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Internal Surface Measurement of Nanoparticle with Polarization-interferometric Nonlinear Confocal Microscope
Abstract:Polarization-interferometric nonlinear confocal microscopy is proposed for measuring a nano-sized particle with optical anisotropy. The anisotropy in the particle was spectroscopically imaged through a three-dimensional distribution of third-order nonlinear dielectric polarization photoinduced.
Digital Object Identifier (DOI): doi.org/10.5281/zenodo.1334884Procedia APA BibTeX Chicago EndNote Harvard JSON MLA RIS XML ISO 690 PDF Downloads 1083
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