling, Casting and Shaping. The comparative study shows that DT-CWT outperforms DWT giving correct classification performance of 91.27% with Canberra distance metric.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1057971Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1833
 ASME B46.1, Surface texture (Surface roughness, waviness and lay), 1995.
 N. G. Kingsbury, "Image processing with complex wavelets," Phil. Trans. Roy. Soc. London A, vol. 357, pp.2543-2560, September 1999.
 N. G. Kingsbury, "Complex wavelets for shift invariant analysis and filtering of signals," Journal of applied and computational harmonic analysis, Vol. 10, No.3, pp.234-253, May 2001.
 W. Zeng, X. Jiang, and P. Scott, "Metrological characteristics of dualtree complex wavelet transform for surface analysis," Meas. Sci. Technol., 16, pp. 1410-1417, 2005.
 J. Canny, "A computational approach to edge detection," IEEE Trans. on Pattern Analysis and Machine Intelligence, PAMI-8, no. 6, pp. 679- 698, 1986.
 R. C. Gonzalez, R. E. Woods, and S. L. Eddins, Digital Image Processing Using Matlab, 1st Indian Reprint, Pearson Education, 2004, ch. 7.
 S. H. Bhandari and S. M. Deshpande, "Wavelets for surface Metrology," Accepted for presentation in international conference ACVIT, Nov. 2007.