Chose the Right Mutation Rate for Better Evolve Combinational Logic Circuits
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Chose the Right Mutation Rate for Better Evolve Combinational Logic Circuits

Authors: Emanuele Stomeo, Tatiana Kalganova, Cyrille Lambert

Abstract:

Evolvable hardware (EHW) is a developing field that applies evolutionary algorithm (EA) to automatically design circuits, antennas, robot controllers etc. A lot of research has been done in this area and several different EAs have been introduced to tackle numerous problems, as scalability, evolvability etc. However every time a specific EA is chosen for solving a particular task, all its components, such as population size, initialization, selection mechanism, mutation rate, and genetic operators, should be selected in order to achieve the best results. In the last three decade the selection of the right parameters for the EA-s components for solving different “test-problems" has been investigated. In this paper the behaviour of mutation rate for designing logic circuits, which has not been done before, has been deeply analyzed. The mutation rate for an EHW system modifies the number of inputs of each logic gates, the functionality (for example from AND to NOR) and the connectivity between logic gates. The behaviour of the mutation has been analyzed based on the number of generations, genotype redundancy and number of logic gates for the evolved circuits. The experimental results found provide the behaviour of the mutation rate during evolution for the design and optimization of simple logic circuits. The experimental results propose the best mutation rate to be used for designing combinational logic circuits. The research presented is particular important for those who would like to implement a dynamic mutation rate inside the evolutionary algorithm for evolving digital circuits. The researches on the mutation rate during the last 40 years are also summarized.

Keywords: Design of logic circuit, evolutionary computation, evolvable hardware, mutation rate.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1075456

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