Search results for: tSAW
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 2

Search results for: tSAW

2 Particle Gradient Generation in a Microchannel Using a Single IDT

Authors: Florian Kiebert, Hagen Schmidt

Abstract:

Standing surface acoustic waves (sSAWs) have already been used to manipulate particles in a microfluidic channel made of polydimethylsiloxan (PDMS). Usually two identical facing interdigital transducers (IDTs) are exploited to form an sSAW. Further, it has been reported that an sSAW can be generated by a single IDT using a superstrate resonating cavity or a PDMS post. Nevertheless, both setups utilising a traveling surface acoustic wave (tSAW) to create an sSAW for particle manipulation are costly. We present a simplified setup with a tSAW and a PDMS channel to form an sSAW. The incident tSAW is reflected at the rear PDMS channel wall and superimposed with the reflected tSAW. This superpositioned waves generates an sSAW but only at regions where the distance to the rear channel wall is smaller as the attenuation length of the tSAW minus the channel width. Therefore in a channel of 500µm width a tSAW with a wavelength λ = 120 µm causes a sSAW over the whole channel, whereas a tSAW with λ = 60 µm only forms an sSAW next to the rear wall of the channel, taken into account the attenuation length of a tSAW in water. Hence, it is possible to concentrate and trap particles in a defined region of the channel by adjusting the relation between the channel width and tSAW wavelength. Moreover, it is possible to generate a particle gradient over the channel width by picking the right ratio between channel wall and wavelength. The particles are moved towards the rear wall by the acoustic streaming force (ASF) and the acoustic radiation force (ARF) caused by the tSAW generated bulk acoustic wave (BAW). At regions in the channel were the sSAW is dominating the ARF focuses the particles in the pressure nodes formed by the sSAW caused BAW. On the one side the ARF generated by the sSAW traps the particle at the center of the tSAW beam, i. e. of the IDT aperture. On the other side, the ASF leads to two vortices, one on the left and on the right side of the focus region, deflecting the particles out of it. Through variation of the applied power it is possible to vary the number of particles trapped in the focus points, because near to the rear wall the amplitude of the reflected tSAW is higher and, therefore, the ARF of the sSAW is stronger. So in the vicinity of the rear wall the concentration of particles is higher but decreases with increasing distance to the wall, forming a gradient of particles. The particle gradient depends on the applied power as well as on the flow rate. Thus by variation of these two parameters it is possible to change the particle gradient. Furthermore, we show that the particle gradient can be modified by changing the relation between the channel width and tSAW wavelength. Concluding a single IDT generates an sSAW in a PDMS microchannel enables particle gradient generation in a well-defined microfluidic flow system utilising the ARF and ASF of a tSAW and an sSAW.

Keywords: ARF, ASF, particle manipulation, sSAW, tSAW

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1 Particle Deflection in a PDMS Microchannel Caused by a Plane Travelling Surface Acoustic Wave

Authors: Florian Keipert, Hagen Schmitd

Abstract:

The size selective separation of different species in a microfluidic system is an actual task in biological or medical research. Former works dealt with the utilisation of the acoustic radiation force (ARF) caused by a plane travelling Surface Acoustic Wave (tSAW). In literature the ARF is described by a dimensionless parameter κ, depending on the wavelength and the particle diameter. To our knowledge research was done for values 0.2 < κ < 5.8 showing that the ARF is dominating the acoustic streaming force (ASF) for κ > 1.2. As a consequence the particle separation is limited by κ. In addition the dependence on the electrical power level was examined but only for κ > 1 pointing out an increased particle deflection for higher electrical power levels. Nevertheless a detailed study on the ASF and ARF especially for κ < 1 is still missing. In our setup we used a tSAW with a wavelength λ = 90 µm and 3 µm PS particles corresponding to κ = 0.3. Herewith the influence of the applied electrical power level on the particle deflection in a polydimethylsiloxan micro channel was investigated. Our results show an increased particle deflection for an increased electrical power level, which coincides with the reported results for κ > 1. Therefore particle separation is in contrast to literature also possible for lower κ values. Thereby the experimental setup can be generally simplified by a coordinated electrical power level for the specific particle size. Furthermore this raises the question of whether this particle deflection is caused only by the ARF as adopted so far or by the ASF or the sum of both forces. To investigate this fact a 0% - 24% saline solution was used and thus the mismatch between the compressibility of the PS particle and the working fluid could be changed. Therefore it is possible to change the relative strength between ARF and ASF and consequently the particle deflection. We observed a decreasing in the particle deflection for an increased NaCl content up to a 12% saline solution and subsequently an increasing of the particle deflection. Our observation could be explained by the acoustic contrast factor Φ, which depends on the compressibility mismatch. The compressibility of water is increased by the NaCl and the range of a 0% - 24% saline solution covers the PS particle compressibility. Hence the particle deflection reaches a minimum value for the accordance between compressibility of PS particle and saline solution. This minimum value can be estimated as the particle deflection only caused by the ASF. Knowing the particle deflection due to the ASF the particle deflection caused by the ARF can be calculated and thus finally the relation between both forces. Concluding, the particle deflection and therefore the size selective particle separation generated by a tSAW can be achieved for values κ < 1, simplifying actual setups by adjusting the electrical power level. Beyond we studied for the first time the relative strength between ARF and ASF to characterise the particle deflection in a microchannel.

Keywords: ARF, ASF, particle separation, saline solution, tSAW

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