Calibration of 2D and 3D Optical Measuring Instruments in Industrial Environments at Submillimeter Range
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Calibration of 2D and 3D Optical Measuring Instruments in Industrial Environments at Submillimeter Range

Authors: A. Mínguez-Martínez, J. de Vicente

Abstract:

Modern manufacturing processes have led to the miniaturization of systems and, as a result, parts at the micro and nanoscale are produced. This trend seems to become increasingly important in the near future. Besides, as a requirement of Industry 4.0, the digitalization of the models of production and processes makes it very important to ensure that the dimensions of newly manufactured parts meet the specifications of the models. Therefore, it is possible to reduce the scrap and the cost of non-conformities, ensuring the stability of the production at the same time. To ensure the quality of manufactured parts, it becomes necessary to carry out traceable measurements at scales lower than one millimeter. Providing adequate traceability to the SI unit of length (the meter) to 2D and 3D measurements at this scale is a problem that does not have a unique solution in industrial environments. Researchers in the field of dimensional metrology all around the world are working on this issue. A solution for industrial environments, even if it is not complete, will enable working with some traceability. At this point, we believe that the study of the surfaces could provide us with a first approximation to a solution. In this paper, we propose a calibration procedure for the scales of optical measuring instruments, particularizing for a confocal microscope, using material standards easy to find and calibrate in metrology and quality laboratories in industrial environments. Confocal microscopes are measuring instruments capable of filtering the out-of-focus reflected light so that when it reaches the detector, it is possible to take pictures of the part of the surface that is focused. Varying and taking pictures at different Z levels of the focus, a specialized software interpolates between the different planes, and it could reconstruct the surface geometry into a 3D model. As it is easy to deduce, it is necessary to give traceability to each axis. As a complementary result, the roughness Ra parameter will be traced to the reference. Although the solution is designed for a confocal microscope, it may be used for the calibration of other optical measuring instruments, by applying minor changes.

Keywords: Industrial environment, confocal microscope, optical measuring instrument, traceability.

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References:


[1] Z. Shi, Y. Xie, W. Xue, Y. Chen y L. X. X. Pu, «Smart factory in Industry 4.0,» System Research and Behavioral Science, vol. 37, nº 4, pp. 607-617, 2020.
[2] G. Morteza, «The future of manufacturing industry: a strategic roadmap toward Industry 4.0,» Journal of Manufacturing Technology Management,, vol. 29, nº 6, pp. 910-936, 2018.
[3] K. Wong y A. Hernandez, «A Review of AdditiveManufacturing,» ISRN Mechanical Engineering, vol. 2012, nº Article ID 208760, p. 10, 2012.
[4] A. Townsend, N. Senin, L. Blunt, R. Leach y J. Taylor, «Surface texture metrology for metal additive manufacturing: a review,» Precision Engineering, 2016.
[5] J. Sladek, Coordinate Metrology. Accuracy of Systems and Measurements, 1 ed., Berlin: Springer, 2016.
[6] Joint Commitee for Guides in Metrology (JCGM), International Vocabulary of Metrology (VIM), 3 ed., Paris: JCGM Publications, 2012.
[7] A. Mínguez Martínez, C. Gómez Pérez, D. Canteli Pérez-Caballero, L. Carcedo Cerezo y J. de Vicente y Olvica, «Design of Industrial Standards for the Calibration of Optical Microscopes,» Materials, vol. 14 (1), nº 29, 2021.
[8] R. Leach, Fundamental Principles of Engineering Nanometrology, Kidlington: Elsevier, 2010.
[9] European Metrology Research Programme EMPIR, «20IND07 TracOptic "Traceable industrial 3D roughness and dimensional measurement using optical 3D microsopy and optical distance sensors",» EMPIR, 01 06 2021. (Online) Available: https://www.ptb.de/empir2021/tracoptic/home/. (Accessed: 06 02 2022).
[10] A. Mínguez Martínez y J. de Vicente y Oliva, «Industrial Calibration Procedure for Confocal Microscopes,» Materials, vol. 12, nº 4137, 2019.
[11] International Organization for Standardization (ISO), 10360-1:2000 - Geometrical Product Specifications (GPS). Acceptance and reverification tests for coordinate measuring machines (CMM). Part 1: Vocabulary, Geneva: ISO Publications, 2000.
[12] D. Flack y J. Hannaford, Good Practice Guide (No. 80) - Fundamental Good Practice in Dimensional Metrology, Teddington (UK): National Physical Laboratory (NPL), 2005.
[13] International Organization for Standardization (ISO), 15530-3:2004 (ISO/TS) - Geometrical product specifications (GPS). Coordinate measuring machines (CMM): Technique for determining the uncertainty of measurement. Part 3: Use of calibrated workpieces or standards, Geneva: ISO Publications, 2005.
[14] International Organization for Standardization (ISO), 15530-4:2008 (ISO/TS) - Geometrical product specifications (GPS). Coordinate measuring machines (CMM): Technique for determining the uncertainty of measurement. Part 4: Evaluating task-specific measurement uncertainty using simulation, Geneva: ISO Pulbications, 2008.
[15] S. Cao, U. K.-B. T. Brand, W. Hoffmann, H. Schwenke, S. Bütefisch y S. Büttgenvach, «Recent developments in dimensional metrology for microsystem components,» Microsystem Technologies, vol. 8, pp. 3-6, 2002.
[16] J. Claverley y R. Leach, «A review of the existing performance verification infrastructure for micro-CMMs,» Precision Engineering, vol. 39, pp. 1-15, 2015.
[17] W. Ehrig, U. Neuschaefer-Rube, M. Neugebauer y R. Meeß, «Traceable optical coordinate metrology applications for the micro range,» de Proceedings Three-Dimensional Imaging Metrology, San Jose (CA-US), 2009.
[18] V. Alonso, A. Dacal-Nieto, L. Barreto, A. Amaral y E. Rivero, «Industry 4.0 implications in machine vision metrology: an overview,» de Procedia Manufacturing - 8th Manufacturing Engineering Society International Conference (MESIC 2019), Madrid (Spain), 2019.
[19] International Organization for Standardization (ISO), 25178-6:2010 - Geometrical Product Specifications (GPS). Surface texture: Areal. Part 6: Classification of methods for measuring surface texture, Geneva: ISO Publications, 2010.
[20] N. Woodhouse, S. Robson y J. Eyre, «Vision Metrology and Three Dimensional Visualization in Structural Testing and Monitoring,» Photogrammetric Record, vol. 16, nº 94, pp. 625-641, 1999.
[21] Joint Committee for Guides in Metrlogy, Working Group 1 (JCGM/WG1), JCGM 100:2008 Evaluation of measurement data - Guide to the expression of uncertainty in measurement (GUM), Paris: JCGM Publications, 2008.
[22] European Accreditation (EA), EA-4/02 M 2013 - Evaluation of the Uncertainty of Measurement in Calibration, EA Publications, 2013.