A Neural-Network-Based Fault Diagnosis Approach for Analog Circuits by Using Wavelet Transformation and Fractal Dimension as a Preprocessor

Authors: Wenji Zhu, Yigang He

Abstract:

This paper presents a new method of analog fault diagnosis based on back-propagation neural networks (BPNNs) using wavelet decomposition and fractal dimension as preprocessors. The proposed method has the capability to detect and identify faulty components in an analog electronic circuit with tolerance by analyzing its impulse response. Using wavelet decomposition to preprocess the impulse response drastically de-noises the inputs to the neural network. The second preprocessing by fractal dimension can extract unique features, which are the fed to a neural network as inputs for further classification. A comparison of our work with [1] and [6], which also employs back-propagation (BP) neural networks, reveals that our system requires a much smaller network and performs significantly better in fault diagnosis of analog circuits due to our proposed preprocessing techniques.

Keywords: Analog circuits, fault diagnosis, tolerance, wavelettransform, fractal dimension, box dimension.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1327776

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