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Internal Surface Measurement of Nanoparticle with Polarization-interferometric Nonlinear Confocal Microscope

Authors: Chikara Egami, Kazuhiro Kuwahara


Polarization-interferometric nonlinear confocal microscopy is proposed for measuring a nano-sized particle with optical anisotropy. The anisotropy in the particle was spectroscopically imaged through a three-dimensional distribution of third-order nonlinear dielectric polarization photoinduced.

Keywords: Nanoparticle, Optical storage, microscope

Digital Object Identifier (DOI):

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