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Degradation in Organic Light Emitting Diodes

Authors: Saba Zare Zardareh, Farhad Akbari Boroumand

Abstract:

The objective is to fabricate organic light emitting diode and to study its degradation process in atmosphere condition in which PFO as an emitting material and PEDOT:PSS as a hole injecting material were used on ITO substrate. Thus degradation process of the OLED was studied upon its current-voltage characteristic. By fabricating this OLED and obtaining blue light and analysis of current-voltage characteristic during the time after fabrication, it was observed that the current of the OLED was exponentially decreased. Current reduction during the initial hours of fabrication was outstanding and after few days its reduction rate was dropped significantly, while the diode was dying.

Keywords: OLED, Degradation, Dark spot.

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1330045

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References:


[1] R. U. A. Khan, D. D. C. Bradley, M. A. Webster, J. L. Auld, A. B. Walker, Appl. Phys. Lett., Vol. 84, No. 6 (2004).
[2] L. S. Hung, C.H. Chen, Materials Science and Engineering R 39 (2002) 143.
[3] J. Shen, D. Wang, E. Langlois, W.A. Barrow, P.J. Green, C.W. Tang, J. Shi, Synthetic Metals 111 (2000) 233.
[4] Y. Hamada, C. Adachi, T. Tsutsui, and S. Saito, Jpn. J. Appl. Phys. 31, 1812 (1992).
[5] T.P. Nguyen, P. Jolinat, P. Destruel, R. Clergereaux, J. Farenc, Thin Solid Films 325 (1998) 175.
[6] T.P. Nguyen, M. Spiesser, A. Garnier, M. de Kok, V.H. Tran, Materials Science and Engineering B60 (1999) 76.
[7] P. E. Burrow, V. Bulovic, S. R. Forrest, L. S. Sapochak, D. M. McCarty, and M. E. Thompson, Appl. Phys. Lett. 65 (23), (1994).
[8] D. Poplavskyy, J. Nelson, and D. D. C. Bradley, Applied Physics Letters Vol. 83, No. 4 (2003).
[9] P. S. Davids, I. H. Campbell and D. L. Smith, J. Appl. Phys. Vol. 82 No.12 (1997).
[10] T. V. Woudenberg, J. Wildeman, P. W. M. Blom, J. A. M. Bastiaansen, B. M. W. Langeveld-Voss, Adv. Funct. Mater. 14, No.7 (2004).
[11] P. E. Burrows, Z. Shen, V. Bulovic, D. M. McCarty, and S. R. Forrest, J. Appl. Phys., Vol. 79, No. 10 (1996).
[12] S. Barth, U. Wolf, H. Bassler, P. Muller, H. Riel, H. Vestweber, P. F. Seidler, and W. RieƟ, Physical Review B Vol. 60, No. 12 (1999).