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Geometric Modeling of Illumination on the TFT-LCD Panel using Bezier Surface

Authors: Kyong-min Lee, Moon Soo Chang, PooGyeon Park


In this paper, we propose a geometric modeling of illumination on the patterned image containing etching transistor. This image is captured by a commercial camera during the inspection of a TFT-LCD panel. Inspection of defect is an important process in the production of LCD panel, but the regional difference in brightness, which has a negative effect on the inspection, is due to the uneven illumination environment. In order to solve this problem, we present a geometric modeling of illumination consisting of an interpolation using the least squares method and 3D modeling using bezier surface. Our computational time, by using the sampling method, is shorter than the previous methods. Moreover, it can be further used to correct brightness in every patterned image.

Keywords: Illumination, Inspection, Geometric Modeling, defect, panel, LCD, Bezier

Digital Object Identifier (DOI):

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[1] J. H. Kim, S. Ahn, J. W. Jeon, and J. E. Byun,"A High-speed Highresolution Vision System for the Inspection of TFT LCD", Proceedings, ISIE 2001, IEEE International Symposium, vol.1, 2001, pp.101-105.
[2] K. Nakashima, "Hybrid Inspection System for LCD Color Filter Panels", 10th International Conference on Instrumentation and Measurement Technology, Hamamatsu, Japan, 1994, pp. 689-692.
[3] C. L. Chang, H. H. Chang, C. P. Hsu, "An intelligent defect inspection technique for color filter", Proceedings of the 2005 IEEE International Conference on Mechatronics, Tiwan, 2005.
[4] Y. Zhang, J. Zhang, "A fuzzy neural network approach for quantitative evaluation of mura in TFT-LCD", Neural Networks and Brain, 2005. ICNN&B -05, Vol.1, 2005, pp.424-427.
[5] K. B. Lee, M. S. Ko, J. J. Lee, T. M. Koo, K. H. Park, "Defect Detection Method for TFT-LCD Panel Based on Saliency Map Model", TENCON 2004. 2004 IEEE Region 10 Conference, Vol.A, 2004, pp.223-226.
[6] C. M. Tseng, C. W. Tsai, C. S. Lin, Y. C. Lu, C. C. Hung, "Automatic Inspection of Etching Transistors in TFT-LCD Panel", Proceedings of the 2005 IEEE International Conference on Mechatronics, Taiwan, 2005.
[7] K. M. Lee, M. S. Chang, P. G. Park, "Periodic Comparison Method for Defects Inspection of TFT-LCD Panel", ROCOM 2007, Hanzhou, 2007.
[8] P. E. Debevec and J. Malik. "Recovering high dynamic range radiance maps from photographs", Proceedings of ACM Siggraph, 1997, pp.369- 378.
[9] A. Majumder and R. Stevens. "LAM: Luminance attenuation map for photometric uniformity in projection based displays", Proceedings of ACM Virtual Reality and Software Technology, 2002.