Search results for: test circuit.
Commenced in January 2007
Frequency: Monthly
Edition: International
Paper Count: 3237

Search results for: test circuit.

3087 Symmetrical Analysis of a Six-Phase Induction Machine Under Fault Conditions

Authors: E. K.Appiah, G. M'boungui, A. A. Jimoh, J. L. Munda, A.S.O. Ogunjuyigbe

Abstract:

The operational behavior of a six-phase squirrel cage induction machine with faulted stator terminals is presented in this paper. The study is carried out using the derived mathematical model of the machine in the arbitrary reference frame. Tests are conducted on a 1 kW experimental machine. Steady-state and dynamic performance are analyzed for the machine unloaded and loaded conditions. The results shows that with one of the stator phases experiencing either an open- circuit or short circuit fault the machine still produces starting torque, albeit the running performance is significantly derated.

Keywords: Performance, fault conditions, six-phase induction machine.

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3086 Software Test Data Generation using Ant Colony Optimization

Authors: Huaizhong Li, C.Peng Lam

Abstract:

State-based testing is frequently used in software testing. Test data generation is one of the key issues in software testing. A properly generated test suite may not only locate the errors in a software system, but also help in reducing the high cost associated with software testing. It is often desired that test data in the form of test sequences within a test suite can be automatically generated to achieve required test coverage. This paper proposes an Ant Colony Optimization approach to test data generation for the state-based software testing.

Keywords: Software testing, ant colony optimization, UML.

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3085 Design, Simulation, and Implementation of a Digital Pulse Oxygen Saturation Measurement System Using the Arduino Microcontroller

Authors: Muhibul Haque Bhuyan, Md. Refat Sarder

Abstract:

If a person can monitor his/her oxygen saturation level intermittently then he/she can identify his/her condition early and thus he/she can seek a doctor’s help. This paper reports the design, simulation, and implementation of a low-cost pulse oxygen saturation measurement device based on a reflective photoplethysmography (PPG) system using an integrated circuit sensor as the fundamental component of this health status checking device. The measurement of the physiological parameter is the blood oxygen saturation level (SpO2) in the peripheral capillary. This work has been implemented using an Arduino Uno R3 microcontroller along with this sensor integrated circuit (IC). The system is designed in the Proteus environment and then simulated to check its performance. After that, the hardware implementation is performed. We used a clipping type optical sensor to sense the arterial oxygen saturation level of blood signal from the fingertips of an individual and then transformed it into the digital data in the microcontroller through its programming its instruction. The designed system was tested by measuring the SpO2 level for several people of different ages, from 12 to 57 years of age. Besides, the same people were tested using a standard machine purchased from the market. Test results were found very satisfactory as the average percentage of error was very low, 1.59% only.

Keywords: Digital pulse oxygen saturation level, oximeter, measurement, design, simulation, implementation, proteus, Arduino Uno microcontroller.

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3084 A Direct Down-conversion Receiver for Low-power Wireless Sensor Networks

Authors: Gianluca Cornetta, Abdellah Touhafi, David J. Santos, Jose Manuel Vazquez

Abstract:

A direct downconversion receiver implemented in 0.13 μm 1P8M process is presented. The circuit is formed by a single-end LNA, an active balun for conversion into balanced mode, a quadrature double-balanced passive switch mixer and a quadrature voltage-controlled oscillator. The receiver operates in the 2.4 GHz ISM band and complies with IEEE 802.15.4 (ZigBee) specifications. The circuit exhibits a very low noise figure of only 2.27 dB and dissipates only 14.6 mW with a 1.2 V supply voltage and is hence suitable for low-power applications.

Keywords: LNA, Active Balun, Passive Mixer, VCO, IEEE 802.15.4(ZigBee).

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3083 Electrical Equivalent Analysis of Micro Cantilever Beams for Sensing Applications

Authors: B. G. Sheeparamatti, J. S. Kadadevarmath

Abstract:

Microcantilevers are the basic MEMS devices, which can be used as sensors, actuators and electronics can be easily built into them. The detection principle of microcantilever sensors is based on the measurement of change in cantilever deflection or change in its resonance frequency. The objective of this work is to explore the analogies between mechanical and electrical equivalent of microcantilever beams. Normally scientists and engineers working in MEMS use expensive software like CoventorWare, IntelliSuite, ANSYS/Multiphysics etc. This paper indicates the need of developing electrical equivalent of the MEMS structure and with that, one can have a better insight on important parameters, and their interrelation of the MEMS structure. In this work, considering the mechanical model of microcantilever, equivalent electrical circuit is drawn and using force-voltage analogy, it is analyzed with circuit simulation software. By doing so, one can gain access to powerful set of intellectual tools that have been developed for understanding electrical circuits Later the analysis is performed using ANSYS/Multiphysics - software based on finite element method (FEM). It is observed that both mechanical and electrical domain results for a rectangular microcantlevers are in agreement with each other.

Keywords: Electrical equivalent circuit analogy, FEM analysis, micro cantilevers, micro sensors.

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3082 SCR-Based Advanced ESD Protection Device for Low Voltage Application

Authors: Bo Bae Song, Byung Seok Lee, Hyun Young Kim, Chung Kwang Lee, Yong Seo Koo

Abstract:

This paper proposed a silicon controller rectifier (SCR) based ESD protection device to protect low voltage ESD for integrated circuit. The proposed ESD protection device has low trigger voltage and high holding voltage compared with conventional SCR-based ESD protection devices. The proposed ESD protection circuit is verified and compared by TCAD simulation. This paper verified effective low voltage ESD characteristics with low trigger voltage of 5.79V and high holding voltage of 3.5V through optimization depending on design variables (D1, D2, D3 and D4).

Keywords: ESD, SCR, Holding voltage, Latch-up.

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3081 Perturbation Based Modelling of Differential Amplifier Circuit

Authors: Rahul Bansal, Sudipta Majumdar

Abstract:

This paper presents the closed form nonlinear expressions of bipolar junction transistor (BJT) differential amplifier (DA) using perturbation method. Circuit equations have been derived using Kirchhoff’s voltage law (KVL) and Kirchhoff’s current law (KCL). The perturbation method has been applied to state variables for obtaining the linear and nonlinear terms. The implementation of the proposed method is simple. The closed form nonlinear expressions provide better insights of physical systems. The derived equations can be used for signal processing applications.

Keywords: Differential amplifier, perturbation method, Taylor series.

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3080 Accurate Time Domain Method for Simulation of Microstructured Electromagnetic and Photonic Structures

Authors: Vijay Janyani, Trevor M. Benson, Ana Vukovic

Abstract:

A time-domain numerical model within the framework of transmission line modeling (TLM) is developed to simulate electromagnetic pulse propagation inside multiple microcavities forming photonic crystal (PhC) structures. The model developed is quite general and is capable of simulating complex electromagnetic problems accurately. The field quantities can be mapped onto a passive electrical circuit equivalent what ensures that TLM is provably stable and conservative at a local level. Furthermore, the circuit representation allows a high level of hybridization of TLM with other techniques and lumped circuit models of components and devices. A photonic crystal structure formed by rods (or blocks) of high-permittivity dieletric material embedded in a low-dielectric background medium is simulated as an example. The model developed gives vital spatio-temporal information about the signal, and also gives spectral information over a wide frequency range in a single run. The model has wide applications in microwave communication systems, optical waveguides and electromagnetic materials simulations.

Keywords: Computational Electromagnetics, Numerical Simulation, Transmission Line Modeling.

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3079 Note on the Necessity of the Patch Test

Authors: Rado Flajs, Miran Saje

Abstract:

We present a simple nonconforming approximation of the linear two–point boundary value problem which violates patch test requirements. Nevertheless the solutions, obtained from these type of approximations, converge to the exact solution.

Keywords: Generalized patch test, Irons' patch test, nonconforming finite element, convergence.

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3078 Optimizing the Number of Bits/Stage in 10-Bit, 50Ms/Sec Pipelined A/D Converter Considering Area, Speed, Power and Linearity

Authors: P. Prasad Rao, K. Lal Kishore

Abstract:

Pipeline ADCs are becoming popular at high speeds and with high resolution. This paper discusses the options of number of bits/stage conversion techniques in pipelined ADCs and their effect on Area, Speed, Power Dissipation and Linearity. The basic building blocks like op-amp, Sample and Hold Circuit, sub converter, DAC, Residue Amplifier used in every stage is assumed to be identical. The sub converters use flash architectures. The design is implemented using 0.18

Keywords: 1.5 bits/stage, Conversion Frequency, Redundancy Switched Capacitor Sample and Hold Circuit

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3077 A Fault-Tolerant Full Adder in Double Pass CMOS Transistor

Authors: Abdelmonaem Ayachi, Belgacem Hamdi

Abstract:

This paper presents a fault-tolerant implementation for adder schemes using the dual duplication code. To prove the efficiency of the proposed method, the circuit is simulated in double pass transistor CMOS 32nm technology and some transient faults are voluntary injected in the Layout of the circuit. This fully differential implementation requires only 20 transistors which mean that the proposed design involves 28.57% saving in transistor count compared to standard CMOS technology.

Keywords: Semiconductors, digital electronics, double pass transistor technology, Full adder, fault tolerance.

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3076 Very High Speed Data Driven Dynamic NAND Gate at 22nm High K Metal Gate Strained Silicon Technology Node

Authors: Shobha Sharma, Amita Dev

Abstract:

Data driven dynamic logic is the high speed dynamic circuit with low area. The clock of the dynamic circuit is removed and data drives the circuit instead of clock for precharging purpose. This data driven dynamic nand gate is given static forward substrate biasing of Vsupply/2 as well as the substrate bias is connected to the input data, resulting in dynamic substrate bias. The dynamic substrate bias gives the shortest propagation delay with a penalty on the power dissipation. Propagation delay is reduced by 77.8% compared to the normal reverse substrate bias Data driven dynamic nand. Also dynamic substrate biased D3nand’s propagation delay is reduced by 31.26% compared to data driven dynamic nand gate with static forward substrate biasing of Vdd/2. This data driven dynamic nand gate with dynamic body biasing gives us the highest speed with no area penalty and finds its applications where power penalty is acceptable. Also combination of Dynamic and static Forward body bias can be used with reduced propagation delay compared to static forward biased circuit and with comparable increase in an average power. The simulations were done on hspice simulator with 22nm High-k metal gate strained Si technology HP models of Arizona State University, USA.

Keywords: Data driven nand gate, dynamic substrate biasing, nand gate, static substrate biasing.

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3075 A Simple and Efficient Method for Accurate Measurement and Control of Power Frequency Deviation

Authors: S. J. Arif

Abstract:

In the presented technique, a simple method is given for accurate measurement and control of power frequency deviation. The sinusoidal signal for which the frequency deviation measurement is required is transformed to a low voltage level and passed through a zero crossing detector to convert it into a pulse train. Another stable square wave signal of 10 KHz is obtained using a crystal oscillator and decade dividing assemblies (DDA). These signals are combined digitally and then passed through decade counters to give a unique combination of pulses or levels, which are further encoded to make them equally suitable for both control applications and display units. The developed circuit using discrete components has a resolution of 0.5 Hz and completes measurement within 20 ms. The realized circuit is simulated and synthesized using Verilog HDL and subsequently implemented on FPGA. The results of measurement on FPGA are observed on a very high resolution logic analyzer. These results accurately match the simulation results as well as the results of same circuit implemented with discrete components. The proposed system is suitable for accurate measurement and control of power frequency deviation.

Keywords: Digital encoder for frequency measurement, frequency deviation measurement, measurement and control systems, power systems.

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3074 A Local Invariant Generalized Hough Transform Method for Integrated Circuit Visual Positioning

Authors: Fei Long Wei, Hua Yang, Hai Tao Zhang, Zhou Ping Yin

Abstract:

In this study, an local invariant generalized Houghtransform (LI-GHT) method is proposed for integrated circuit (IC) visual positioning. The original generalized Hough transform (GHT) is robust to external noise; however, it is not suitable for visual positioning of IC chips due to the four-dimensionality (4D) of parameter space which leads to the substantial storage requirement and high computational complexity. The proposed LI-GHT method can reduce the dimensionality of parameter space to 2D thanks to the rotational invariance of local invariant geometric feature and it can estimate the accuracy position and rotation angle of IC chips in real-time under noise and blur influence. The experiment results show that the proposed LI-GHT can estimate position and rotation angle of IC chips with high accuracy and fast speed. The proposed LI-GHT algorithm was implemented in IC visual positioning system of radio frequency identification (RFID) packaging equipment.

Keywords: Integrated Circuit Visual Positioning, Generalized Hough Transform, Local invariant Generalized Hough Transform, ICpacking equipment.

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3073 Design and Study of a DC/DC Converter for High Power, 14.4 V and 300 A for Automotive Applications

Authors: Julio Cesar Lopes de Oliveira, Carlos Henrique Gonc¸alves Treviso

Abstract:

The shortage of the automotive market in relation to options for sources of high power car audio systems, led to development of this work. Thus, we developed a source with stabilized voltage with 4320 W effective power. Designed to the voltage of 14.4 V and a choice of two currents: 30 A load option in battery banks and 300 A at full load. This source can also be considered as a source of general use dedicated commercial with a simple control circuit in analog form based on discrete components. The assembly of power circuit uses a methodology for higher power than the initially stipulated.

Keywords: DC-DC power converters, converters, power convertion, pulse width modulation converters.

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3072 A Novel Multiple Valued Logic OHRNS Modulo rn Adder Circuit

Authors: Mehdi Hosseinzadeh, Somayyeh Jafarali Jassbi, Keivan Navi

Abstract:

Residue Number System (RNS) is a modular representation and is proved to be an instrumental tool in many digital signal processing (DSP) applications which require high-speed computations. RNS is an integer and non weighted number system; it can support parallel, carry-free, high-speed and low power arithmetic. A very interesting correspondence exists between the concepts of Multiple Valued Logic (MVL) and Residue Number Arithmetic. If the number of levels used to represent MVL signals is chosen to be consistent with the moduli which create the finite rings in the RNS, MVL becomes a very natural representation for the RNS. There are two concerns related to the application of this Number System: reaching the most possible speed and the largest dynamic range. There is a conflict when one wants to resolve both these problem. That is augmenting the dynamic range results in reducing the speed in the same time. For achieving the most performance a method is considere named “One-Hot Residue Number System" in this implementation the propagation is only equal to one transistor delay. The problem with this method is the huge increase in the number of transistors they are increased in order m2 . In real application this is practically impossible. In this paper combining the Multiple Valued Logic and One-Hot Residue Number System we represent a new method to resolve both of these two problems. In this paper we represent a novel design of an OHRNS-based adder circuit. This circuit is useable for Multiple Valued Logic moduli, in comparison to other RNS design; this circuit has considerably improved the number of transistors and power consumption.

Keywords: Computer Arithmetic, Residue Number System, Multiple Valued Logic, One-Hot, VLSI.

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3071 Bifurcation and Chaos of the Memristor Circuit

Authors: Wang Zhulin, Min Fuhong, Peng Guangya, Wang Yaoda, Cao Yi

Abstract:

In this paper, a magnetron memristor model based on hyperbolic sine function is presented and the correctness proved by studying the trajectory of its voltage and current phase, and then a memristor chaotic system with the memristor model is presented. The phase trajectories and the bifurcation diagrams and Lyapunov exponent spectrum of the magnetron memristor system are plotted by numerical simulation, and the chaotic evolution with changing the parameters of the system is also given. The paper includes numerical simulations and mathematical model, which confirming that the system, has a wealth of dynamic behavior.

Keywords: Memristor, chaotic circuit, dynamical behavior, chaotic system.

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3070 A Very High Speed, High Resolution Current Comparator Design

Authors: Neeraj K. Chasta

Abstract:

This paper presents an idea for analog current comparison which compares input signal and reference currents with high speed and accuracy. Proposed circuit utilizes amplification properties of common gate configuration, where voltage variations of input current are amplified and a compared output voltage is developed. Cascaded inverter stages are used to generate final CMOS compatible output voltage. Power consumption of circuit can be controlled by the applied gate bias voltage. The comparator is designed and studied at 180nm CMOS process technology for a supply voltage of 3V.

Keywords: Current Mode, Comparator, High Resolution, High Speed.

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3069 A Programmable FSK-Modulator in 350nm CMOS Technology

Authors: Nasir Mehmood, Saad Rahman, Vinodh Ravinath, Mahesh Balaji

Abstract:

This paper describes the design of a programmable FSK-modulator based on VCO and its implementation in 0.35m CMOS process. The circuit is used to transmit digital data at 100Kbps rate in the frequency range of 400-600MHz. The design and operation of the modulator is discussed briefly. Further the characteristics of PLL, frequency synthesizer, VCO and the whole design are elaborated. The variation among the proposed and tested specifications is presented. Finally, the layout of sub-modules, pin configurations, final chip and test results are presented.

Keywords: FSK Modulator, CMOS, VCO, Phase Locked Loop, Frequency Synthesizer.

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3068 CASTE: a Cloud-Based Automatic Software Test Environment

Authors: Fuyang Peng, Bo Deng, Chao Qi

Abstract:

This paper presents the design and implementation of CASTE, a Cloud-based automatic software test environment. We first present the architecture of CASTE, then the main packages and classes of it are described in detail. CASTE is built upon a private Infrastructure as a Service platform. Through concentrated resource management of virtualized testing environment and automatic execution control of test scripts, we get a better solution to the testing resource utilization and test automation problem. Experiments on CASTE give very appealing results.

Keywords: Software testing, test environment, test script, cloud computing, IaaS, test automation.

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3067 A Modified Run Length Coding Technique for Test Data Compression Based on Multi-Level Selective Huffman Coding

Authors: C. Kalamani, K. Paramasivam

Abstract:

Test data compression is an efficient method for reducing the test application cost. The problem of reducing test data has been addressed by researchers in three different aspects: Test Data Compression, Built-in-Self-Test (BIST) and Test set compaction. The latter two methods are capable of enhancing fault coverage with cost of hardware overhead. The drawback of the conventional methods is that they are capable of reducing the test storage and test power but when test data have redundant length of runs, no additional compression method is followed. This paper presents a modified Run Length Coding (RLC) technique with Multilevel Selective Huffman Coding (MLSHC) technique to reduce test data volume, test pattern delivery time and power dissipation in scan test applications where redundant length of runs is encountered then the preceding run symbol is replaced with tiny codeword. Experimental results show that the presented method not only improves the test data compression but also reduces the overall test data volume compared to recent schemes. Experiments for the six largest ISCAS-98 benchmarks show that our method outperforms most known techniques.

Keywords: Modified run length coding, multilevel selective Huffman coding, built-in-self-test modified selective Huffman coding, automatic test equipment.

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3066 Test Data Compression Using a Hybrid of Bitmask Dictionary and 2n Pattern Runlength Coding Methods

Authors: C. Kalamani, K. Paramasivam

Abstract:

In VLSI, testing plays an important role. Major problem in testing are test data volume and test power. The important solution to reduce test data volume and test time is test data compression. The Proposed technique combines the bit maskdictionary and 2n pattern run length-coding method and provides a substantial improvement in the compression efficiency without introducing any additional decompression penalty. This method has been implemented using Mat lab and HDL Language to reduce test data volume and memory requirements. This method is applied on various benchmark test sets and compared the results with other existing methods. The proposed technique can achieve a compression ratio up to 86%.

Keywords: Bit Mask dictionary, 2n pattern run length code, system-on-chip, SOC, test data compression.

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3065 Development of Low-Profile Antenna for Mini UAV with Reconnaissance Mission

Authors: Chien-Chun Hung, Yao-Jen Teng, Yung-Sheng Tien, Yu-Tsung Tsai

Abstract:

Microstrip antennas are conformable to planar and nonplanar surfaces, simple and inexpensive to fabricate using modern printed-circuit technology. Circular polarization of low-profile microstrip patch with high bandwidth is achieved in this research through the use of a three-cross-arms branch-line coupler with sequential rotated arrays, another low-profile antenna of hollow cylinder is also proposed and the function of reconnaissance with microstrip antenna on Mini UAV (unmanned aerial vehicle) are evaluated in practical flight test.

Keywords: low-profile antenna, Mini UAV, reconnaissance

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3064 Parameter Estimation of Diode Circuit Using Extended Kalman Filter

Authors: Amit Kumar Gautam, Sudipta Majumdar

Abstract:

This paper presents parameter estimation of a single-phase rectifier using extended Kalman filter (EKF). The state space model has been obtained using Kirchhoff’s current law (KCL) and Kirchhoff’s voltage law (KVL). The capacitor voltage and diode current of the circuit have been estimated using EKF. Simulation results validate the better accuracy of the proposed method as compared to the least mean square method (LMS). Further, EKF has the advantage that it can be used for nonlinear systems.

Keywords: Extended Kalman filter, parameter estimation, single phase rectifier, state space modelling.

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3063 Low Frequency Multiple Divider Using Resonant Model

Authors: Chih Chin Yang, Chih Yu Lee, Jing Yi Wang, Mei Zhen Xue, Chia Yueh Wu

Abstract:

A well-defined frequency multiple dividing (FMD) circuit using a resonant model is presented in this research. The basic component of a frequency multiple divider as used in a resonant model is established by compositing a well-defined resonant effect of negative differential resistance (NDR) characteristics which possesses a wider operational region and high operational current at a bias voltage of about 1.15 V. The resonant model is then applied in the frequency dividing circuit with the above division ratio (RD) of 200 at the signal input of middle frequency. The division ratio also exists at the input of a low frequency signal.

Keywords: Divider, frequency, resonant model.

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3062 Factors Affecting Test Automation Stability and Their Solutions

Authors: Nagmani Lnu

Abstract:

Test automation is a vital requirement of any organization to release products faster to their customers. In most cases, an organization has an approach to developing automation but struggles to maintain it. It results in an increased number of flaky tests, reducing return on investments and stakeholders’ confidence. Challenges grow in multiple folds when automation is for User Interface (UI) behaviors. This paper describes the approaches taken to identify the root cause of automation instability in an extensive payments application and the best practices to address that using processes, tools, and technologies, resulting in a 75% reduction of effort.

Keywords: Automation stability, test stability, flaky test, test quality, test automation quality.

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3061 Single Event Transient Tolerance Analysis in 8051 Microprocessor Using Scan Chain

Authors: Jun Sung Go, Jong Kang Park, Jong Tae Kim

Abstract:

As semi-conductor manufacturing technology evolves; the single event transient problem becomes more significant issue. Single event transient has a critical impact on both combinational and sequential logic circuits, so it is important to evaluate the soft error tolerance of the circuits at the design stage. In this paper, we present a soft error detecting simulation using scan chain. The simulation model generates a single event transient randomly in the circuit, and detects the soft error during the execution of the test patterns. We verified this model by inserting a scan chain in an 8051 microprocessor using 65 nm CMOS technology. While the test patterns generated by ATPG program are passing through the scan chain, we insert a single event transient and detect the number of soft errors per sub-module. The experiments show that the soft error rates per cell area of the SFR module is 277% larger than other modules.

Keywords: Scan chain, single event transient, soft error, 8051 processor.

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3060 Parameters Extraction for Pseudomorphic HEMTs Using Genetic Algorithms

Authors: Mazhar B. Tayel, Amr H. Yassin

Abstract:

A proposed small-signal model parameters for a pseudomorphic high electron mobility transistor (PHEMT) is presented. Both extrinsic and intrinsic circuit elements of a smallsignal model are determined using genetic algorithm (GA) as a stochastic global search and optimization tool. The parameters extraction of the small-signal model is performed on 200-μm gate width AlGaAs/InGaAs PHEMT. The equivalent circuit elements for a proposed 18 elements model are determined directly from the measured S- parameters. The GA is used to extract the parameters of the proposed small-signal model from 0.5 up to 18 GHz.

Keywords: PHEMT, Genetic Algorithms, small signal modeling, optimization.

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3059 Assertion-Driven Test Repair Based on Priority Criteria

Authors: Ruilian Zhao, Shukai Zhang, Yan Wang, Weiwei Wang

Abstract:

Repairing broken test cases is an expensive and challenging task in evolving software systems. Although an automated repair technique with intent-preservation has been proposed, it does not take into account the association between test repairs and assertions, leading a large number of irrelevant candidates and decreasing the repair capability. This paper proposes a assertion-driven test repair approach. Furthermore, a intent-oriented priority criterion is raised to guide the repair candidate generation, making the repairs closer to the intent of the test. In more detail, repair targets are determined through post-dominance relations between assertions and the methods that directly cause compilation errors. Then, test repairs are generated from the target in a bottom-up way, guided by the the intent-oriented priority criteria. Finally, the generated repair candidates are prioritized to match the original test intent. The approach is implemented and evaluated on the benchmark of 4 open-source programs and 91 broken test cases. The result shows that the approach can fix 89% (81/91) broken test cases, which are more effective than the existing intent-preserved test repair approach, and our intent-oriented priority criteria work well.

Keywords: Test repair, test intent, software test, test case evolution.

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3058 Numerical Simulation of a Pressure Regulated Valve to Find Out the Characteristics of Passive Control Circuit

Authors: Binod Kumar Saha

Abstract:

The objective of the present paper is a numerical analysis of the flow forces acting on spool surfaces of a pressure regulated valve. The transient, compressible and turbulent flow structures inside the valve are simulated using ANSYS FLUENT coupled with a special UDF. Here, valve inlet pressure is varied in a stepwise manner. For every value of inlet pressure, transient analysis leads to a quasi-static flow through the valve. Spool forces are calculated based on different pressures at inlet. From this information of spool forces, pressure characteristic of the passive control circuit has been derived.

Keywords: Pressure Regulating Valve, Spool Opening, Spool Movement, Force Balance, CFD.

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