Control Chart Pattern Recognition Using Wavelet Based Neural Networks
Authors: Jun Seok Kim, Cheong-Sool Park, Jun-Geol Baek, Sung-Shick Kim
Abstract:
Control chart pattern recognition is one of the most important tools to identify the process state in statistical process control. The abnormal process state could be classified by the recognition of unnatural patterns that arise from assignable causes. In this study, a wavelet based neural network approach is proposed for the recognition of control chart patterns that have various characteristics. The procedure of proposed control chart pattern recognizer comprises three stages. First, multi-resolution wavelet analysis is used to generate time-shape and time-frequency coefficients that have detail information about the patterns. Second, distance based features are extracted by a bi-directional Kohonen network to make reduced and robust information. Third, a back-propagation network classifier is trained by these features. The accuracy of the proposed method is shown by the performance evaluation with numerical results.
Keywords: Control chart pattern recognition, Multi-resolution wavelet analysis, Bi-directional Kohonen network, Back-propagation network, Feature extraction.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1328386
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[1] D. C. Montgomery, Introduction to Statistical Quality Control, 5th ed. John Wiley & Sons, 2004.
[2] J. Guo, S. Guo, and X. Yu, "Monitoring and diagnosis of manufacturing process using extreme learning machine," Advanced Science Letters, vol. 4, no. 6-7, pp. 6-7, 2011.
[3] I. Masood and A. Hassan, "Statistical features-ann recognizer for bivariate process mean shift pattern recognition," in Intelligent and Advanced Systems (ICIAS), 2010 International Conference on. IEEE, 2010, pp. 1-6.
[4] A. Hassan, M. Baksh, A. Shaharoun, and H. Jamaluddin, "Improved spc chart pattern recognition using statistical features," International Journal of Production Research, vol. 41, no. 7, pp. 1587-1603, 2003.
[5] J. Yang and M. Yang, "A control chart pattern recognition system using a statistical correlation coefficient method," Computers & Industrial Engineering, vol. 48, no. 2, pp. 205-221, 2005.
[6] Y. Al-Assaf, "Recognition of control chart patterns using multiresolution wavelets analysis and neural networks," Computers & Industrial Engineering, vol. 47, no. 1, pp. 17-29, 2004.
[7] C. H. Wang and W. Kuo, "Identification of control chart patterns using wavelet filtering and robust fuzzy clustering," Journal of Intelligent Manufacturing, vol. 18, no. 3, pp. 343-350, 2007.
[8] K. Assaleh and Y. Al-assaf, "Features extraction and analysis for classifying causable patterns in control charts," Computers & industrial engineering, vol. 49, no. 1, pp. 168-181, 2005.
[9] H. P. Cheng and C. S. Cheng, "Control chart pattern recognition using wavelet analysis and neural networks," Journal of Quality Vol, vol. 16, no. 5, p. 311, 2009.
[10] D. Pham and A. Chan, "Control chart pattern recognition using a new type of self-organizing neural network," Proceedings of the Institution of Mechanical Engineers, Part I: Journal of Systems and Control Engineering, vol. 212, no. 2, pp. 115-127, 1998.
[11] R. T. Ogden, Essential Wavelets for Statistical Applications and Data Analysis. Philadelphia: SIAM, 1992.
[12] W. Melssen, R. Wehrens, and L. Buydens, "Supervised kohonen networks for classification problems," Chemometrics and Intelligent Laboratory Systems, vol. 83, no. 2, pp. 99-113, 2006.
[13] L. Fausett, Fundamentals of Neural Networks. Prentice Hall, 1993.
[14] J.-J. Yoon, C.-S. Park, J. S. Kim, and J.-G. Baek, "Recognition of control chart pattern using bi-directional kohonen network and artificial neural network," Journal of the Korea Society for Simulation, vol. 20, no. 4, pp. 115-125, 2011.