Structural, Optical and Ferroelectric Properties of BaTiO3 Sintered at Different Temperatures

Authors: Anurag Gaur, Neha Sharma

Abstract:

In this work, we have synthesized BaTiO₃ via sol gel method by sintering at different temperatures (600, 700, 800, 900, 1000⁰C) and studied their structural, optical and ferroelectric properties through X-ray diffraction (XRD), UV-Vis spectrophotometer and PE Loop Tracer. X-ray diffraction patterns of barium titanate samples show that the peaks of the diffractogram are successfully indexed with the tetragonal and cubic structure of BaTiO₃. The Optical band gap calculated through UV Visible spectrophotometer varies from 4.37 to 3.80 eV for the samples sintered at 600 to 1000⁰C, respectively. The particle size calculated through transmission electron microscopy varies from 20 to 40 nm for the samples sintered at 600 to 1000⁰C, respectively. Moreover, it has been observed that the ferroelectricity increases as we increase the sintering temperature.

Keywords: Nanostructures, Ferroelectricity, Sol-gel method.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1335936

References:

[1] N. Sasirekha, B. Rajesh, Yu-Wen Chen, Ind. Chem. Res. 47, 1868 (2008).
[2] T.K. Kundu, A Jana, P. Barik, Bull. Mater.Sci. 31, 3 (2008).
[3] T. Yogo, T. Yamamoto, W. Sakamoto, S. Hirano, J. Mater. Res. 19, 3290 (2004).
[4] L. Huang, Z. Chen, J.D. Wilson, S. Banerjee, R.D. Robinson, I.P. Herman, R. Laibowitz, S. O’Brien, J. Appl. Phys. 100, 034316 (2006).
[5] W.F. Zhang, Z. Yin, M.S. Zhang, Appl. Phys. A 70 (2000) 93-96.
[6] T. Takagahara, K. Takeda, Phys. Rev. B 46 (1992) 15578-15581.
[7] J. Yu, J. Sun, J. Chu, D. Tang, Appl. Phys. Lett. 77 (2000) 2807-2810.
[8] J. H. Herbert, Ceramic Dielectrics and Capacitors (Gordon and Breach, New York, 1985).
[9] H. G. Lee and H. G. Kim, J. Appl. Phys. 67, 2024 (1990).
[10] F. Zimmermann, M. Voigts, and C. Weil, J. Eur. Ceram. Soc. 21, 2019 (2001).
[11] K. Kinoshita and A. Yamaji, J. Appl. Phys. 47, 371 (1976).
[12] A. J. Bell, A. J. Moulson, and L. E. Cross, Ferroelectrics 54, 147 (1984).
[13] G. Arlt, D. Hennings, and G. De With, J. Appl. Phys. 58, 1619 (1985).
[14] K. Uchino, E. Sadanaga, and T. Hirose, J. Am. Ceram. Soc. 72, 1555 (1989).
[15] M. H. Frey and D. A. Payne, Phys. Rev. B 54, 3158 (1996).
[16] S. Wada, T. Suzuki, and T. Noma, J. Ceram. Soc. Jpn. 104, 383 (1996).
[17] D. McCauley, R. E. Newnham, and C. A. Randall, J. Am. Ceram. Soc. 81, 979 (1998).
[18] Z. Zhao, V. Buscaglia, M. Viviani, M. T. Buscaglia, L. Mitoseriu, A. Testino, M. Nygren, M. Johnsson, and P. Nanni, Phys. Rev. B 70 024107 (2004).
[19] W. L. Zhong, Y. G. Wang, P. L. Zhang, and B. D. Qu, Phys. Rev. B 50, 698 (1994).
[20] S. Wada, H. Yasuno, T. Hoshina, S.-M. Nam, H. Kakemoto, and T. Tsurumi, Jpn. J. Appl. Phys., Part 1 42, 6188 (2003).
[21] S. Wada, A. Yazawa, T. Hoshina, Y. Kameshima, H. Kakemoto, T. Tsurumi, and Y. Kuroiwa, IEEE Trans. Ultrason. Ferroelectr. Freq. Control 55, 1895 (2008).
[22] L. Qi, B.I. Lee, P. Badhekab, L.-Q. Wang, P. Gilmour, W.D. Samuels, G.J. Exarhos, Mater. Lett. 59 (2005) 5794.
[23] L. Qi, B.I. Lee, P. Badheka, D.-H. Yoon, W.D. Samuels, G.J. Exarhos, J. Eur. Ceram. Soc. 24 (2004) 3553.
[24] M.M. Lencka, R.E. Riman, Chem. Mater. 5 (1993) 61.
[25] C. Beck, W. Hartl, R. Hempelman, J. Mater. Res. 13 (1998) 3174.
[26] J. Wang, J. Fang, S.C. Ng, L.M. Gan, C.H. Chew, X. Wang, Z. Shen, J. Am. Ceram. Soc. 82 (1999) 873.
[27] Y. Kobayashi, A. Nishikata, T. Tanase, M. Konno, Sol–Gel. Sci. Technol. 29 (2004) 49.
[28] W. Li, et al, J. Alloys Comp. 482 (2009) 137–140.
[29] B.D. Cullity, Elements of X-Ray Diffractions, Addison-Wesley, Reading, MA, (1978).
[30] O. Harizanov, A. Harizanova, T. Ivanova, Mater. Sci. Eng. B 106 (2004) 191.
[31] S. Lee, T. Son, J. Yun, H. Kwon, G.L. Messing, B. Jun, B. Mater. Lett. 58 (2004) 2932.
[32] M.M. Lencka, R.E. Riman, Chem. Mater. 7 (1995) 18.
[33] J.C. Tauc, Amorphous and Liquid Semiconductor, Plenum Press, New York, 1974 (p.159).
[34] O. Harizanov, A. Harizanova, T. Ivanova, Mater. Sci. Eng. B 106 (2004) 191–195.
[35] R. Ashiri, A. Nemati, M.S. Ghamsari, H. Aadelkhani, J. Non-Cryst. Solids 355 (2009)2480–2484.
[36] R. Thomas, D.C. Dube, M.N. Kamalasanan, S. Chandra, Thin Solid Films 346 (1999) 212–225.
[37] H.X. Zhang, C.H. Kam, Y. Zhou, X.Q. Han, Y.L. Lam, Y.C. Chan, K. Pita, Mater. Chem. Phys. 63 (2000) 174–177.