Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 33093
Reducing Power in Error Correcting Code using Genetic Algorithm
Authors: Heesung Lee, Joonkyung Sung, Euntai Kim
Abstract:
This paper proposes a method which reduces power consumption in single-error correcting, double error-detecting checker circuits that perform memory error correction code. Power is minimized with little or no impact on area and delay, using the degrees of freedom in selecting the parity check matrix of the error correcting codes. The genetic algorithm is employed to solve the non linear power optimization problem. The method is applied to two commonly used SEC-DED codes: standard Hamming and odd column weight Hsiao codes. Experiments were performed to show the performance of the proposed method.Keywords: Error correcting codes, genetic algorithm, non-linearpower optimization, Hamming code, Hsiao code.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1334918
Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 2185References:
[1] C. L. Chen and M. Y. Hsiao,''Error-Correcting Codes for Semiconductor memory applications: A State-of-the-Art review, IBM J. Res. Develop., vol. 28, pp. 124-134, July 1984.
[2] K. Favalli and C. Metra, ''Design of Low-Power CMOS Two-Rail Checkers'', Joumal of Microelectronics Systems Integration, vol. 5, no. 2, pp. 101-1 IO, 1997.
[3] K. Mohanram and N. A. Touba, ''Input ordering in concurrent Checkers to Reduce Power Consumption,'' Proc. of IEEE Symposium on Defecated Fault Tolerance, pp. 87-95,2002.
[4] D. Rossi, V. Dijk, R. Kleihorst, A. K. Nieuwland, and C. Metra, ''Power Consumption of Fault Tolerant Codes: the Active Elements,'' Proc. Of Intentional On-Line Testing Symposium, pp. 61-67, 2003.
[5] S Ghosh, S Basu, NA Touba, ''Reducing Power Consumption in Memory ECC Checkers,'' International Test Conference, pp. 1322-1331, 2004.
[6] L. Davis, Handbook of Genetic Algorithms. Van Nostrand Reinhold, 1991.
[7] M. Y. Hsiao, ''A class of optimal minimum odd-weight-column SECDED codes,'' IBM J. Res. Develop., vol. 14, pp. 395-401, July 1970.
[8] W. Gao and S. Simmons, '' A study on the VLSI implementation of ECC for embedded DRAM,'' Electrical and Computer Engineering, 2003. IEEE CCECE 2003. Canadian Conf., vol. 1, pp. 203-206, May 2003.
[9] D. Coley, An Introduction to Genetic Algorithms for Scientists and Engineers, World Scientific, 1999.
[10] I. M. Oliver, D. J. Smith, and J. Holland, '' A study of permutation crossover operators on the traveling salesman problem,'' Proc. Of the Second Int. Conf. Genetic Algorithms, Lawrence Erlbaum Associates, Hillsdale, NJ, 1987 Heesung Lee was born in Seoul, Korea, in 1979.