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Internal Surface Measurement of Nanoparticle with Polarization-interferometric Nonlinear Confocal Microscope

Authors: Chikara Egami, Kazuhiro Kuwahara

Abstract:

Polarization-interferometric nonlinear confocal microscopy is proposed for measuring a nano-sized particle with optical anisotropy. The anisotropy in the particle was spectroscopically imaged through a three-dimensional distribution of third-order nonlinear dielectric polarization photoinduced.

Keywords: nanoparticle, optical storage, microscope

Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1334884

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References:


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